Abstract:
Methods and apparatus relate to a 1-to-2 memory interface deserializer circuit that, in a training mode, independently positions even and odd strobes in respective even and odd data windows. In an illustrative example, the deserializer circuit may receive a data signal that encodes even and odd data streams on the rising (even) and falling (odd) edges of a strobe clock signal. During a training mode, the deserializer circuit may independently determine, for example, an optimal temporal delay for each of the even strobe and the odd strobe. Adjustable delay lines dedicated to each of the even and odd strobe signals may simultaneously detect valid data window edges to permit determination of a desired delay to optimally position the strobe signals. Various embodiments may advantageously reduce jitter associated with asymmetric strobe and/or data signals to achieve a predetermined specification (e.g., timing margins) within the corresponding data windows.
Abstract:
An example method of calibrating a source-synchronous system includes: performing initial calibration of a source-synchronous receiver, which is configured to receive data signals and a strobe, to determine an initial strobe delay and initial data delays; setting a strobe delay circuit that delays the strobe to have the initial strobe delay and data delay circuits that delay the data signals to have the initial data delays; measuring first data eye margins of the data signals at a first time; calculating metrics for the data signals based on the first data eye margins; and measuring second data eye margins of the data signals at a second time; and updating the data delay circuits and the strobe delay circuit based on the second data eye margins and the metrics.
Abstract:
In an apparatus relating generally to an IC die, the IC die has a regulated power supply, a power supply grid, and a test circuit. The regulated power supply is biased between a source supply node and a source ground node, which are externally accessible nodes of the IC die. An internal supply node of the power supply grid is coupled to the regulated power supply. The test circuit is coupled to the internal supply node of the power supply grid. The test circuit is configured to test for at least one short in the power supply grid. The test circuit is configured to limit power through the power supply grid to less than that of a probe tip tolerance. The test circuit is configured to test for the at least one short in presence of background current leakage of the power supply grid.
Abstract:
An integrated circuit (IC) device includes a first IC chip, a second IC chip, and a chip-to-chip interface connected between the first IC chip and the second IC chip. The chip-to-chip interface communicates an interface clock signal and a logic clock signal between the first IC chip and the second IC chip. A frequency of the interface clock signal is a multiple of a frequency of the logic clock signal.
Abstract:
In an example, a voltage-controlled oscillator (VCO) includes: an oscillator having a supply input; and a voltage regulator, coupled to the supply input. The voltage regulator includes: a first transistor and a second transistor providing a first source-coupled transistor pair, and a third transistor and a fourth transistor providing a second source-coupled transistor pair; an active load coupled to drains of the first, second, third, and fourth transistors; a first current source coupled to sources of the first and second transistors, and a second current source coupled to sources of the third and fourth transistors; a fifth transistor having a source and a drain coupled to the source and the drain, respectively, of the first transistor; and a sixth transistor having a source and a drain coupled to the source and the drain, respectively, of the third transistor.
Abstract:
An apparatus relating generally to time-to-digital conversion is disclosed. In this apparatus, a time-to-digital converter is coupled to a period sensor. The period sensor includes a pulse generator to generate a pulse. An integrator of the period sensor is coupled to receive the pulse to generate an analog voltage signal responsive to the pulse. The time-to-digital converter includes an analog-to-digital converter coupled to provide a digital signal associated with the analog voltage signal.
Abstract:
An integrated circuit (IC) device includes a first IC chip, a second IC chip, and a chip-to-chip interface connected between the first IC chip and the second IC chip. The chip-to-chip interface communicates an interface clock signal and a logic clock signal between the first IC chip and the second IC chip. The interface clock signal is synchronous with a data signal received by one of the first IC chip and the second IC chip. The logic clock signal is asynchronous with the data signal.
Abstract:
In an example, operating a PLL circuit includes generating an error signal in response to comparison of a reference clock signal having a reference frequency and a feedback clock signal having a feedback frequency, generating a plurality of clock signals having an output frequency based on the error signal, and generating the feedback clock signal from the plurality of clock signals based on a first divider value and a control value derived from a second divider value. Operating the PLL circuit further includes multiplying each of a first integer value and a first fractional value by a power of two to generate a second integer value and a second fractional value, respectively, generating the second divider value using a sigma-delta modulator (SDM) based on the second integer value and the second fractional value, and dividing the second divider value by the power of two to generate the first divider value.
Abstract:
An example method of calibrating a source-synchronous system includes: performing initial calibration of a source-synchronous receiver, which is configured to receive data signals and a strobe, to determine an initial strobe delay and initial data delays; setting a strobe delay circuit that delays the strobe to have the initial strobe delay and data delay circuits that delay the data signals to have the initial data delays; measuring first data eye margins of the data signals at a first time; calculating metrics for the data signals based on the first data eye margins; and measuring second data eye margins of the data signals at a second time; and updating the data delay circuits and the strobe delay circuit based on the second data eye margins and the metrics.