公开(公告)号：US20180306856A1

公开(公告)日：2018-10-25

申请号：US15955668

申请日：2018-04-17

Applicant: CHROMA ATE INC.

Inventor： Ching-Hua CHU ,  Cheng-Hsien CHANG

IPC: G01R31/28

Abstract: A testing device includes a switch, a sensing circuit, and a control circuit. The switch is coupled to a power supply circuit, and the power supply circuit is configured to output a supply voltage to a device under-test via the switch. The sensing circuit is coupled to the device under-test, and the sensing circuit is configured to receive an input voltage from the device under-test and to output a sensing signal according to the input voltage. The control circuit is coupled to the sensing circuit, the power supply circuit, and the switch. The control circuit is configured to control the power supply circuit to stop outputting the supply voltage at a first time and to turn off the switch at a second time according to the sensing signal.

公开(公告)号：US20180031637A1

公开(公告)日：2018-02-01

申请号：US15598108

申请日：2017-05-17

Applicant: CHROMA ATE INC.

Inventor： Chih-Ming TSAI

IPC: G01R31/36 ,  H01M10/48

CPC classification number: G01R31/386 ,  G01R31/3648 ,  G01R31/385 ,  H01M10/4285 ,  H01M10/48

Abstract: A battery testing device includes a power supply, a voltmeter, a galvanometer, a differential circuit and an analyzer. The power supply is configured to provide a constant-current signal or a constant-voltage signal to a subject battery. The voltmeter is configured to detect a voltage waveform generated by the subject battery when the power supply provides the constant-current signal to the subject battery. When a voltage value of the voltage waveform achieves a threshold voltage value, the power supply switches to provide the constant-voltage signal to the subject battery. The galvanometer is configured to detect a current waveform generated by the subject battery. The differential circuit processes the voltage waveform and the current waveform by a second-order differential. The analyzer determines a testing result of the subject battery according to the processed voltage waveform and the processed current waveform.

公开(公告)号：US09841487B2

公开(公告)日：2017-12-12

申请号：US14928062

申请日：2015-10-30

Applicant: CHROMA ATE INC.

Inventor： Hou-Chun Chen ,  Shin-Wen Lin ,  Ching-Hua Chu ,  Po-Kai Cheng

IPC: G01R31/00 ,  G01R35/00 ,  G01R31/28

CPC classification number: G01R35/005 ,  G01R31/2834 ,  G01R31/2882

Abstract: A calibration board and a timing calibration method thereof are provided. The calibration board for calibrating signal delays of test channels in an automatic test equipment is pluggably disposed in the automatic test equipment and includes calibration groups, a first common node, and a switching module. Each calibration group includes a second common node and conductive pads electrically connecting to the second common node. Each conductive pad selectively and electrically connects to one test channel. The switching module electrically connects to the first common node and each second common node. When a first delay calibration procedure is performed, the connection between the first common node and each second common node is disabled. When a second delay calibration procedure is performed, the connection between the first common node and each second common node is built.

公开(公告)号：US20170292973A1

公开(公告)日：2017-10-12

申请号：US15480427

申请日：2017-04-06

Applicant: Chroma ATE Inc.

Inventor： Chien-Ming CHEN

IPC: G01R1/04 ,  H01R13/629

CPC classification number: G01R1/0466 ,  H01R13/6275 ,  H01R13/62905 ,  H01R13/62955 ,  H01R13/62966 ,  H01R2201/20

Abstract: An electronic device testing apparatus with a locking mechanism for locking a press head and a socket plate is provided. When an electronic device is to be tested, a lifting arm is lowered so that a contact portion is in contact with the electronic device, and a locking mechanism is actuated to detain the press head on the socket plate. A pressing force generating device exerts a pressing force onto the electronic device and the socket plate, and at least a portion of a reaction force can be directed back to the locking mechanism. The locking mechanism is adapted to detain the press head on the socket plate. When the pressing force generating device generates a predetermined pressing force to certainly establish electrical connection between the electronic device and the chip socket, the reaction force produced by the chip socket may be distributed over the locking mechanism.

公开(公告)号：US20170227599A1

公开(公告)日：2017-08-10

申请号：US15420154

申请日：2017-01-31

Applicant: CHROMA ATE INC.

Inventor： Xin-Yi WU ,  Chien-Hung LO

IPC: G01R31/28 ,  F28D15/00 ,  G05D23/19 ,  F25B21/04

CPC classification number: G01R31/2875 ,  F25B21/04 ,  F25B2321/021 ,  F25B2321/0212 ,  F25B2321/0252 ,  F28D15/00 ,  G01R31/2877 ,  G05D23/19 ,  G05D23/1919

Abstract: A dual loop type temperature control module and an electronic device testing apparatus having the same are provided. The temperature control module comprises a first loop through which a first working fluid of a first temperature flows, a second loop through which a second working fluid of a second temperature flows, a controller for controlling a first switching valve such that the first or second working fluid flows through a temperature regulating device, and a second switching valve such that the working fluid flowing through the temperature regulating device returns to the first or second loop. The temperature regulating device adjusts a thermoelectric cooling device to reach two different reference temperatures based on the rise/fall of its temperature dependent on the working fluid. The thermoelectric cooling device regulates the temperature of the tested object under a wide range of temperature difference and with accuracy based on the reference temperatures to facilitate the detection of high/low temperature.

公开(公告)号：US09706098B2

公开(公告)日：2017-07-11

申请号：US14958904

申请日：2015-12-03

Applicant: CHROMA ATE INC.

Inventor： Yi-Lung Weng ,  Chien-Hsun Chu

IPC: H04N5/225 ,  H04N5/235 ,  H04N17/00

CPC classification number: H04N5/2256 ,  H04N5/2354 ,  H04N17/002

Abstract: An inspection system for obtaining an adjusted light intensity image includes a light source, an image capturing device and a controller. A field of view of the image capturing device is adjusted within an illumination area of the light source. A plurality of light emitting units of the light source are turned on in sequence. The image capturing device captures a calibration image when each of the light emitting units is turned on to obtain a plurality of the calibration images. The controller adjusts the light emitting intensities of the light emitting units respectively according to the light intensity distributions of the calibration images to obtain a specific intensity distribution of an inspection image in the field of view and compensate a vignette effect of the image capturing device.

公开(公告)号：US09647650B2

公开(公告)日：2017-05-09

申请号：US14971044

申请日：2015-12-16

Applicant: CHROMA ATE INC.

Inventor： Cheng-Hsien Chang ,  Ching-Hua Chu ,  Shin-Wen Lin

IPC: H03K5/135 ,  G06F1/04 ,  H03K5/00

CPC classification number: H03K5/135 ,  G06F1/04 ,  G06F1/06 ,  H03K2005/00078

Abstract: A clock generating device includes a first timing delay module, a multiplexer, and a second timing delay module. The multiplexer is electrically connected to the first timing delay module. The second timing delay module is electrically connected to the multiplexer. The first timing delay module generates a plurality of delayed clock signals based on a reference clock signal. The multiplexer outputs a first delayed clock signal and a second delayed clock signal, among the plurality of delayed clock signals, based on a clock generating signal. The second timing delay module generates an output clock signal based on the clock generating signal, the first delayed clock signal and the second delayed clock signal.

公开(公告)号：US09638740B2

公开(公告)日：2017-05-02

申请号：US14048785

申请日：2013-10-08

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming Chen ,  Herbert Tsai ,  Chin-Yi Ou Yang

IPC: G01R31/26 ,  G01R31/28

CPC classification number: G01R31/2601 ,  G01R31/2887 ,  G01R31/2893

Abstract: A test system with rotational test arms for testing semiconductor components includes a transport device, a first test socket, a second test socket, a first test arm, and a second test arm. The first test socket and the second test socket are electrically connected to different test signals respectively and correspond to the first test arm and the second test arm. The first test arm and the second test arm test arms operate rotationally to carry and place the semiconductor components to the transport device, the first test socket and the second test socket, so the test time is improved.

公开(公告)号：US09568245B2

公开(公告)日：2017-02-14

申请号：US14681093

申请日：2015-04-08

Applicant: CHROMA ATE INC.

Inventor： Hsiu-Wei Kuo ,  Xin-Yi Wu ,  Ben-Mou Yu ,  Ming-Chang Wu ,  Mao-Sheng Liu ,  Kuei-Wen Lien

IPC: F27B17/00 ,  F27B1/08 ,  F27D7/04

CPC classification number: F27B1/08 ,  F27B17/0083 ,  F27D7/04 ,  F27D2007/045

Abstract: The disclosure discloses a heating furnace including a housing, a first rack, a chamber, and at least one fan. The first rack is disposed in the housing. The chamber is disposed in the housing and located at a side of the first rack. The chamber includes an inlet, a first sidewall, and a second sidewall. The first sidewall is adjacent to the first rack. The first sidewall has a plurality of vents. The first sidewall and the second sidewall are disposed to face each other. A width is spaced between the first sidewall and the second sidewall, and the width is larger than or equal to 200 mm. The fan is disposed in the housing for generating an airflow to the inlet.

Abstract translation: 本公开公开了一种加热炉，其包括壳体，第一齿条，腔室和至少一个风扇。 第一个机架设置在外壳中。 腔室设置在壳体中并且位于第一齿条的一侧。 腔室包括入口，第一侧壁和第二侧壁。 第一侧壁与第一机架相邻。 第一侧壁具有多个通风孔。 第一侧壁和第二侧壁被设置为彼此面对。 宽度在第一侧壁和第二侧壁之间间隔开，并且宽度大于或等于200mm。 风扇设置在壳体中以产生到入口的气流。

公开(公告)号：US20160165110A1

公开(公告)日：2016-06-09

申请号：US14958904

申请日：2015-12-03

Applicant: CHROMA ATE INC.

Inventor： Yi-Lung WENG ,  Chien-Hsun CHU

IPC: H04N5/225 ,  G06T7/00 ,  H04N17/00 ,  G06K9/46

CPC classification number: H04N5/2256 ,  H04N5/2354 ,  H04N17/002

Abstract: An inspection system for obtaining an adjusted light intensity image includes a light source, an image capturing device and a controller. A field of view of the image capturing device is adjusted within an illumination area of the light source. A plurality of light emitting units of the light source are turned on in sequence. The image capturing device captures a calibration image when each of the light emitting units is turned on to obtain a plurality of the calibration images. The controller adjusts the light emitting intensities of the light emitting units respectively according to the light intensity distributions of the calibration images to obtain a specific intensity distribution of an inspection image in the field of view and compensate a vignette effect of the image capturing device.

Abstract translation: 用于获得调节光强度图像的检查系统包括光源，图像捕获装置和控制器。 在光源的照明区域内调整图像拍摄装置的视场。 光源的多个发光单元依次接通。 当每个发光单元被打开时，图像捕获装置捕获校准图像，以获得多个校准图像。 控制器根据校准图像的光强度分布来分别调整发光单元的发光强度，以获得视场中的检查图像的特定强度分布并补偿摄像装置的暗影效果。