公开(公告)号：US20230400478A1

公开(公告)日：2023-12-14

申请号：US18327148

申请日：2023-06-01

申请人： CHROMA ATE INC.

发明人： I-Shih TSENG ,  Chin-Yi OUYANG ,  I-Ching TSAI ,  Xin-Yi WU ,  Yan-Lin WU

IPC分类号： G01R1/04

CPC分类号： G01R1/0458

摘要： A liquid cooling system, a liquid cooling method, and an electronic device-testing apparatus having the system are disclosed. When an electronic device is accommodated in a chip slot of a test socket, a cooling liquid supply device supplies a cooling liquid to the chip slot through a fluid inlet portion, and the cooling liquid at least flows over parts of the upper and lower surfaces of the electronic device and then flows out from a fluid outlet portion. The chip slot of the test socket serves as the flow space for the cooling liquid so that the cooling liquid can flow over the upper and lower surfaces of the electronic device, and the electronic device can be immersed in the continuously flowing cooling liquid. The flowing cooling liquid can also take away foreign matter, avoiding the influence of the foreign matter on the test.

公开(公告)号：US20240151746A1

公开(公告)日：2024-05-09

申请号：US18307866

申请日：2023-04-27

申请人： CHROMA ATE INC.

发明人： I-Shih TSENG ,  I-Ching TSAI ,  Xin-Yi WU ,  Chin-Yi OUYANG

IPC分类号： G01R1/44 ,  G01R1/04 ,  G01R1/067 ,  H01R13/24 ,  H05K7/20

CPC分类号： G01R1/44 ,  G01R1/0458 ,  G01R1/06722 ,  H01R13/2421 ,  H05K7/202 ,  H05K7/20272 ,  H01R2201/20

摘要： The present invention relates to a pogo pin cooling system and a pogo pin cooling method and an electronic device testing apparatus having the system. The system uses a cooling fluid supply module for the cooling of the pogo pin, and the cooling fluid may be either a coolant or a cooling gas. When an electronic device is accommodated in the chip socket, the cooling fluid supply module supplies a cooling fluid into the chip socket through the cooling fluid supply channel and the inlet, and the cooling fluid passes through the pogo pins and then flows into the cooling fluid discharge channel through the outlet. In the present invention, the cooling fluid is mainly used to cool not only the pogo pins in the chip socket but also the bottom surface of the electronic device and the solder ball contacts on the bottom surface.

公开(公告)号：US20240142492A1

公开(公告)日：2024-05-02

申请号：US18050500

申请日：2022-10-28

申请人： CHROMA ATE INC.

发明人： I-Shih TSENG ,  Xin-Yi WU ,  I-Ching TSAI ,  Chin-Yi OUYANG

IPC分类号： G01R1/04 ,  G01R31/28

CPC分类号： G01R1/0466 ,  G01R31/2877

摘要： The present invention relates to a pogo pin cooling system and a pogo pin cooling method and an electronic device testing apparatus having the system. The system mainly comprises a coolant circulation module, which includes a coolant supply channel communicated with an inlet of a chip socket and a coolant recovery channel communicated with an outlet of the chip socket. When an electronic device is accommodated in the chip socket, the coolant circulation module supplies a coolant into the chip socket through the coolant supply channel and the inlet, and the coolant passes through the pogo pins and then flows into the coolant recovery channel through the outlet.

公开(公告)号：US20230375615A1

公开(公告)日：2023-11-23

申请号：US18054197

申请日：2022-11-10

申请人： CHROMA ATE INC.

发明人： I-Shih TSENG ,  Xin-Yi WU ,  Chin-Yi OUYANG

IPC分类号： G01R31/28 ,  G01R1/44 ,  G01R35/00

CPC分类号： G01R31/2891 ,  G01R1/44 ,  G01R35/00

摘要： The present invention relates to an aging test system and an aging test method for a thermal interface material and an electronic device testing apparatus having the system, wherein a controller controls a movable carrier to move to a high temperature generating device so that the thermal interface material on the movable carrier is brought into contact with the high temperature generating device; the controller further controls a temperature sensor to detect the temperature of the thermal interface material; the controller compares an output temperature datum of the high temperature generating device with a temperature measurement datum detected by the temperature sensor. Accordingly, the thermal conductivity of the thermal interface material can be obtained for immediately determining the quality and the performance degradation of the thermal interface material, which can be used as a reference for selection or replacement of the thermal interface material.

公开(公告)号：US20130265077A1

公开(公告)日：2013-10-10

申请号：US13716100

申请日：2012-12-15

申请人： CHROMA ATE INC.

发明人： Lan-Sheng YANG ,  I-Shih TSENG ,  Ching-Lin LEE ,  Ming-Chieh LIN ,  Yi-Lung WENG

IPC分类号： G01R31/26

CPC分类号： G01R31/2607 ,  F21S8/006 ,  F21Y2115/10 ,  H02S50/10

摘要： A solar cell testing system includes a multifunctional testing light source, a measuring unit, and an arithmetic unit. The multifunctional testing light source is configured to be switched to output a simulated solar light to a solar cell or asynchronously output a plurality of narrowband lights to the solar cell. The measuring unit is coupled to the solar cell and measures the solar cell's response to the simulated solar light and response to the asynchronously outputted narrowband lights. The arithmetic unit is coupled to the multifunctional testing light source and the measuring unit; it determines the solar cell's conversion efficiency and spectral response based on the solar cell's response to the simulated solar light and response to the asynchronously outputted narrowband lights.

摘要翻译： 太阳能电池测试系统包括多功能测试光源，测量单元和运算单元。 多功能测试光源被配置为切换以将模拟的太阳光输出到太阳能电池，或者将多个窄带光异步输出到太阳能电池。 测量单元耦合到太阳能电池并且测量太阳能电池对模拟的太阳光的响应以及对异步输出的窄带光的响应。 算术单元耦合到多功能测试光源和测量单元; 它基于太阳能电池对模拟的太阳光的响应和对异步输出的窄带光的响应来确定太阳能电池的转换效率和光谱响应。