Folded camera for reducing stray light and electronic device including the same

    公开(公告)号:US12177552B2

    公开(公告)日:2024-12-24

    申请号:US18204174

    申请日:2023-05-31

    Inventor: Yongjae Lee

    Abstract: Provided is a lens assembly comprising at least two lenses aligned along a first optical axis; an image sensor configured to receive light guided or condensed through the at least two lenses; and at least one optical member disposed between the at least two lenses and the image sensor to receive light incident through the at least two lenses, and refract or reflect the light at least twice, to guide or emit the light to the image sensor, where a ratio of a longer side of an imaging surface of the image sensor to a longer side of an emission surface of a first optical member closest to the image sensor is within a specified range.

    SEMICONDUCTOR MEMORY DEVICE
    7.
    发明公开

    公开(公告)号:US20230165016A1

    公开(公告)日:2023-05-25

    申请号:US17934317

    申请日:2022-09-22

    CPC classification number: H01L27/228 H01L43/04 H01L43/06

    Abstract: A semiconductor memory device is disclosed. The semiconductor memory device may include a magnetic tunnel junction pattern, a spin-orbit torque (SOT) pattern in contact with a first portion of the magnetic tunnel junction pattern, a first transistor electrically connected to a second portion of the magnetic tunnel junction pattern and configured to be controlled by a first word line, and a second transistor electrically connected to a first end of the spin-orbit torque pattern and configured to be controlled by a second word line. An effective channel width of the first transistor may be different from an effective channel width of the second transistor.

    SEMICONDUCTOR DEVICE
    8.
    发明申请

    公开(公告)号:US20250072005A1

    公开(公告)日:2025-02-27

    申请号:US18629542

    申请日:2024-04-08

    Abstract: Provided is a semiconductor device including a logic region including a circuit, a first memory region controlled by the logic region and having a first storage capacity, the first memory region including a plurality of first memory cells, and a second memory region controlled by the logic region and having a second storage capacity greater than the first storage capacity, the second memory region including a plurality of second memory cells, wherein each of the plurality of first memory cells and each of the plurality of second memory cells includes a magnetic memory element, and wherein an operating speed of the first memory region is faster than an operating speed of the second memory region.

    STORAGE CONTROLLER AND METHOD OF PROVIDING FIRMWARE IMAGE

    公开(公告)号:US20240152284A1

    公开(公告)日:2024-05-09

    申请号:US18232618

    申请日:2023-08-10

    CPC classification number: G06F3/0622 G06F3/0655 G06F3/0679 H04L9/30

    Abstract: A storage controller configured to control a nonvolatile memory includes a one-time programmable (OTP) memory configured to store a first public key, and a processor configured to, based on a first signature added to a firmware image including a host authentication public key being verified using the first public key, receive a storage command including at least one second public key and a first host authentication signature for the at least one second public key and store the at least one second public key in the OTP memory based on the first host authentication signature being verified using the host authentication public key.

    Semiconductor memory device and test system including the same

    公开(公告)号:US11520528B2

    公开(公告)日:2022-12-06

    申请号:US17375168

    申请日:2021-07-14

    Abstract: A semiconductor memory device includes a test pattern data storage configured to store test write pattern data in response to a register write command and a register address and output test read pattern data in response to a test read command and a test pattern data selection signal during a test operation, a memory cell array including a plurality of memory cells and configured to generate read data, a read path unit configured to generate n read data, by serializing the read data, and a test read data generation unit configured to generate n test read data, by comparing the test read pattern data with each of the n read data, generated at a first data rate, and generate the n test read data, at a second data rate lower than the first data rate, during the test operation.

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