Abstract:
A neuromorphic devices may be formed having a three-dimensional stacked structure. The neuromorphic device may include a lower device formed on a substrate, an interlayer insulating layer formed on the substrate to cover the lower device, a synapse device having a Schottky barrier transistor structure formed on the interlayer insulating layer, and a vertical connection wiring formed in the interlayer insulating layer to electrically connect the lower device and the synapse device. The synapse device may include a channel, a source having a metal silicide forming a first Schottky junction with the channel, a drain having a metal silicide forming a second Schottky junction with the channel, a floating gate for a synaptic operation, and a control gate. The synapse device may be formed using only low-temperature processes performed at less than about 500° C.
Abstract:
A neuromorphic synaptic device based on a charge trap and having linearity and symmetricity improved by using a schottky junction and a neuromorphic system using the same are provided. The neuromorphic synaptic device includes a body layer formed on a semiconductor substrate, a source and a drain formed at a left side and a right side, or an upper side and a lower side of the body layer, a contact metal to form a schottky junction by making contact with the source and the drain, a gate insulating layer formed on the body layer, and including an oxide layer and a charge storage layer, and a gate formed on the gate insulating layer.
Abstract:
A tunneling field-effect transistor may be provided that includes: a substrate; a source which is formed on the substrate and into which p+ type impurity ion is injected; a drain which is formed on the substrate and into which n+ type impurity ion is injected; a plurality of vertically stacked nanowire channels which are formed on the substrate; a gate insulation layer which is formed on the plurality of nanowire channels; and a gate which is formed on the gate insulation layer. As a result, it is possible to generate a higher driving current without changing the length of the gate and the area of the channel (degree of integration).
Abstract:
A multi-bit capacitorless DRAM according to the embodiment of the present invention may be provided that includes: a substrate; a source and a drain formed on the substrate; a plurality of nanowire channels formed on the substrate; a gate insulation layer formed in the plurality of nanowire channels; and a gate formed on the gate insulation layer. Two or more nanowire channels among the plurality of nanowire channels have different threshold voltages. Each of the nanowire channels includes: a silicon layer; a first epitaxial layer which is formed to surround the silicon layer; and a second epitaxial layer which is formed to surround the first epitaxial layer. As a result, the high integration multi-bit capacitorless DRAM which operates at multi-bits can be implemented and a performance of accumulating excess holes can be improved by using energy band gap.
Abstract:
Disclosed are a hardware-based selective security apparatus and a security method using the same. The security apparatus according to an embodiment of the present invention includes: a transistor including a source electrode, a drain electrode, and a gate electrode composed of at least two electrodes; and a controller which selectively sets a security level 1 or a security level 2 by controlling a magnitude of a voltage which is applied to the gate electrode. According to the present invention, since there is no necessity of an additional space for a separate chip required by an existing hardware based security method, it is possible to obtain a recoverable hardware based security method which uses spaces usefully and has economic efficiency. Also, a recoverable security level and an irrecoverable security level are selectively applied, so that it is possible to implement an enhanced hardware-based security method.