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公开(公告)号:US12087368B2
公开(公告)日:2024-09-10
申请号:US17548096
申请日:2021-12-10
发明人: Arpit Vijayvergia , Vikas Rana
CPC分类号: G11C16/28 , G11C16/0458 , G11C16/24
摘要: An integrated circuit includes a memory array and a memory read circuitry for reading data from the memory array. The memory read circuitry includes a leakage current compensation circuit. The leakage current compensation circuit senses the leakage current in a bitline of the memory array during a read operation and generates a leakage compensation current to offset the leakage current during the read operation.
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公开(公告)号:US11881280B2
公开(公告)日:2024-01-23
申请号:US17534136
申请日:2021-11-23
发明人: Shivam Kalla , Vikas Rana
IPC分类号: G05F3/02 , G05F1/10 , G11C5/14 , G11C11/56 , H02M1/00 , H03K5/24 , G05F3/26 , H02M3/07 , G11C16/30
CPC分类号: G11C5/145 , G05F3/262 , G11C5/147 , G11C11/5635 , G11C16/30 , H02M1/0003 , H02M3/07 , H03K5/24
摘要: An integrated circuit includes a non-volatile memory, a charge pump that generates high voltages for programming operations of the non-volatile memory array, and a charge pump regulator that controls a slew rate of the charge pump. The charge pump regulator generates a sense current indicative of the slew rate and adjusts a frequency of a clock signal provided to the charge pump based on the sense current.
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公开(公告)号:US20220319598A1
公开(公告)日:2022-10-06
申请号:US17697846
申请日:2022-03-17
发明人: Roberto Bregoli , Vikas Rana
IPC分类号: G11C16/04 , H01L27/11524 , H01L27/1156 , G11C16/10 , G11C16/14 , G11C16/26
摘要: In an embodiment a non-volatile memory cell includes a substrate, a first body in the substrate, a second body in the substrate, a first storage transistor having a first conduction region and a second conduction region in the first body, the first and second conduction regions delimiting a first channel region in the first body, a first control gate region in the second body, an insulating region overlying the substrate, a single floating gate region extending on the substrate and embedded in the insulating region, the single floating gate region having a first portion on the first body and a second portion on the second body, the first portion and second portion being connected and electrically coupled, a first selection via extending through the insulating region and electrically coupling the first conduction region with a first conduction node, a second selection via extending through the insulating region and electrically coupling the second conduction region with a second conduction node and a first control via extending though the insulating region and electrically coupling the first control gate region with a first control node.
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公开(公告)号:US11205462B2
公开(公告)日:2021-12-21
申请号:US17010704
申请日:2020-09-02
发明人: Vivek Tyagi , Vikas Rana , Chantal Auricchio , Laura Capecchi
IPC分类号: G11C7/10 , G11C7/12 , G11C7/06 , G11C11/4094 , G11C11/4091 , G11C7/22
摘要: A read signal generator generates read signals to control read operations of a memory array. The read signal generator can be selectively controlled to generate an oscillating signal having a period that corresponds to a feature one of the read signals. The oscillating signal is passed to a frequency divider that divides the oscillating signal and provides the divided oscillating signal to an output pad. The frequency of the oscillating signal can be measured at the output pad. The frequency of the oscillating signal, and the duration of the read signal feature can be calculated from the frequency of the oscillating signal. The read signal feature can then be adjusted if needed.
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公开(公告)号:US11183924B2
公开(公告)日:2021-11-23
申请号:US17021013
申请日:2020-09-15
发明人: Vikas Rana
IPC分类号: H02M3/07 , H03K19/096 , G05F1/10
摘要: A voltage doubler circuit supports operation in both a positive voltage boosting mode to positively boost voltage from a first node to a second node and a negative voltage boosting mode to negatively boost voltage from the second node to the first node. The voltage doubler circuit is formed by transistors of a same conductivity type that share a common bulk that is not tied to a source of any of the voltage doubler circuit transistors. A bias generator circuit is coupled to receive a first voltage from the first node and second voltage from the second node. The bias generator circuit operates to apply a lower one of the first and second voltages to the common bulk.
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公开(公告)号:US20180330787A1
公开(公告)日:2018-11-15
申请号:US16044280
申请日:2018-07-24
发明人: Marco Pasotti , Marcella Carissimi , Vikas Rana
IPC分类号: G11C13/00
CPC分类号: G11C13/0069 , G11C13/0004 , G11C13/0026 , G11C2013/0078
摘要: A method is provided for operating a memory device that includes an array of memory cells coupled to a plurality of bitlines. A memory cell is selected from among the array of memory cells. The selected memory cell is coupled to a selected bitline. During a program operation, a program current pulse is injected into the selected memory cell via a first switch coupled to the bitline. At an end of the program current pulse, the selected bitline is discharged via a second switch coupled to the bitline.
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公开(公告)号:US10050524B1
公开(公告)日:2018-08-14
申请号:US15800896
申请日:2017-11-01
发明人: Vikas Rana
IPC分类号: H02M3/18 , H02M3/07 , H01L27/092 , H01L27/06 , H01L27/02
摘要: A voltage multiplier circuit operates in response to a received clock signal to perform a voltage multiplication operation on an input voltage to generate an output voltage. The voltage multiplier circuit includes a pair of intermediate nodes that are capacitively coupled to receive, respectively, opposite phases of a clock signal. A first CMOS driver circuit is coupled to one of the intermediate nodes and has an output configured to generate one phase of a level shifted output clock signal. A second CMOS driver circuit is coupled to another one of the intermediate nodes and has an output configured to generate another phase of the level shifted output clock signal.
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公开(公告)号:US20170178727A1
公开(公告)日:2017-06-22
申请号:US15433795
申请日:2017-02-15
发明人: Marco Pasotti , Marcella Carissimi , Vikas Rana
IPC分类号: G11C13/00
CPC分类号: G11C13/0069 , G11C13/0004 , G11C13/0026 , G11C2013/0078
摘要: An integrated circuit includes an array of phase-change memory (PCM) cells, and bitlines coupled to the array of PCM cells. The integrated circuit also includes a first decoder circuit having a respective plurality of transistors having a first conductivity type being coupled together and to a given bitline from among the plurality thereof and configured to inject a program current pulse into a selected PCM cell. In addition, the integrated circuit includes a second decoder circuit having a plurality of transistors having a second conductivity type being coupled together and to the given bitline and configured to discharge the given bitline at an end of the program current pulse.
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公开(公告)号:US09129685B2
公开(公告)日:2015-09-08
申请号:US14266468
申请日:2014-04-30
发明人: Vikas Rana
IPC分类号: G11C11/4193 , G11C11/4195 , G11C16/14 , G11C8/08 , G11C16/06 , G11C16/26
摘要: A word-line driver includes first, second and third transistors. The first transistor includes a gate terminal driven by a first group selection signal, a first conduction terminal driven by a second sub-group selection signal and a second conduction terminal coupled to the word-line. The second transistor includes a gate terminal driven by a second group selection signal, a second conduction terminal driven by the second sub-group selection signal, and a first conduction terminal coupled to the word-line. The third transistor includes a gate terminal driven by a third the group selection signal, a first conduction terminal driven by a first sub-group selection signal, and a second conduction terminal coupled to the word-line.
摘要翻译: 字线驱动器包括第一,第二和第三晶体管。 第一晶体管包括由第一组选择信号驱动的栅极端子,由第二子组选择信号驱动的第一导通端子和耦合到字线的第二导通端子。 第二晶体管包括由第二组选择信号驱动的栅极端子,由第二子组选择信号驱动的第二导通端子和耦合到字线的第一导电端子。 第三晶体管包括由组选择信号的第三组驱动的栅极端子,由第一子组选择信号驱动的第一导通端子和耦合到字线的第二导通端子。
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公开(公告)号:US12033715B2
公开(公告)日:2024-07-09
申请号:US18063041
申请日:2022-12-07
发明人: Vikas Rana , Arpit Vijayvergia
摘要: The present disclosure is directed to arranging user data memory cells and test memory cells in a configurable memory array that can perform both differential and single ended read operations during memory start-up and normal memory use, respectively. Different arrangements of the user data memory cells and the test memory cells in the memory array result in increased effectiveness of memory array, in terms of area optimization, memory read accuracy and encryption for data security.
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