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1.
公开(公告)号:US20170110316A1
公开(公告)日:2017-04-20
申请号:US15237646
申请日:2016-08-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Mi-hyun PARK , Jung-min OH , Kyoung-hwan KIM , In-gi KIM , Hyo-san LEE , Ji-hoon JEONG , Kyoung-seob KIM , Seok-hoon KIM
IPC: H01L21/02 , H01L29/06 , H01L29/161 , H01L29/16 , C11D11/00 , H01L29/51 , H01L29/49 , H01L29/66 , C11D1/29 , H01L29/78 , H01L29/08
CPC classification number: C11D11/0047 , C11D1/146 , C11D1/22 , C11D1/29 , H01L21/02068 , H01L21/02071 , H01L21/67051 , H01L29/0653 , H01L29/0847 , H01L29/1608 , H01L29/161 , H01L29/4966 , H01L29/517 , H01L29/66545 , H01L29/66636 , H01L29/66795
Abstract: A method of cleaning a substrate includes providing the substrate, the substrate including a metal material film, performing physical cleaning of the substrate, performing chemical cleaning of the substrate, and drying a surface of the substrate. Performing the chemical cleaning includes supplying a chemical cleaning solution including an anionic surfactant at a concentration that is equal to or greater than a critical micelle concentration (CMC) onto the surface of the substrate.
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2.
公开(公告)号:US20180358242A1
公开(公告)日:2018-12-13
申请号:US15827144
申请日:2017-11-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Young-hoo Kim , Sang-jine PARK , Yong-jhin CHO , Yeon-jin GIL , Ji-hoon JEONG , Byung-kwon CHO , Yong-sun KO , Kun-tack LEE
IPC: H01L21/67 , H01L21/687
CPC classification number: H01L21/67034 , H01L21/02101 , H01L21/67126 , H01L21/68735
Abstract: A substrate processing apparatus includes a vessel providing a processing space for processing a substrate, a substrate support supporting the substrate loaded in the processing space, and a barrier between a side wall of the vessel and the substrate support and surrounding an edge of the substrate supported by the substrate support.
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公开(公告)号:US20210217635A1
公开(公告)日:2021-07-15
申请号:US17215928
申请日:2021-03-29
Applicant: Samsung Electronics Co., Ltd.
Inventor: Young-hoo Kim , Sang-jine PARK , Yong-jhin CHO , Yeon-jin GIL , Ji-hoon JEONG , Byung-kwon CHO , Yong-sun KO , Kun-tack LEE
IPC: H01L21/67 , H01L21/687
Abstract: A substrate processing apparatus includes a vessel providing a processing space for processing a substrate, a substrate support supporting the substrate loaded in the processing space, and a barrier between a side wall of the vessel and the substrate support and surrounding an edge of the substrate supported by the substrate support.
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