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公开(公告)号:US20240404936A1
公开(公告)日:2024-12-05
申请号:US18417921
申请日:2024-01-19
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Gyujin Choi , Dahee Kim , Jae-Ean Lee , Taehoon Lee
IPC: H01L23/498 , H01L23/00 , H01L23/48 , H01L23/528 , H01L25/065
Abstract: A stacked structure includes a lower substrate and a first semiconductor chip stacked on an upper surface of the lower substrate, the lower substrate includes a lower conductor pattern disposed on the upper surface of the lower substrate, the first semiconductor chip may have first and second surfaces facing each other, the second surface of the first semiconductor chip may face the upper surface of the lower substrate, and the first semiconductor chip may include a first conductor pattern disposed on the second surface. The first conductor pattern may be aligned with the lower conductor pattern in a first direction perpendicular to the upper surface of the lower substrate, and the first conductor pattern may be spaced apart from the lower conductor pattern in the first direction.
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公开(公告)号:US20220384324A1
公开(公告)日:2022-12-01
申请号:US17568465
申请日:2022-01-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Gyujin Choi , Jae-Ean Lee , Changeun Joo
IPC: H01L23/498 , H01L23/00 , H01L25/10 , H01L23/31
Abstract: Disclosed is a semiconductor package device comprising a semiconductor chip including first and second chip pads on an active surface of the semiconductor chip, and a redistribution substrate on the first and second chip pads. The redistribution substrate includes first and second redistribution patterns sequentially stacked on the active surface. The first redistribution pattern includes a first via part and a first via pad part vertically overlapping the first via part. The second redistribution pattern includes a second via part and a second via pad part vertically overlapping the second via part. The first via part contacts the first chip pad. The second via part contacts the second chip pad. A length of the second via part is greater than that of the first via part.
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公开(公告)号:US11264339B2
公开(公告)日:2022-03-01
申请号:US16703239
申请日:2019-12-04
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Gyujin Choi , Sunghoan Kim , Changeun Joo , Chilwoo Kwon , Youngkyu Lim , Sunguk Lee
Abstract: The method of manufacturing a connection structure of a semiconductor chip includes: preparing a semiconductor chip having a first surface having a connection pad disposed thereon and a second surface opposing the first surface and including a passivation layer disposed on the first surface and covering the connection pad; forming an insulating layer on the first surface of the semiconductor chip, the insulating layer covering at least a portion of the passivation layer; forming a via hole penetrating through the insulating layer to expose at least a portion of the passivation layer; exposing at least a portion of the connection pad by removing the passivation layer exposed by the via hole; forming a redistribution via by filling the via hole with a conductive material; and forming a redistribution layer on the redistribution via and the insulating layer.
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公开(公告)号:US11978696B2
公开(公告)日:2024-05-07
申请号:US17568465
申请日:2022-01-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Gyujin Choi , Jae-Ean Lee , Changeun Joo
IPC: H01L23/498 , H01L23/00 , H01L23/31 , H01L25/10
CPC classification number: H01L23/49822 , H01L23/3128 , H01L23/49811 , H01L23/49816 , H01L24/06 , H01L24/08 , H01L25/105 , H01L2224/0603 , H01L2224/08235
Abstract: Disclosed is a semiconductor package device comprising a semiconductor chip including first and second chip pads on an active surface of the semiconductor chip, and a redistribution substrate on the first and second chip pads. The redistribution substrate includes first and second redistribution patterns sequentially stacked on the active surface. The first redistribution pattern includes a first via part and a first via pad part vertically overlapping the first via part. The second redistribution pattern includes a second via part and a second via pad part vertically overlapping the second via part. The first via part contacts the first chip pad. The second via part contacts the second chip pad. A length of the second via part is greater than that of the first via part.
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公开(公告)号:US11587898B2
公开(公告)日:2023-02-21
申请号:US16947093
申请日:2020-07-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Changeun Joo , Gyujin Choi
IPC: H01L23/538 , H01L23/31 , H01L23/00
Abstract: A semiconductor package includes a lower redistribution layer including an insulating pattern having an opening and a via in the opening; a first semiconductor chip including a chip pad, a passivation layer, and a pad bump connected to the chip pad; and a first encapsulant on the lower redistribution layer and the first semiconductor chip. The opening defines a lower surface and a side surface of the pad bump, and the via is in physical contact with the lower surface and the side surface of the pad bump.
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公开(公告)号:US11990439B2
公开(公告)日:2024-05-21
申请号:US17343992
申请日:2021-06-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jaeean Lee , Changeun Joo , Gyujin Choi
IPC: H01L21/768 , H01L23/00 , H01L23/31 , H01L23/367 , H01L23/495 , H01L23/522 , H01L23/528 , H01L23/532 , H01L25/065
CPC classification number: H01L24/14 , H01L23/5226 , H01L23/528 , H01L23/53204 , H01L2224/0401
Abstract: A semiconductor package including a semiconductor chip; a lower redistribution layer on a lower surface of the semiconductor chip; a lower passivation layer on a lower surface of the lower redistribution layer; a UBM pad on the lower passivation layer and including an upper pad and a lower pad connected to the upper pad, the upper pad having a greater horizontal length at an upper surface thereof than a horizontal length at a lower surface thereof; a seed layer between the lower passivation layer and the UBM pad; and an external connecting terminal on a lower surface of the UBM pad, wherein the seed layer includes a first seed part covering a side surface of the upper pad, a second seed part covering a portion of the lower surface of the upper pad, and a third seed part covering a portion of a side surface of the lower pad.
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公开(公告)号:US11961812B2
公开(公告)日:2024-04-16
申请号:US18170857
申请日:2023-02-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Changeun Joo , Gyujin Choi
IPC: H01L23/538 , H01L23/00 , H01L23/31
CPC classification number: H01L24/17 , H01L23/3135 , H01L23/5384 , H01L24/13 , H01L2224/13008 , H01L2224/13009 , H01L2224/13023
Abstract: A semiconductor package includes a lower redistribution layer including an insulating pattern having an opening and a via in the opening; a first semiconductor chip including a chip pad, a passivation layer, and a pad bump connected to the chip pad; and a first encapsulant on the lower redistribution layer and the first semiconductor chip. The opening defines a lower surface and a side surface of the pad bump, and the via is in physical contact with the lower surface and the side surface of the pad bump.
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公开(公告)号:US11810864B2
公开(公告)日:2023-11-07
申请号:US17849938
申请日:2022-06-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Changeun Joo , Gyujin Choi
IPC: H01L23/538 , H01L23/498 , H01L21/56
CPC classification number: H01L23/5386 , H01L23/49816 , H01L23/5383 , H01L21/565
Abstract: A semiconductor package includes a core substrate having a through hole, a first molding member at least partially filling the through hole and covering an upper surface of the core substrate, the first molding member having a cavity within the through hole, a first semiconductor chip on the first molding member on the upper surface of the core substrate, a second semiconductor chip arranged within the cavity, a second molding member on the first molding member and covering the first semiconductor chip, a third molding member filling the cavity and covering the lower surface of the core substrate; first redistribution wirings on the second molding member and electrically connecting first chip pads of the first semiconductor chip and core connection wirings of the core substrate; and second redistribution wirings on the third molding member and electrically connecting second chip pads of the second semiconductor chip and the core connection wirings.
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公开(公告)号:US20240387486A1
公开(公告)日:2024-11-21
申请号:US18584905
申请日:2024-02-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Dahee Kim , Hongwon Kim , Jae-Ean Lee , Taehoon Lee , Gyujin Choi
IPC: H01L25/16 , H01L23/00 , H01L23/31 , H01L23/48 , H01L23/498
Abstract: An example semiconductor package includes a substrate, a first semiconductor chip mounted on the substrate, a mold layer on the substrate to cover the first semiconductor chip, and outer terminals positioned below the substrate. The substrate includes a first interconnection layer, a second interconnection layer on the first interconnection layer, a passive device mounted on a bottom surface of the second interconnection layer, and a connection member at a side of the passive device and between the first interconnection layer and the second interconnection layer to connect the first interconnection layer to the second interconnection layer. The outer terminals are coupled to a bottom surface of the first interconnection layer, the passive device includes a first pad on a top surface of the passive device, and an interconnection pattern of the second interconnection layer contacts the first pad.
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公开(公告)号:US20240347487A1
公开(公告)日:2024-10-17
申请号:US18368640
申请日:2023-09-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jaeean Lee , Dahee Kim , Taehoon Lee , Gyujin Choi
IPC: H01L23/00 , H01L23/31 , H01L23/498
CPC classification number: H01L24/05 , H01L23/3128 , H01L23/49822 , H01L23/49833 , H01L24/06 , H01L24/08 , H01L23/49838 , H01L24/03 , H01L24/16 , H01L24/32 , H01L24/48 , H01L24/73 , H01L2224/03462 , H01L2224/05548 , H01L2224/05644 , H01L2224/05647 , H01L2224/05655 , H01L2224/0601 , H01L2224/08225 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/48225 , H01L2224/73265 , H01L2924/1815
Abstract: An upper redistribution wiring layer of a semiconductor package includes a protective layer provided on at least one upper insulating layer and having an opening that exposes at least a portion of an uppermost redistribution wiring among second redistribution wirings, and a bonding pad provided on the uppermost redistribution wiring through the opening. The bonding pad includes a first plating pattern formed on the uppermost redistribution wiring, the first plating pattern including a via pattern provided in the opening and a pad pattern formed on the via pattern to be exposed from the opening, a second plating pattern on the second plating pattern, and a third plating pattern on the second plating pattern.
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