DEVICE FOR MEASURING DEFORMATIONS, STRESSES, FORCES AND/OR TORQUES IN A PLURALITY OF AXES

    公开(公告)号:US20240167896A1

    公开(公告)日:2024-05-23

    申请号:US18548528

    申请日:2022-03-01

    CPC classification number: G01L1/04 G01L1/18 G01L5/162

    Abstract: The invention preferably relates to an apparatus for measuring deformations, stresses, forces and/or torques of an object comprising a spring body and a sensor chip, which comprises one or more sensor elements for measuring a deformation, stress, force and/or a torque as well as an electronic circuit on a substrate. The spring body comprises a base plate on the front side of which a force conductor, preferably in the form of a pin, is installed, the sensor chip being positioned on the rear side of the base plate below the force conductor. The invention further relates to a system comprising a described apparatus and a data processing unit, wherein the data processing unit is configured for reading out measured data detected by the sensor chip and preferably detects the forces and/or torques acting on the force conductor based thereon.

    Rosette piezo-resistive gauge circuit for thermally compensated measurement of full stress tensor

    公开(公告)号:US11650110B2

    公开(公告)日:2023-05-16

    申请号:US17089421

    申请日:2020-11-04

    CPC classification number: G01L1/18 B81B7/02 G01L5/162 B81B2201/0264

    Abstract: Techniques relating to a micro-electro-mechanical (MEMS) device configured to measure direct axial and shear stress components of a stress tensor are described. The MEMS device includes a first and second circuit configured in a double rosette structure coupled with a third circuit in a standard rosette structure to form a triple rosette piezo-resistive gauge circuit. The first circuit includes at least one piezoresistive element suspended from a substrate, and at least one piezoresistive element fixed to the substrate. The second circuit includes each piezoresistive element fixed to the substrate. The third circuit includes at least one piezoresistive element fixed to the substrate. Additionally, the MEMS device may be coupled to one or more processing systems to determine a mechanical stress tensor that is applied to the MEMS device based on measurements received from the MEMS device.

    POSTURE DETECTION SYSTEM AND POSTURE DETECTION METHOD

    公开(公告)号:US20230056977A1

    公开(公告)日:2023-02-23

    申请号:US17796600

    申请日:2020-01-31

    Abstract: A posture detection system for detecting a user's posture according to the embodiments includes a pressure sensor unit, a controller, a feedback mechanism, and a display unit. The pressure sensor unit has a sheet shape or a padded shape and includes plurality of sensors. Each of the sensors is configured to detect a pressure applied from the user. The controller is configured to classify the user's posture based on detection data detected by the pressure sensor unit. The feedback mechanism is configured to provide feedback to the user by vibrating based on a result of the classification. The display unit is configured to perform a display according to the result of the classification.

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