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公开(公告)号:US20220320018A1
公开(公告)日:2022-10-06
申请号:US17843746
申请日:2022-06-17
Inventor: Fong-yuan CHANG , Cheng-Hung YEH , Hsiang-Ho CHANG , Po-Hsiang HUANG , Chin-Her CHIEN , Sheng-Hsiung CHEN , Aftab Alam KHAN , Keh-Jeng CHANG , Chin-Chou LIU , Yi-Kan CHENG
IPC: H01L23/64 , H01L23/498 , H01L23/00 , H01L25/065 , G06F30/36
Abstract: An interposer includes one or more capacitors to store charge to provide signals to an integrated circuit electrically connected to the interposer. First connectors to each capacitor are interspersed with second connectors to the capacitors and are spaced apart from adjacent second connectors. The one or more capacitors and the resistances associated with the conductive paths between each capacitor and a connector or another capacitor can be modeled.
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公开(公告)号:US20220149020A1
公开(公告)日:2022-05-12
申请号:US17367867
申请日:2021-07-06
Inventor: Fong-yuan CHANG , Lee-Chung Lu , Jyh Chwen Frank Lee , Po-Hsiang Huang , Xinyu Bao , Sam Vaziri
IPC: H01L25/10 , H01L23/498 , H01L23/373 , H01L21/48
Abstract: A package structure includes a solder feature, a first redistribution layer structure on the solder feature, and a die mounted on and electrically coupled to the first redistribution layer structure. The first redistribution layer structure includes one or more dielectric layers filled with a heat conductive dielectric material.
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公开(公告)号:US20200043873A1
公开(公告)日:2020-02-06
申请号:US16439295
申请日:2019-06-12
Inventor: Fong-yuan CHANG , Cheng-Hung YEH , Hsiang-Ho CHANG , Po-Hsiang HUANG , Chin-Her CHIEN , Sheng-Hsiung CHEN , Aftab Alam KHAN , Keh-Jeng CHANG , Chin-Chou LIU , Yi-Kan CHENG
IPC: H01L23/64 , H01L23/498 , H01L23/00 , H01L25/065 , G06F17/50
Abstract: An interposer includes one or more capacitors to store charge to provide signals to an integrated circuit electrically connected to the interposer. First connectors to each capacitor are interspersed with second connectors to the capacitors and are spaced apart from adjacent second connectors. The one or more capacitors and the resistances associated with the conductive paths between each capacitor and a connector or another capacitor can be modeled.
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公开(公告)号:US20240386183A1
公开(公告)日:2024-11-21
申请号:US18785924
申请日:2024-07-26
Inventor: Fong-yuan CHANG , Chin-Chou Liu , Chin-Her Chien , Cheng-Hung Yeh , Po-Hsiang Huang , Sen-Bor Jan , Yi-Kan Cheng , Hsiu-Chuan Shu
IPC: G06F30/394 , G06F30/392 , G06F30/398
Abstract: The present disclosure describes structures and methods for a via structure for three-dimensional integrated circuit (IC) packaging. The via structure includes a middle portion that extends through a planar structure and a first end and a second end each connected to the middle portion and on a different side of the planar structure. One or more of the first end and the second end includes one or more of a plurality of vias and a pseudo metal layer.
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公开(公告)号:US20240354487A1
公开(公告)日:2024-10-24
申请号:US18762219
申请日:2024-07-02
Inventor: Fong-yuan CHANG , Chun-Chen CHEN , Sheng-Hsiung CHEN , Ting-Wei CHIANG , Chung-Te LIN , Jung-Chan YANG , Lee-Chung LU , Po-Hsiang HUANG
IPC: G06F30/398 , G06F30/392 , G06F30/394 , H01L27/02 , H01L27/118
CPC classification number: G06F30/398 , G06F30/392 , G06F30/394 , H01L27/0207 , H01L27/11807 , H01L2027/11875
Abstract: The present disclosure describes an example method for routing a standard cell with multiple pins. The method can include modifying a dimension of a pin of the standard cell, where the pin is spaced at an increased distance from a boundary of the standard cell than an original position of the pin. The method also includes routing an interconnect from the pin to a via placed on a pin track located between the pin and the boundary and inserting a keep out area between the interconnect and a pin from an adjacent standard cell. The method further includes verifying that the keep out area separates the interconnect from the pin from the adjacent standard cell by at least a predetermined distance.
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公开(公告)号:US20240413052A1
公开(公告)日:2024-12-12
申请号:US18790042
申请日:2024-07-31
Inventor: Po-Hsiang HUANG , Chin-Chou LIU , Chin-Her CHIEN , Fong-yuan CHANG , Hui Yu LEE
IPC: H01L23/42 , H01L23/31 , H01L23/367 , H01L25/00 , H01L25/065
Abstract: The present disclosure describes heat dissipating structures that can be formed either in functional or non-functional areas of three-dimensional system on integrated chip structures. In some embodiments, the heat dissipating structures maintain an average operating temperature of memory dies or chips below about 90° C. For example, a structure includes a stack with chip layers, where each chip layer includes one or more chips and an edge portion. The structure further includes a thermal interface material disposed on the edge portion of each chip layer, a thermal interface material layer disposed over a top chip layer of the stack, and a heat sink over the thermal interface material layer.
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公开(公告)号:US20220359392A1
公开(公告)日:2022-11-10
申请号:US17389141
申请日:2021-07-29
Inventor: Fei Fan DUAN , Fong-yuan CHANG , Chi-Yu LU , Po-Hsiang HUANG , Chih-Liang CHEN
IPC: H01L23/528 , H01L23/522 , G06F30/398
Abstract: A semiconductor device and a method of manufacturing the same are provided. The semiconductor device includes a first conductive pattern on a substrate, a second conductive pattern above the first conductive pattern, and a third conductive pattern above the first conductive pattern, all extending along a first direction. The first conductive pattern is electrically connected in parallel to the second conductive pattern and the third conductive pattern.
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公开(公告)号:US20240096800A1
公开(公告)日:2024-03-21
申请号:US18519513
申请日:2023-11-27
Inventor: Fei Fan DUAN , Fong-yuan CHANG , Chi-Yu LU , Po-Hsiang HUANG , Chih-Liang CHEN
IPC: H01L23/528 , G06F30/398 , H01L23/522
CPC classification number: H01L23/5283 , G06F30/398 , H01L23/5226 , G06F2119/12
Abstract: A semiconductor device includes first and second active regions extending in parallel in a substrate, a plurality of conductive patterns, each conductive pattern of the plurality of conductive patterns extending on the substrate across each of the first and second active regions, and a plurality of metal lines, each metal line of the plurality of metal lines overlying and extending across each of the first and second active regions. Each conductive pattern of the plurality of conductive patterns is electrically connected in parallel with each metal line of the plurality of metal lines.
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