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    Temperature monitoring in a semiconductor device by thermocouples distributed in the contact structure
    2.
    发明授权
    Temperature monitoring in a semiconductor device by thermocouples distributed in the contact structure 有权
    通过分布在接触结构中的热电偶对半导体器件进行温度监控

    公开(公告)号：US08373244B2

    公开(公告)日：2013-02-12

    申请号：US12169020

    申请日：2008-07-08

    申请人： Anthony Mowry ,  Casey Scott ,  Roman Boschke

    发明人： Anthony Mowry ,  Casey Scott ,  Roman Boschke

    IPC分类号： H01L31/058

    CPC分类号： G01K1/026 ,  G01K1/14 ,  G01K7/028 ,  G01K2003/145 ,  G01K2217/00 ,  H01L27/16

    摘要： By forming thermocouples in a contact structure of a semiconductor device, respective extension lines of the thermocouples may be routed to any desired location within the die, without consuming valuable semiconductor area in the device layer. Thus, an appropriate network of measurement points of interest may be provided, while at the same time allowing the application of well-established process techniques and materials. Hence, temperature-dependent signals may be obtained from hot spots substantially without being affected by design constraints in the device layer.

    摘要翻译： 通过在半导体器件的接触结构中形成热电偶，热电偶的相应延长线可以被引导到管芯内的任何所需位置，而不消耗器件层中的有价值的半导体区域。 因此，可以提供适当的测量点网络，同时允许应用已建立的工艺技术和材料。 因此，温度依赖性信号可以从热点获得，而不受设备层中的设计约束的影响。

    Component arrangement and method for determining the temperature in a semiconductor component
    3.
    发明申请
    Component arrangement and method for determining the temperature in a semiconductor component 有权
    用于确定半导体部件中的温度的部件布置和方法

    公开(公告)号：US20070200193A1

    公开(公告)日：2007-08-30

    申请号：US11655749

    申请日：2007-01-19

    申请人： Wolfgang Horn

    发明人： Wolfgang Horn

    IPC分类号： H01L31/058

    CPC分类号： H02H6/00 ,  G01K7/015 ,  G01K7/425 ,  G01K2003/145 ,  H01L2924/0002 ,  H02H5/044 ,  H01L2924/00

    摘要： The invention relates to a component arrangement comprising a semiconductor component having a semiconductor body (100), and comprising a temperature measuring arrangement for determining a temperature at a specific position (20) in the semiconductor body, which comprises the following features: a temperature sensor (10) integrated in the semiconductor body (100), said temperature sensor being designed to generate a first temperature signal (V10) dependent on a temperature in the semiconductor body (100), a control device comprising a control amplifier (40), which has a first and a second input (41, 42) and an output (43), and comprising a low-pass filter (50) having an input (51) and an output (52), the input (51) of the low-pass filter (50) being coupled to the output (43) of the control amplifier (40), the first input of the control amplifier (40) being coupled to the temperature sensor (10) and the second input (42) of the control amplifier (40) being coupled to the output (52) of the low-pass filter (50), an output, which is coupled to the output of the control amplifier (40) and at which a second temperature signal (V40) is available. The invention additionally relates to a method for determining the temperature in a semiconductor component.

    摘要翻译： 本发明涉及包括具有半导体主体（100）的半导体部件的部件布置，并且包括用于确定半导体主体中的特定位置（20）处的温度的温度测量装置，其包括以下特征：温度传感器 （10），所述温度传感器被设计为产生取决于半导体本体（100）中的温度的第一温度信号（V 10），控制装置包括控制放大器（40），所述控制放大器 其具有第一和第二输入（41,42）和输出（43），并且包括具有输入（51）和输出（52）的低通滤波器（50），所述输入端 低通滤波器（50）耦合到控制放大器（40）的输出（43），控制放大器（40）的第一输入端耦合到温度传感器（10）和第二输入端 控制放大器（4 0）耦合到低通滤波器（50）的输出（52），输出耦合到控制放大器（40）的输出端，第二温度信号（V 40）在该输出端可用。 本发明还涉及一种用于确定半导体部件中的温度的方法。

    Superconductor quench measuring device which evaluates reflected pulses
    4.
    发明授权
    Superconductor quench measuring device which evaluates reflected pulses 失效
    评估反射脉冲的超导体测量装置

    公开(公告)号：US5179342A

    公开(公告)日：1993-01-12

    申请号：US653571

    申请日：1991-02-11

    申请人： William R. Wolfe ,  James R. Logan ,  Eric P. Shook

    发明人： William R. Wolfe ,  James R. Logan ,  Eric P. Shook

    IPC分类号： G01N27/02 ,  G01R27/16 ,  G01R31/00 ,  G01R33/12

    CPC分类号： G01R33/1246 ,  G01K2003/145 ,  G01K2007/166 ,  G01K2203/00 ,  Y10S505/843

    摘要： In a method and apparatus for detecting and locating a quench zone in a superconducting coil, a sensor is positioned adjacent to and in heat transfer communication with the entire length of the superconducting coil. When a portion of the superconducting coil becomes normal, the adjacent portion of the sensor becomes resistive. A series of electrical pulses sent along the sensor are reflected back by the discontinuity in impedance which occurs at such a normal zone. The reflected pulses and echo pulses produced by various terminations on the sensor are detected by an associated receiver and processor which calculates the location of the resistive zone along the sensor and the corresponding quench zone along the superconducting coil using information derived from the pulses. A second embodiment provides two sensors which are adjacent to and in heat transfer communication with the coil which are pulsed from opposite ends.

    DETERMINING AN EXTREME TEMPERATURE LOCATION FROM A PLURALITY OF LOCATIONS
    8.
    发明申请
    DETERMINING AN EXTREME TEMPERATURE LOCATION FROM A PLURALITY OF LOCATIONS 审中-公开
    从多个位置确定极端温度的位置

    公开(公告)号：US20160238457A1

    公开(公告)日：2016-08-18

    申请号：US15030983

    申请日：2014-09-30

    申请人： PARKER-HANNIFIN CORPORATION

    发明人： Harold Raymond Leighton, II

    IPC分类号： G01K3/14 ,  G01K1/02

    CPC分类号： G01K3/14 ,  G01K1/026 ,  G01K2003/145

    摘要： A device for determining an extreme temperature location from a plurality of locations connects along a daisy chain of devices each of which mounts to a respective location from the plurality of locations. The device includes an input terminal operably connected to a remote device at a remote location from the plurality of locations via the daisy chain. The input terminal receives a remote temperature signal indicative of a remote temperature corresponding to the remote location and a remote location signal indicative of the remote location. The device also includes a local temperature determining logic that generates a local temperature signal indicative of a local temperature corresponding to the location of the device, and at least one comparator operably connected to the input terminal and to the local temperature determining logic and configured to compare the local temperature signal to the remote temperature signal.

    摘要翻译： 用于从多个位置确定极端温度位置的装置沿着装置的菊花链连接，每个装置的菊花链从多个位置安装到相应的位置。 该装置包括输入端，其可操作地经由菊花链从多个位置远程位置连接到远程设备。 输入端子接收指示对应于远程位置的远程温度的远程温度信号和指示远程位置的远程位置信号。 该装置还包括本地温度确定逻辑，其产生指示对应于设备的位置的局部温度的局部温度信号，以及可操作地连接到输入端和本地温度确定逻辑并被配置为比较的本地温度信号 本地温度信号到远程温度信号。

    Monitoring the temperature change in the charging cable
    10.
    发明申请
    Monitoring the temperature change in the charging cable 审中-公开
    监控充电电缆的温度变化

    公开(公告)号：US20130100982A1

    公开(公告)日：2013-04-25

    申请号：US13636414

    申请日：2011-03-15

    申请人： Stephan Gase ,  Jochen Fassnacht ,  Dragan Mikulec ,  Philipp Morrison

    发明人： Stephan Gase ,  Jochen Fassnacht ,  Dragan Mikulec ,  Philipp Morrison

    IPC分类号： G01N25/00

    CPC分类号： G01N25/00 ,  B60L3/0069 ,  B60L3/04 ,  B60L53/14 ,  B60L53/18 ,  B60L2240/36 ,  G01K3/08 ,  G01K7/16 ,  G01K13/00 ,  G01K2003/145 ,  Y02T10/7005 ,  Y02T10/7088 ,  Y02T90/121 ,  Y02T90/14

    摘要： A method for determining the temperature change of a feeder cable of a charging device in that, in a first task, the electromagnetic input pulse is coupled into the feeder cable, the electromagnetic input pulse being able to be reflected in the feeder cable and the reflected portion returning to the charging device as reflected electromagnetic output pulse; in a second task, the pulse shape of the reflected electromagnetic output pulse is determined; in a third task, the pulse shape of the reflected electromagnetic output pulse is compared to a reference pulse shape of the reflected reference pulse; in a fourth task, the temperature change is determined by comparing the two pulse shapes.

    摘要翻译： 一种用于确定充电装置的馈电电缆的温度变化的方法，因为在第一任务中，电磁输入脉冲被耦合到馈电电缆中，电磁输入脉冲能够被反射在馈电电缆中并被反射 部分作为反射电磁输出脉冲返回到充电装置; 在第二任务中，确定反射的电磁输出脉冲的脉冲形状; 在第三任务中，将反射的电磁输出脉冲的脉冲形状与反射的参考脉冲的参考脉冲形状进行比较; 在第四个任务中，通过比较两个脉冲形状来确定温度变化。