公开(公告)号：US20250104749A1

公开(公告)日：2025-03-27

申请号：US18604593

申请日：2024-03-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dongho Shin ,  Kangyoon Lee ,  Seonkyoo Lee ,  Junha Lee

IPC: G11C7/22

Abstract: A method of calibrating impedance of a memory device including a data transmitter includes: outputting a comparison signal by comparing a power supply voltage and a reference voltage, the power supply voltage being supplied to the data transmitter when the data transmitter is driven; storing a voltage level of the reference voltage when the comparison signal changes logical state; adjusting the reference voltage based on the comparison signal such that the voltage level of the reference voltage increases or decreases; and calibrating an output impedance of the memory device based on a digital code corresponding to an average reference voltage level, the average reference voltage level being obtained by averaging a prescribed number of voltage levels of the reference voltage stored as a result of repeatedly outputting the comparison signal, storing the voltage level of the reference voltage, and adjusting the reference voltage.

公开(公告)号：US11915781B2

公开(公告)日：2024-02-27

申请号：US17938214

申请日：2022-10-05

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dongho Shin ,  Jungjune Park ,  Kyoungtae Kang ,  Chiweon Yoon ,  Junha Lee ,  Byunghoon Jeong

IPC: G11C7/10 ,  H03K19/00

CPC classification number: G11C7/1051 ,  H03K19/0005 ,  G11C2207/2254

Abstract: An apparatus and method for ZQ calibration, including determining a strong driver circuit and a weak driver circuit, which are related to an input/output (I/O) circuit connected to a signal pin, at power-up of the I/O circuit; providing a ZQ calibration code related to a sweep code to one from among the strong driver circuit and the weak driver circuit according to ZQ calibration conditions; and providing a ZQ calibration code related to a fixed code to an unselected circuit, thereby adjusting a termination resistance of the signal pin.

公开(公告)号：US20220013397A1

公开(公告)日：2022-01-13

申请号：US17165594

申请日：2021-02-02

Applicant: Samsung Electronics Co., Ltd.

Inventor： Daehyun LEE ,  YOUNGIL KANG ,  YOUNGEUN KIM ,  Jaesuk KIM ,  MINJI PARK ,  SANGWOOK PARK ,  Dongho Shin ,  DONGYUN YEO ,  CHUNGHUN LEE ,  KYOUNG-MI CHOI

IPC: H01L21/683 ,  H01J37/32

Abstract: Disclosed is a plasma processing apparatus comprising a plasma electrode, an electrostatic chuck, and a diode board. The electrostatic chuck includes a microheater layer and a chuck electrode. The microheater layer includes an inner heater part and an outer heater part. The inner heater part includes a first inner heater in a first inner region that circumferentially surrounds a center of the microheater layer, and a second inner heater in a second inner region that circumferentially surrounds the first inner region. The outer heater part includes a first outer heater in a first outer region that circumferentially surrounds the second inner region, and a second outer heater in a second outer region that circumferentially surrounds the first outer region. A distance between centers of the first and second outer heaters is less than that between centers of the first and second inner heaters.

公开(公告)号：US11115021B2

公开(公告)日：2021-09-07

申请号：US17021728

申请日：2020-09-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Tongsung Kim ,  Youngmin Jo ,  Jungjune Park ,  Jindo Byun ,  Dongho Shin ,  Jeongdon Ihm

IPC: H03K19/00 ,  H03K19/0185 ,  G11C7/10 ,  G11C8/10 ,  H03K19/08

Abstract: An impedance calibration circuit includes a first code generation circuit connected to a first reference resistor, and configured to generate a first code for forming a resistance based on the first reference resistor, by using the first reference resistor; a second code generation circuit configured to form a resistance of a second reference resistor less than the resistance of the first reference resistor, based on the first code, and generate a second code by using the second reference resistor; and a target impedance code generation circuit configured to generate a target impedance code based on the first code, the second code, and a target impedance value, and form an impedance having the target impedance value in a termination driver connected to the impedance calibration circuit, based on the target impedance code.

公开(公告)号：US10998888B2

公开(公告)日：2021-05-04

申请号：US16861903

申请日：2020-04-29

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dongho Shin ,  Kyungtae Kang ,  Junha Lee ,  Tongsung Kim ,  Jangwoo Lee ,  Jeongdon Ihm ,  Byunghoon Jeong

IPC: H03K3/017 ,  H03K19/21 ,  H03K5/24

Abstract: A parameter monitoring circuit includes a code generation circuit configured to generate a first code, to which a first offset is applied, and a second code, to which a second offset is applied; a parameter adjustment circuit configured to generate a first parameter and a second parameter by respectively applying the first code and the second code to a current parameter; a comparator circuit configured to generate a first comparison result and a second comparison result, the first comparison result indicating a comparison result between the first parameter and a reference parameter value, and the second comparison result indicating a comparison result between the second parameter and the reference parameter value; and a parameter error detection circuit configured to detect an error in the current parameter, based on the first comparison result and the second comparison result.

公开(公告)号：US11695340B2

公开(公告)日：2023-07-04

申请号：US17332436

申请日：2021-05-27

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kwang Chan Lee ,  Dongho Shin ,  Chang Seok Chae

IPC: H02M3/158

CPC classification number: H02M3/1582

Abstract: Disclosed is an electronic device, which includes a direct voltage to direct voltage converter, and a controller that receives first current information, second current information, an input voltage, and a feedback voltage from the direct voltage to direct voltage converter, controls the direct voltage to direct voltage converter based on the input voltage in one of a first mode, a second mode, or a third mode, controls the direct voltage to direct voltage converter based on the first current information and an output voltage such that buck conversion is performed in the first mode and the second mode, and controls the direct voltage to direct voltage converter based on the second current information and the output voltage such that boost conversion is performed in the second mode and the third mode.

公开(公告)号：US11502687B2

公开(公告)日：2022-11-15

申请号：US17389148

申请日：2021-07-29

Applicant: Samsung Electronics Co., Ltd.

Inventor： Tongsung Kim ,  Youngmin Jo ,  Jungjune Park ,  Jindo Byun ,  Dongho Shin ,  Jeongdon Ihm

IPC: H03K19/00 ,  H03K19/0185 ,  G11C7/10 ,  G11C8/10 ,  H03K19/08

Abstract: An impedance calibration circuit includes a first code generation circuit connected to a first reference resistor, and configured to generate a first code for forming a resistance based on the first reference resistor, by using the first reference resistor; a second code generation circuit configured to form a resistance of a second reference resistor less than the resistance of the first reference resistor, based on the first code, and generate a second code by using the second reference resistor; and a target impedance code generation circuit configured to generate a target impedance code based on the first code, the second code, and a target impedance value, and form an impedance having the target impedance value in a termination driver connected to the impedance calibration circuit, based on the target impedance code.

公开(公告)号：US11336266B2

公开(公告)日：2022-05-17

申请号：US17222033

申请日：2021-04-05

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dongho Shin ,  Kyungtae Kang ,  Junha Lee ,  Tongsung Kim ,  Jangwoo Lee ,  Jeongdon Ihm ,  Byunghoon Jeong

IPC: H03K3/017 ,  H03K19/21 ,  H03K5/24

Abstract: A method of operating a system including a parameter monitoring circuit and a host, includes generating a first parameter applying a first code to a current parameter, wherein a first offset is applied to the first code; generating a first comparison result by comparing the first parameter with a reference parameter value; generating a second parameter applying a second code to the current parameter, wherein a second offset is applied to the second code; generating a second comparison result by comparing the second parameter with the reference parameter value; detecting an error in the current parameter, based on the first comparison result and the second comparison result; and providing a signal based on the error to the host.