Abstract:
A realignment ring-cell circuit is disclosed. The circuit includes a single-to-differential unit, an OR gate, an AND gate, a first P-type metal-oxide-semiconductor transistor, and a first N-type metal-oxide-semiconductor transistor. The single-to-differential unit has an input configured to receive a realignment signal, a first output for outputting a first differential output and a second output for outputting a second differential output. The first output for outputting is a first input to the OR gate. The second output for outputting is a first input to the AND gate. A gate of the P-type metal-oxide-semiconductor transistor is electrically connected to an output of the OR gate. A gate of the N-type metal-oxide-semiconductor transistor is electrically connected to an output of the AND gate. A drain of the P-type metal-oxide-semiconductor transistor and a drain of the N-type metal-oxide-semiconductor transistor are electrically connected to each other and are further electrically connected to a second input of the OR gate and a second input of the AND gate.
Abstract:
Phase-locked loops (PLLs) are provided. A PLL includes a voltage-controlled oscillator (VCO), a frequency divider, a track-and-hold charge pump, and a frequency tracking circuit. The VCO is configured to provide an output clock corresponding to a pumping current. The frequency divider is configured to divide the output clock to provide a feedback signal. The track-and-hold charge pump is configured to provide the pumping current according to a reference clock and the feedback signal. The frequency tracking circuit is configured to decrease frequency error between the feedback signal and the reference clock. The track-and-hold charge pump includes a pumping switch and a pulse width modulator (PWM). The PWM is configured to provide a PWM signal to control the pumping switch according to the reference clock, so as to provide the pumping current corresponding to the feedback signal.
Abstract:
Hybrid phase lock loop (PLL) devices are provided that combine advantages of the digital controlled loop and the analog controlled loop. For example, a hybrid PLL includes a digital controlled loop that receives a reference input signal and an output signal of the hybrid PLL, and generates a digital tuning word. The hybrid PLL further includes an analog controlled loop that receives the reference input signal and the output signal of the hybrid PLL, and generates an output voltage. The hybrid PLL also includes a hybrid oscillator. An oscillator controller of the digital controlled loop controls the hybrid oscillator using the digital tuning word and disables the analog controlled loop during a frequency tracking operation mode of the hybrid PLL. The oscillator controller enables the analog controlled loop to control the hybrid oscillator during the phase tracking operation mode of the hybrid PLL.
Abstract:
Hybrid phase lock loop (PLL) devices are provided that combine advantages of the digital controlled loop and the analog controlled loop. For example, a hybrid PLL includes a digital controlled loop that receives a reference input signal and an output signal of the hybrid PLL, and generates a digital tuning word. The hybrid PLL further includes an analog controlled loop that receives the reference input signal and the output signal of the hybrid PLL, and generates an output voltage. The hybrid PLL also includes a hybrid oscillator. An oscillator controller of the digital controlled loop controls the hybrid oscillator using the digital tuning word and disables the analog controlled loop during a frequency tracking operation mode of the hybrid PLL. The oscillator controller enables the analog controlled loop to control the hybrid oscillator during the phase tracking operation mode of the hybrid PLL.
Abstract:
A system and method is disclosed for adaptively adjusting a duty cycle of a signal between a first and second chip in a 3D architecture/stack for adaptively calibrating a chip in a 3D architecture/stack. In one embodiment, the system includes a first chip and a second chip located within the 3D chip stack, wherein the first chip generates a calibration signal, the second chip receives the calibration signal and compares it to a reference signal to generate a comparison signal that further compared to a reference duty signal to generate a reference duty comparison signal, that is then provided to the first chip to generate a drive signal that adjusts a duty cycle of the calibration signal.
Abstract:
A die stack comprises a first integrated circuit (IC) die having at least a first device comprising a first source, a first drain and a first gate electrode above a first channel region between the first source and the first drain. A second IC die has at least a second device comprising a second source, a second drain and a second gate electrode above a second channel region between the second source and the second drain. The second gate electrode is connected to the first gate electrode by a path including a first through substrate via (TSV), the second drain connected to the first source by a path including a second TSV.
Abstract:
An apparatus and method for providing a phase noise built-in self test (BIST) circuit are disclosed herein. In some embodiments, a method and apparatus for forming a multi-stage noise shaping (MASH) type high-order delta sigma (ΔΣ) time-to-digital converter (TDC) are disclosed. In some embodiments, an apparatus includes a plurality of first-order ΔΣ TDCs formed in an integrated circuit (IC) chip, wherein each of the first-order ΔΣ TDCs are connected to one another in a MASH type configuration to provide the MASH type high-order ΔΣ TDC, wherein the MASH type high-order ΔΣ TDC is configured to measure the phase noise of a device under text (DUT).
Abstract:
A method and apparatus of generating precision phase skews is disclosed. In some embodiments, a phase skew generator includes: a charge pump having a first mode of operation and a second mode of operation, wherein the first mode of operation provides a first current path during a first time period, and the second mode of operation provides a second current path during a second time period following the first time period; a sample and hold circuit, coupled to a capacitor, and configured to sample a voltage level of the capacitor at predetermined times and provide an output voltage during a third time period following the second time period; and a voltage controlled delay line, coupled to the sample and hold circuit, and having M delay line stages each configured to output a signal having a phase skew offset with respect to preceding or succeeding signal.
Abstract:
A controlling circuit for ring oscillator is provided. First and second transistors of a first conductive type are coupled in series and between a node and a first power source. Third and fourth transistors of a second conductive type are coupled in parallel and between the node and a second power source. The node is coupled to a delay chain of the ring oscillator. The second and third transistors form a pseudo pass-gate inverter. An input of the pseudo pass-gate inverter is configured to receive an output signal of the delay chain. The first and fourth transistors are controlled by a realignment signal. When the realignment signal is in a realignment state, the first transistor is turned off and the fourth transistor is turned on, and when the realignment signal is in a normal state, the first transistor is turned on and the fourth transistor is turned off.
Abstract:
A method and apparatus of generating precision phase skews is disclosed. In some embodiments, a phase skew generator includes: a charge pump having a first mode of operation and a second mode of operation, wherein the first mode of operation provides a first current path during a first time period, and the second mode of operation provides a second current path during a second time period following the first time period; a sample and hold circuit, coupled to a capacitor, and configured to sample a voltage level of the capacitor at predetermined times and provide an output voltage during a third time period following the second time period; and a voltage controlled delay line, coupled to the sample and hold circuit, and having M delay line stages each configured to output a signal having a phase skew offset with respect to preceding or succeeding signal.