公开(公告)号：US11932498B2

公开(公告)日：2024-03-19

申请号：US17931148

申请日：2022-09-12

Applicant: CHROMA ATE INC.

Inventor： Chin-Yi Ouyang ,  Chin-Yuan Kuo ,  Chang-Jyun He ,  Yung-Fan Chu

IPC: G01R31/28 ,  B65G47/90 ,  G01N3/04 ,  G01N3/06 ,  G01N3/12 ,  H01L21/673 ,  H05K13/04

CPC classification number: B65G47/905 ,  G01N3/04 ,  G01N3/06 ,  G01N3/12 ,  G01R31/2867 ,  G01R31/2874 ,  G01R31/2887 ,  G01R31/2893 ,  H01L21/67333 ,  H05K13/0408 ,  G01N2203/0044 ,  G01N2203/0411

Abstract: A temperature control system and method for devices under test and an image sensor-testing apparatus having the system are provided. The temperature control method for devices under test mainly comprises the steps of regulating the temperatures of a plurality of devices under test (DUTs) to a specific temperature in a temperature control zone; transferring the plurality of devices under test to a test plate and placing them into a plurality of test slots respectively; and measuring the temperatures of the device under test by the temperature-sensing elements in the test slots, wherein when at least one temperature-sensing element of the temperature-sensing elements detects that the device under test in the test slot corresponding to said at least one temperature-sensing element fails to meet the specific temperature, a temperature control element corresponding to the test slot regulates the temperature of the device under test.