知搜-全球专利检索

  1. 登录
  2. 注册

搜索结果

38 条记录 (耗时 0.015 秒)

    NANOWIRE STRUCTURED COLOR FILTER ARRAYS AND FABRICATION METHOD OF THE SAME
    1.
    发明申请
    NANOWIRE STRUCTURED COLOR FILTER ARRAYS AND FABRICATION METHOD OF THE SAME 审中-公开

    公开(公告)号：US20160225811A1

    公开(公告)日：2016-08-04

    申请号：US15093928

    申请日：2016-04-08

    申请人： ZENA TECHNOLOGIES, INC.

    发明人： Young-June Yu ,  Munib Wober

    IPC分类号： H01L27/146 ,  H01L29/06 ,  H01L27/148

    CPC分类号： H01L27/14621 ,  B82Y20/00 ,  H01L27/14625 ,  H01L27/14627 ,  H01L27/1464 ,  H01L27/14649 ,  H01L27/14685 ,  H01L27/14875 ,  H01L29/0676

    摘要： Color filter array devices and methods of making color filter array devices are disclosed herein. A color filter array may include a substrate having a plurality of pixels thereon, one or more nanowires associated with each of the plurality of pixels, wherein each of the one or more nanowires extends substantially perpendicularly from the substrate, and an optical coupler associated with each of the one or more nanowires. A method of making a color filter array may include, making an array of nanowires, wherein each of the nanowires extend substantially perpendicularly from a substrate, disposing a transparent polymer material to substantially encapsulate the nanowires, removing the nanowires from the substrate, providing a pixel array comprising a plurality of pixels, wherein a hard polymer substantially covers an image plane of the pixel array, disposing the array of nanowires on the pixel array, and removing the transparent polymer encapsulating the nanowires.

    Pillar Based Amorphous and Polycrystalline Photoconductors for X-ray Image Sensors
    3.
    发明申请
    Pillar Based Amorphous and Polycrystalline Photoconductors for X-ray Image Sensors 审中-公开
    用于X射线图像传感器的基于柱的非晶和多晶感光体

    公开(公告)号：US20160161426A1

    公开(公告)日：2016-06-09

    申请号：US14563781

    申请日：2014-12-08

    申请人： ZENA TECHNOLOGIES, INC.

    发明人： Munib Wober

    IPC分类号： G01N23/04 ,  G21K1/06 ,  G01N23/20

    CPC分类号： G01N23/046 ,  G01N23/20008 ,  G01T1/24

    摘要： Sensors and devices for detecting X-rays are described herein. A device for detecting X-rays may include a first electrode, a second electrode, a microstructure, and an insulating photon absorbing material. The microstructure is configured to provide an electrical path between the first electrode and the second electrode such that at least a portion of charge carriers generated in the photon absorbing material by incident X-ray are collected in a direction different from the direction of the incident X-ray.

    摘要翻译： 本文描述了用于检测X射线的传感器和装置。 用于检测X射线的装置可以包括第一电极，第二电极，微结构和绝缘光子吸收材料。 微结构被配置为在第一电极和第二电极之间提供电路径，使得通过入射X射线在光子吸收材料中产生的电荷载体的至少一部分在与入射X的方向不同的方向上被收集 -射线。

    MULTISPECTRAL AND POLARIZATION-SELECTIVE DETECTOR
    4.
    发明申请
    MULTISPECTRAL AND POLARIZATION-SELECTIVE DETECTOR 审中-公开
    多检测和极化选择性检测器

    公开(公告)号：US20160111562A1

    公开(公告)日：2016-04-21

    申请号：US14516162

    申请日：2014-10-16

    申请人： ZENA TECHNOLOGIES, INC.

    发明人： Munib Wober

    IPC分类号： H01L31/0232 ,  H01L27/146 ,  H01L31/0352 ,  H01L31/105

    CPC分类号： H01L31/02327 ,  H01L27/14601 ,  H01L27/14625 ,  H01L27/14643 ,  H01L27/14665 ,  H01L31/035281 ,  H01L31/03529 ,  H01L31/103 ,  H01L31/105 ,  Y02E10/50

    摘要： Described herein are devices operable to detect various portions of radiation incident on a receiving area of the device, systems incorporating the same, methods of using and methods of manufacturing thereof. Such a device comprises a substrate; at least one first feature; and at least one second feature, both extending substantially perpendicularly from the substrate. The at least one first feature and the at least second feature are operable to selectively absorb various portions of the radiation defined by their respective ranges of wavelengths and linear polarization. The at least one first feature and the at least one second feature are positioned on the substrate such that at least 50% of the first portion and at least 50% of the second portion of the radiation incident on the receiving area is selectively absorbed by the at least one first feature and the at least one second feature, respectively.

    摘要翻译： 这里描述的是可操作以检测入射在设备的接收区域上的辐射的各个部分的装置，包括其的系统，使用方法及其制造方法。 这种装置包括基板; 至少一个第一特征; 以及至少一个第二特征，两者都基本上垂直于基底延伸。 所述至少一个第一特征和所述至少第二特征可操作以选择性地吸收由它们各自的波长范围和线偏振限定的辐射的各个部分。 所述至少一个第一特征和所述至少一个第二特征被定位在所述基底上，使得入射在所述接收区域上的所述第一部分的至少50％的所述第一部分和所述第二部分的至少50％被所述第一部分选择性地吸收 至少一个第一特征和至少一个第二特征。

    POLARIZED LIGHT DETECTING DEVICE AND FABRICATION METHODS OF THE SAME
    8.
    发明申请
    POLARIZED LIGHT DETECTING DEVICE AND FABRICATION METHODS OF THE SAME 审中-公开
    偏振光检测器件及其制造方法

    公开(公告)号：US20140339666A1

    公开(公告)日：2014-11-20

    申请号：US14450812

    申请日：2014-08-04

    申请人： ZENA TECHNOLOGIES, INC.

    发明人： Young-June Yu ,  Munib Wober

    IPC分类号： H01L27/146

    CPC分类号： H01L27/14643 ,  G01J1/429 ,  G01J4/04 ,  H01L27/1443 ,  H01L27/14605 ,  H01L27/14629 ,  H01L27/14683 ,  H01L31/022408 ,  H01L31/028 ,  H01L31/035227 ,  H01L31/035281 ,  H01L31/105 ,  H01L31/107 ,  Y02E10/50

    摘要： Described herein is a device operable to detect polarized light comprising: a substrate; a first subpixel; a second subpixel adjacent to the first subpixel; a first plurality of features in the first subpixel and a second plurality of features in the second subpixel, wherein the first plurality of features extend essentially perpendicularly from the substrate and extend essentially in parallel in a first direction parallel to the substrate and the second plurality of features extend essentially perpendicularly from the substrate and extend essentially in parallel in a second direction parallel to the substrate; wherein the first direction and the second direction are different; the first plurality of features and the second plurality of features react differently to the polarized light.

    摘要翻译： 这里描述的是可操作以检测偏振光的装置，包括：基板; 第一子像素 与所述第一子像素相邻的第二子像素; 所述第一子像素中的第一多个特征和所述第二子像素中的第二多个特征，其中所述第一多个特征基本上垂直于所述基底延伸并且在平行于所述基底的第一方向上基本上平行延伸，并且所述第二多个 特征基本上垂直于基底延伸并且在平行于基底的第二方向基本上平行延伸; 其中所述第一方向和所述第二方向不同; 第一多个特征和第二多个特征对偏振光的反应不同。