Abstract:
Examples herein describe techniques for forming 3D stacked devices which include a redundant logical layer. The 3D stacked devices include a plurality of semiconductor chips stacked in a vertical direction such that each chip is bonded to a chip above, below, or both in the stack. In one embodiment, each chip is the same—e.g., has the same circuitry arranged in the same configuration in the chip. The 3D stacked device provides a redundant logic layer by dividing the chips into a plurality of slivers which are interconnected by inter-chip bridges. For example, the 3D stacked device may include three stacked chips that are divided into three different slivers where each sliver includes a portion from each of the chips. So long as only one of portions in a sliver is nonfunctional, the inter-chip bridges permit the other portions in the sliver to receive and route data.
Abstract:
An apparatus relating generally to an error detection system is disclosed. The apparatus includes a first data bus and a second data bus. A first circuit is coupled for communication via the first data bus. A plurality of storage elements are coupled to the first data bus and the second data bus. A second circuit is coupled for communication via the second data bus. The error detection system is coupled to the first data bus and the second data bus. The error detection system is coupled to compare first data on the first data bus with corresponding second data on the second data bus. The error detection system is configured to generate an error signal responsive to mismatch between the first data and the second data.
Abstract:
An embodiment of a memory module is disclosed. This memory module is a configurable hard macro. A portion of this memory module includes a data input multiplexer coupled to select between cascaded data and direct/bused data. Such portion further includes, a memory coupled to receive output from the data input multiplexer for storage therein, and a register input multiplexer coupled to select between read data from the memory and the cascaded data. This memory module further includes: a register coupled to receive output from the register input multiplexer, a latch/register mode multiplexer coupled to select between the read data from the memory and registered data from the register, and a data output multiplexer coupled to select between the cascaded data and output from the latch/register mode multiplexer to provide output data.
Abstract:
An embodiment of a memory module is disclosed. This memory module is a configurable hard macro. A portion of this memory module includes a data input multiplexer coupled to select between cascaded data and direct/bused data. Such portion further includes, a memory coupled to receive output from the data input multiplexer for storage therein, and a register input multiplexer coupled to select between read data from the memory and the cascaded data. This memory module further includes: a register coupled to receive output from the register input multiplexer, a latch/register mode multiplexer coupled to select between the read data from the memory and registered data from the register, and a data output multiplexer coupled to select between the cascaded data and output from the latch/register mode multiplexer to provide output data.
Abstract:
Some examples described herein relate to programmable devices that include a data processing engine (DPE) array that permits shifting of where an application is loaded onto DPEs of the DPE array. In an example, a programmable device includes a DPE array. The DPE array includes DPEs and address index offset logic. Each of the DPEs includes a processor core and a memory mapped switch. The processor core is programmable via one or more memory mapped packets routed through the respective memory mapped switch. The memory mapped switches in the DPE array are coupled together to form a memory mapped interconnect network. The address index offset logic is configurable to selectively modify which DPE in the DPE array is targeted by a respective memory mapped packet routed in the memory mapped interconnect network.
Abstract:
Examples herein describe techniques for forming 3D stacked devices which include a redundant logical layer. The 3D stacked devices include a plurality of semiconductor chips stacked in a vertical direction such that each chip is bonded to a chip above, below, or both in the stack. In one embodiment, each chip is the same—e.g., has the same circuitry arranged in the same configuration in the chip. The 3D stacked device provides a redundant logic layer by dividing the chips into a plurality of slivers which are interconnected by inter-chip bridges. For example, the 3D stacked device may include three stacked chips that are divided into three different slivers where each sliver includes a portion from each of the chips. So long as only one of portions in a sliver is nonfunctional, the inter-chip bridges permit the other portions in the sliver to receive and route data.
Abstract:
A programmable logic device includes an integrated circuit die having a programmable fabric region including N identical programmable logic partitions. In some embodiments, N−1 of the identical programmable logic partitions are user-programmable. In addition, and in some cases, one of the identical programmable logic partitions is a spare logic partition. In some embodiments, the integrated circuit die further includes a network-on-a-chip (NOC) including a vertical NOC (VNOC) and a horizontal NOC (HNOC). By way of example, the N identical programmable logic partitions are configured to communicate exclusively through the NOC. In some embodiments, a defective one of the N−1 identical programmable logic partitions is configured for swapping with the spare logic partition.
Abstract:
Methods and apparatus are described for providing and using programmable ICs suitable for meeting the unique desires of large hardware emulation systems. One example method of classifying a programmable IC having impaired circuitry generally includes determining a partitioning of programmable logic resources into two or more groups for classifying the programmable IC, testing the programmable IC to determine at least one location of the impaired circuitry in the programmable logic resources of the programmable IC, and classifying the programmable IC based on the at least one location of the impaired circuitry in relation to the partitioning of the programmable logic resources.
Abstract:
Methods and apparatus are described for creating a multi-die package from a wafer without dicing the wafer into individual dies and reassembling the dies on an interposer. One example method generally includes testing a plurality of IC dies disposed on a wafer; disposing one or more connectivity layers above the plurality of IC dies, the one or more connectivity layers comprising one or more electrical conductors configured to connect together two or more of the plurality of dies in each of one or more groups of the IC dies; dicing the wafer having the one or more connectivity layers disposed above the plurality of dies into sets, each set comprising one or more of the plurality of dies, wherein the dicing is based on the one or more groups having IC dies that passed the testing; and packaging at least a portion of the sets of dies.
Abstract:
In a method for buffering, a buffer buffers data responsive to read and write clock signals. A flag signal from the buffer is for a fill level thereof. The flag signal is toggled responsive to the data buffered being either above or below a set point for the fill level. A phase of the write clock signal is adjusted to a phase of the read clock signal responsive to the toggling of the flag signal. The write clock signal is used to control latency of the buffer. The adjusting of the phase of the write clock signal includes: generating an override signal responsive to the toggling of the flag signal; and inputting the read clock signal and the override signal to a phase adjuster to controllably adjust the phase of the write clock signal to the phase of the read clock signal during operation.