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1.SEMICONDUCTOR DEVICES WITH THROUGH VIA ELECTRODES, METHODS OF FABRICARING THE SAME, MEMORY CARDS INCLUDING THE SAME, AND ELECTRONIC SYSTEMS INCLUDING THE SAME 有权
Title translation: 通过电极穿过的半导体器件,其制造方法,包括其的存储卡和包括其的电子系统公开(公告)号:US20150048519A1
公开(公告)日:2015-02-19
申请号:US14180327
申请日:2014-02-13
Applicant: SK HYNIX INC.
Inventor: Jin Woo PARK , Sang Gyu LEE
IPC: H01L23/522 , H01L23/00 , H01L21/768
CPC classification number: H01L24/97 , H01L21/7684 , H01L21/76897 , H01L21/76898 , H01L21/784 , H01L23/3107 , H01L23/3171 , H01L23/481 , H01L24/05 , H01L24/13 , H01L24/14 , H01L24/16 , H01L24/32 , H01L24/73 , H01L24/81 , H01L24/92 , H01L24/94 , H01L25/0657 , H01L25/18 , H01L2224/0401 , H01L2224/05009 , H01L2224/05605 , H01L2224/05609 , H01L2224/05611 , H01L2224/05613 , H01L2224/05616 , H01L2224/05618 , H01L2224/05624 , H01L2224/05639 , H01L2224/05644 , H01L2224/05647 , H01L2224/13022 , H01L2224/13023 , H01L2224/13025 , H01L2224/13082 , H01L2224/13083 , H01L2224/131 , H01L2224/13144 , H01L2224/13147 , H01L2224/13155 , H01L2224/14181 , H01L2224/16146 , H01L2224/16148 , H01L2224/16235 , H01L2224/16238 , H01L2224/32145 , H01L2224/32225 , H01L2224/73204 , H01L2224/81193 , H01L2224/92225 , H01L2224/94 , H01L2225/06513 , H01L2225/06517 , H01L2225/06544 , H01L2225/06548 , H01L2225/06565 , H01L2225/06568 , H01L2924/1431 , H01L2924/1436 , H01L2924/1437 , H01L2924/1438 , H01L2924/1441 , H01L2924/15311 , H01L2924/157 , H01L2924/181 , H01L2924/18161 , H01L2924/014 , H01L2224/11 , H01L2224/03 , H01L2924/00
Abstract: A semiconductor device includes a via electrode penetrating a substrate and a back-side molding layer covering a back-side surface of the substrate. The back-side molding layer contacts a sidewall of a back-side end portion of the via electrode, which is a portion of the via electrode that protrudes from the back-side surface of the substrate.
Abstract translation: 半导体器件包括穿透基板的通路电极和覆盖基板的背面的背面成型层。 背面成型层与作为从基板的背面突出的通孔电极的一部分的通路电极的背面侧端部的侧壁接触。