公开(公告)号：US09638740B2

公开(公告)日：2017-05-02

申请号：US14048785

申请日：2013-10-08

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming Chen ,  Herbert Tsai ,  Chin-Yi Ou Yang

IPC: G01R31/26 ,  G01R31/28

CPC classification number: G01R31/2601 ,  G01R31/2887 ,  G01R31/2893

Abstract: A test system with rotational test arms for testing semiconductor components includes a transport device, a first test socket, a second test socket, a first test arm, and a second test arm. The first test socket and the second test socket are electrically connected to different test signals respectively and correspond to the first test arm and the second test arm. The first test arm and the second test arm test arms operate rotationally to carry and place the semiconductor components to the transport device, the first test socket and the second test socket, so the test time is improved.