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公开(公告)号:US20190156896A1
公开(公告)日:2019-05-23
申请号:US16043964
申请日:2018-07-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ji-Yoon Park , Wan-Dong Kim , Seung-Bum Kim , Deok-Woo Lee , You-Se Kim , Se-Hwan Park , Jin-Woo Park
CPC classification number: G11C16/16 , G11C11/5635 , G11C16/0483 , G11C16/32 , G11C16/3445 , G11C29/52
Abstract: A method of erasing a memory device, the method of erasing the memory device including: performing, in a first erase period, a first erase operation on memory cells respectively connected to a plurality of word lines, wherein at least one of the memory cells, which is included in a memory block, is not erase-passed; determining, after the first erase period, an erase operation speed by applying a verify voltage to at least one of the plurality of word lines, and determining an effective erasing time for each word line based on the determined erase operation speed; and performing, in a second erase period, a second erase operation on the memory cells respectively connected to the plurality of word lines based on the determined effective erasing times.
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公开(公告)号:US12125544B2
公开(公告)日:2024-10-22
申请号:US17871358
申请日:2022-07-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: You-Se Kim , Sang-Wan Nam , Kee Ho Jung
CPC classification number: G11C16/32 , G11C16/0483 , G11C16/14 , G11C16/24
Abstract: A nonvolatile memory device includes: a memory cell array including three or more planes; a first clock generator generating a first clock signal having a first period; a second clock generator generating a second clock signal having a second period that varies with the temperature; a plurality of clock switching controllers outputting one of the first and second clock signals as a reference clock signal; a control logic including a plurality of bitline shutoff generators, which output a plurality of bitline shutoff signals based on the reference clock signal; and a plurality of page buffers connecting bitlines of the planes and data latch nodes in accordance with the bitline shutoff signals.
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