Parallel optical thin film measurement system for analyzing multianalytes
    121.
    发明授权
    Parallel optical thin film measurement system for analyzing multianalytes 有权
    平行光学薄膜测量系统用于分析多分辨率

    公开(公告)号:US09546949B2

    公开(公告)日:2017-01-17

    申请号:US14408725

    申请日:2013-12-20

    Inventor: Neal G. Skinner

    Abstract: Optical computing devices including a light source that emits electromagnetic radiation into an optical train extending from the light source to a detector, a substance arranged in the optical train and configured to optically interact with the electromagnetic radiation and produce sample interacted radiation, a processor array arranged in the optical train and including a plurality of ICE arranged on a substrate and configured to optically interact with the electromagnetic radiation. The detector receives modified electromagnetic radiation generated through optical interaction of the electromagnetic radiation with the substance and the processor array. A weighting device is coupled to one or more of the ICE to optically apply a weighting factor to the modified electromagnetic radiation prior to being received by the detector, wherein the detector generates an output signal indicative of a characteristic of the substance based on beams of modified electromagnetic radiation.

    Abstract translation: 光学计算设备,包括将电磁辐射发射到从光源延伸到检测器的光学系列中的光源,布置在光学系列中并被配置为与电磁辐射光学相互作用并产生样品相互作用的辐射的物质,布置成 并且包括布置在基板上并被配置为与电磁辐射光学相互作用的多个ICE。 检测器接收通过电磁辐射与物质和处理器阵列的光学相互作用产生的修改的电磁辐射。 加权装置耦合到ICE中的一个或多个,以在由检测器接收之前将加权因子光学地应用于修改的电磁辐射,其中,所述检测器基于经修改的光束来生成指示所述物质的特征的输出信号 电磁辐射。

    Spectral device
    122.
    发明授权
    Spectral device 有权
    光谱仪

    公开(公告)号:US09488827B2

    公开(公告)日:2016-11-08

    申请号:US13574103

    申请日:2011-01-06

    Abstract: The object is to easily expand a variable range of selective wavelengths without enlarging a device. A spectral device 1 of the present invention includes four band pass filters 11a to 11d through which a light L2 from a light source 3 is selectively transmitted within a wavelength range according to an incident angle of the light L2, and a tabular rotary table 10 in which the band pass filters 11a to 11d are installed upright on a principal surface 10a, and which is made rotatable around a rotational center C1 along the principal surface 10a, and the four band pass filters 11a to 11d are respectively disposed so that optical incidence planes 12 or optical emission planes 13 are inclined with respect to lines connecting the rotational center C1 on the principal surface 10a of the rotary table 10 and center points 15a and 15d of the band pass filters 11a to 11d.

    Abstract translation: 目的是在不扩大设备的情况下容易地扩展选择波长的可变范围。 本发明的光谱装置1包括四个带通滤波器11a至11d,来自光源3的光L2根据光L2的入射角在波长范围内有选择地透射,并且其中平板状转台10 带通滤波器11a至11d直立安装在主表面10a上,并且沿着主表面10a绕旋转中心C1旋转,并且分别设置四个带通滤波器11a至11d,使得光入射面 12或光发射平面13相对于连接旋转台10的主表面10a上的旋转中心C1和带通滤波器11a至11d的中心点15a和15d的线倾斜。

    Distributed Acoustic Sensing for Passive Ranging Optical Computing Device Having Detector With Non-Planar Semiconductor Structure
    123.
    发明申请
    Distributed Acoustic Sensing for Passive Ranging Optical Computing Device Having Detector With Non-Planar Semiconductor Structure 有权
    具有非平面半导体结构检测器的被动测距光学计算设备的分布式声学感应

    公开(公告)号:US20160274077A1

    公开(公告)日:2016-09-22

    申请号:US15031201

    申请日:2013-12-18

    Inventor: DAVID L. PERKINS

    Abstract: An optical computing device including a detector having a non-planar semiconductor structure is provided. The detector may include one or more structures having structure characteristics that may be optimized to respond to and weight predetermined wavelengths of light radiated from a sample that are related to characteristics of the sample. The detector may include an array of the one or more structures, wherein each of the structure units may be individually addressable to program or tune the detector to respond to and weight a spectra of light and generate an output signal based on the weighted spectra of light that is proportional to the characteristics of the sample.

    Abstract translation: 提供了一种包括具有非平面半导体结构的检测器的光学计算设备。 检测器可以包括具有结构特征的一个或多个结构,其可以被优化以响应并加权与样品的特性相关的从样品辐射的预定波长的光。 检测器可以包括一个或多个结构的阵列,其中每个结构单元可以是单独寻址的,以编程或调谐检测器以响应并加权光谱,并基于光的加权光谱产生输出信号 这与样品的特性成比例。

    Microscope spectrometer, optical axis shift correction device, spectroscope and microscope using same
    125.
    发明授权
    Microscope spectrometer, optical axis shift correction device, spectroscope and microscope using same 有权
    显微镜光谱仪,光轴偏移校正装置,分光镜和显微镜使用相同

    公开(公告)号:US09442013B2

    公开(公告)日:2016-09-13

    申请号:US13897981

    申请日:2013-05-20

    Inventor: Mitsuhiro Iga

    Abstract: A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.

    Abstract translation: 一种显微镜光谱仪,其中当来自光源的激发光照射样品时,从进入显微镜的样品发射的光被分析,可以包括:第一光学装置,其形成从样品发射的光作为平行光束 ; 第一可变带通滤波器装置,其具有透射入射光的可变波长通带,入射光中的哪一个是预先建立的波长通带的光; 二维阵列光检测装置,其对波长通带中的光进行成像; 以及控制装置,其通过二维阵列光检测装置来控制成像的定时,并且根据该定时改变第一可变带通滤波器装置的波长通带。

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