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151.发明公开公开(公告)号：US20240170709A1
公开(公告)日：2024-05-23
申请号：US18373726
申请日：2023-09-27
Applicant: CHROMA ATE INC.
Inventor： Ming-Cheng Huang , Jiun-Ren Chen , Chao-Cheng Wu , Yi-Sheng Hsu
CPC classification number: H01M10/0404 , B65G1/026 , H01M10/0481 , B65G2201/0267
Abstract: A motion synchronized multi-tier pallet rack and a battery formation apparatus are provided. The pallet rack includes a fixation rack, two movable frames, and two actuators. The movable frames are coupled to two corresponding sides of the fixation rack and each includes telescopic arms, a motor, and a drive rod. The actuators are disposed on other the two corresponding sides of the fixation rack to drive the movable frames to move toward or away from each other. The telescopic arms are kinematically connected to the motor through the drive rod to extend from or retract into the movable frame. The battery formation apparatus includes a motion synchronized multi-tier pallet rack, a conveyor module, a formation cabinet, and a controller. The conveyor module carries a battery module. The controller controls the pallet rack to obtain the battery module from the conveyor module and place the battery module in the formation cabinet.
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公开(公告)号：US20240162635A1
公开(公告)日：2024-05-16
申请号：US18376150
申请日：2023-10-03
Applicant: CHROMA ATE INC.
Inventor： Wen-Chiu CHEN , Chi-Wen HUNG , Chun-Chen LIN , Li-Shiun TSAI
Abstract: A power transceiver device includes a housing, a circuit module and an electrical connector. The circuit module is located within the housing. The electrical connector includes a terminal base and two conductive terminals. The terminal base is fixed on one side surface of the housing. Each of the conductive terminals includes a sheet, an extending portion and an opening. One end of the sheet extends through a front face of the terminal base, another end thereof is electrically connected to the circuit module. The extending portion extends transversely from the end of the sheet, the opening is firmed on the extending portion, and a virtual axis of the opening passes through the front lateral face of the terminal base. The conductive terminals are switchably electrically connected to each other.
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公开(公告)号：US11970342B2
公开(公告)日：2024-04-30
申请号：US17930082
申请日：2022-09-07
Applicant: CHROMA ATE INC.
Inventor： Chien-Ming Chen , Jui-Hsiung Chen , Chi-Wei Wang
CPC classification number: B65G47/905 , G01N3/04 , G01N3/06 , G01N3/12 , G01R31/2867 , G01R31/2874 , G01R31/2887 , G01R31/2893 , H01L21/67333 , H05K13/0408 , G01N2203/0044 , G01N2203/0411
Abstract: The present invention relates to a chip tray positioning device, which mainly comprises a frame body, a tray conveying module, a pulling module, a pushing module and a controller. The tray conveying module is disposed on the frame body, electrically connected to the controller and controlled to convey a chip tray from the start area to the end area. The pulling module and the pushing module are disposed on the frame body, electrically connected to the controller and controlled to cause the chip tray to be abutted against the end wall and the lateral wall of the frame body, thereby realizing the positioning of the chip tray and eliminating an error formed in the transfer process of the chip tray. In addition, the controller also controls the pushing module to knock the chip tray at a specific frequency so that the chip tray is vibrated.
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公开(公告)号：US20240102860A1
公开(公告)日：2024-03-28
申请号：US18460721
申请日：2023-09-05
Applicant: CHROMA ATE INC.
Inventor： Cheng Chih HSIEH , Tien Chi WU , Ming-Long LEE , Yu-Hsuan LIN , Tsung-I LIN , Chien-Hao MA
IPC: G01J3/16
CPC classification number: G01J3/16
Abstract: An apparatus includes a six-axis correction stage, an auto-collimation measurement device, a light splitter, a telecentric image measurement device, and a controller. The six-axis correction stage carries a device under test; the auto-collimation measurement device is arranged above the six-axis correction stage along a measurement optical axis; the light splitter is arranged on the measurement optical axis and is interposed between the six-axis correction stage and the auto-collimation measurement device. A method controls the six-axis correction stage to correct rotation errors in at least two degrees of freedom of the device under test according to a measurement result of the auto-collimation measurement device, and controls the six-axis correction stage to correct translation and yaw errors in at least three degrees of freedom of the device under test according to a measurement result of the telecentric image measurement device by means of the controller.
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155.发明授权公开(公告)号：US11932498B2
公开(公告)日：2024-03-19
申请号：US17931148
申请日：2022-09-12
Applicant: CHROMA ATE INC.
Inventor： Chin-Yi Ouyang , Chin-Yuan Kuo , Chang-Jyun He , Yung-Fan Chu
CPC classification number: B65G47/905 , G01N3/04 , G01N3/06 , G01N3/12 , G01R31/2867 , G01R31/2874 , G01R31/2887 , G01R31/2893 , H01L21/67333 , H05K13/0408 , G01N2203/0044 , G01N2203/0411
Abstract: A temperature control system and method for devices under test and an image sensor-testing apparatus having the system are provided. The temperature control method for devices under test mainly comprises the steps of regulating the temperatures of a plurality of devices under test (DUTs) to a specific temperature in a temperature control zone; transferring the plurality of devices under test to a test plate and placing them into a plurality of test slots respectively; and measuring the temperatures of the device under test by the temperature-sensing elements in the test slots, wherein when at least one temperature-sensing element of the temperature-sensing elements detects that the device under test in the test slot corresponding to said at least one temperature-sensing element fails to meet the specific temperature, a temperature control element corresponding to the test slot regulates the temperature of the device under test.
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Patent Agency Ranking
公开(公告)号：US20230400506A1
公开(公告)日：2023-12-14
申请号：US18316691
申请日：2023-05-12
Applicant: CHROMA ATE INC.
Inventor： Chin-Yi OUYANG , I-Ching TSAI , Xin-Yi WU , Yan-Lin WU
IPC: G01R31/28
CPC classification number: G01R31/2877 , G01R31/2863
Abstract: The present invention relates to a temperature control system and a temperature control method for an electronic device-testing apparatus. The temperature control system mainly includes a test socket, a temperature-controlling fluid supply device and a temperature-controlling fluid recovery device. A temperature-controlling fluid is supplied to a chip slot of the test socket by the temperature-controlling fluid supply device and drawn from the chip slot by the temperature-controlling fluid recovery device. In the present invention, the temperature-controlling fluid is forced to flow through the chip slot loaded with an electronic device so as to forcibly exchange heat with the electronic device and components in the chip slot, thereby achieving the constant temperature test. After the test is completed, the temperature-controlling fluid can be effectively recovered so that the contamination of the electronic device or the testing apparatus can be avoided.
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157.发明公开公开(公告)号：US20230375615A1
公开(公告)日：2023-11-23
申请号：US18054197
申请日：2022-11-10
Applicant: CHROMA ATE INC.
Inventor： I-Shih TSENG , Xin-Yi WU , Chin-Yi OUYANG
CPC classification number: G01R31/2891 , G01R1/44 , G01R35/00
Abstract: The present invention relates to an aging test system and an aging test method for a thermal interface material and an electronic device testing apparatus having the system, wherein a controller controls a movable carrier to move to a high temperature generating device so that the thermal interface material on the movable carrier is brought into contact with the high temperature generating device; the controller further controls a temperature sensor to detect the temperature of the thermal interface material; the controller compares an output temperature datum of the high temperature generating device with a temperature measurement datum detected by the temperature sensor. Accordingly, the thermal conductivity of the thermal interface material can be obtained for immediately determining the quality and the performance degradation of the thermal interface material, which can be used as a reference for selection or replacement of the thermal interface material.
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公开(公告)号：US11740283B2
公开(公告)日：2023-08-29
申请号：US17834035
申请日：2022-06-07
Applicant: CHROMA ATE INC.
Inventor： Chin-Yi Ouyang , Chien-Ming Chen , Wei-Cheng Kuo , Xin-Yi Wu , Iching Tsai
CPC classification number: G01R31/2893 , G01R1/0458
Abstract: The present invention relates to a multistory electronic device testing apparatus, which mainly comprises a feeding and binning device, a multi-axis transfer device, a chip-testing device and a main controller. The feeding and binning device includes an upper module and a lower module. The chip-testing device includes a plurality of testing units arranged vertically. The main controller not only controls the feeding, binning and testing operations, but also controls the multi-axis transfer device to transfer an electronic device to be tested or a tested electronic device between the feeding and binning device and the chip-testing device. Accordingly, the three-dimensional arrangement of the feeding and binning module and the testing device is realized, and the accommodating capacity and the testing capacity for the electronic devices to be tested and the tested electronic devices can be increased.
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公开(公告)号：US11714139B2
公开(公告)日：2023-08-01
申请号：US17371976
申请日：2021-07-09
Applicant: CHROMA ATE INC.
Inventor： Wen-Chung Chen , Ming-Ing Tsou , Chien-Hsing Huang , Chun-Sheng Hung , Kuan-Hung Lee
Abstract: The present disclosure relates to an electronic load apparatus. An embodiment of the present disclosure includes an electronic load apparatus including: a measurement resistor, a reference circuit, a transistor, and a feedback circuit. The measurement resistor includes a first contact, a second contact, a third contact, and a fourth contact. The first contact and the second contact are located at a first end of the measurement resistor. The third contact and the fourth contact are located at a second end of the measurement resistor. A reference power (or a reference voltage) electrically connects to the reference circuit. The reference circuit and the first contact of the measurement resistor are electrically connected. The transistor includes a drain, a gate, and a source. The reference circuit and the gate of the transistor are electrically connected. One of the source and the drain of the transistor electrically connects to the second contact of the measurement resistor. The other one of the drain and the source of the transistor electrically connects to an output terminal of a unit under test. The feedback circuit and the fourth contact of the measurement resistor are electrically connected. The feedback circuit and the reference circuit are electrically connected.
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公开(公告)号：US20230124939A1
公开(公告)日：2023-04-20
申请号：US17959443
申请日：2022-10-04
Applicant: CHROMA ATE INC.
Inventor： Kuo-Wei HUANG , Hung-Ta KAO , Po-Chen KANG , Szu-Yuan WENG , Yu-Yen WANG
Abstract: An optical lens assembly is adapted for receiving a light beam that is emitted by an object, and includes a lens unit and a sleeve unit. The lens unit includes a casing that has a light-incident side adapted for receiving the light beam. The sleeve unit surrounds the light-incident side of the casing, and defines a light-receiving space that is adapted for the light beam to pass through so that propagation of the light beam is unaffected by disturbance caused by movement of air. An optical measurement method includes steps of: a) providing a lens unit, a sleeve unit, and an object that is for emitting a light beam; and b) operating the lens unit so that the light beam is received by the lens unit.
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