摘要:
Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.
摘要:
A transmitted light intensity measurement unit for measuring a concentration of fluid flowing through a duct comprises: a light source for supplying light into the duct from a light supply part on a surface of the duct; a light receiving element for receiving the light, which has been passed from the light supply part through the duct wall and the fluid inside the duct, at a light receiving part located on an opposite side in a diametrical direction of the duct relative to the light supply part, and outputs a signal indicating an intensity of the light; and a light-transmissive member disposed on at least one light path among a light pass between the light source and the light supply part and a light pass between the light receiving element and the light receiving part, abutting and closely contacting the duct wall by an elastic deformation of the duct wall.
摘要:
The present invention relates to methods and apparatus for detecting and measuring the concentration of a substance in a solution, the substance having an absorption at 300 nm or less. The methods and apparatus have particular utility in detecting and measuring the concentration of proteins and nucleic acids.
摘要:
A fabrication cluster can be controlled using optical metrology. A fabrication process is performed on a wafer using a fabrication cluster. A photonic nanojet, an optical intensity pattern induced at a shadow-side surface of a dielectric microsphere, is generated. An inspection area on the wafer is scanned with the photonic nanojet. A measurement is obtained of the retroreflected light from the dielectric microsphere as the photonic nanojet scans the inspection area. The existence of a structure in the inspection area is determined with the obtained measurement of the retroreflected light. One or more process parameters of the fabrication cluster is adjusted based on the determination of the existence of the structure in the inspection area.
摘要:
The present invention is relates to an optical fiber assembly which may be used in an optical detection system. The optical fiber assembly may comprise a trifurcated cable and a ball lens in optical communication with the trifurcated cable. The trifurcated cable may comprise an excitation bundle, a first emission bundle for receiving light and a second emission bundle for receiving light.
摘要:
A bent capillary flow cell with protruding end bulbs coaxial with centerline of an elongated center cylindrical section of capillary tubing. The bulbs provide a high light throughput entrance window for the cell. Light is piped along the elongated center section by total internal reflection at the outside surface of the cell wall. An external light absorbing band is placed in optical contact with outer surface of the cell wall over a transition cone region between the bulb and center cylindrical section of the cell. Each of the external light absorbing bands extend a short prescribed distance over the cylindrical wall to absorb light rays that would otherwise be light piped within the cell wall and have little exposure to the liquid in the cell.
摘要:
Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.