Analog-to-Digital Converter Non-Linearity Model Estimation Using Single-Bit Digital-to-Analog Converter

    公开(公告)号:US20250096810A1

    公开(公告)日:2025-03-20

    申请号:US18470309

    申请日:2023-09-19

    Abstract: A training signal generator for forming an input signal for an ADC-under-test includes a one-bit DAC and an analog low-pass filter. The one-bit DAC converts a binary sequence into a DAC output signal that is then filtered by the analog low-pass filter to form an ADC input signal. The ADC-under-test converts the ADC input signal into an ADC output signal. A digital low-pass filter converts the binary sequence into a plurality of samples. A digital signal processing system processes the plurality of samples and the ADC output signal to form an estimate of the ADC input signal. An ADC linearizer may then be trained to characterize a non-linear impairment of the ADC-under-test responsive to a comparison of the estimate of the ADC input signal and the ADC output signal.

    DYNAMIC AMPLIFIER WITH REDUCED SENSITIVITY
    4.
    发明公开

    公开(公告)号:US20240063765A1

    公开(公告)日:2024-02-22

    申请号:US17821115

    申请日:2022-08-19

    Inventor: Behnam SEDIGHI

    CPC classification number: H03F3/45183 H03F3/45475 H03M1/122

    Abstract: Techniques and apparatus for reducing sensitivity (e.g., less gain variation due to parasitic capacitance) in dynamic amplifiers. One example dynamic amplifier generally includes a pair of differential input transistors, a pair of cross-coupled switches coupled between the pair of differential input transistors and a pair of differential output nodes for the dynamic amplifier, a first pair of switches coupled between the pair of differential input transistors and the pair of differential output nodes, and a second pair of switches coupled between the pair of differential input transistors and the pair of differential output nodes.

    MATCHING UNIT CAPACITOR WITH MULTIPLE METAL LAYERS

    公开(公告)号:US20230370085A1

    公开(公告)日:2023-11-16

    申请号:US17740465

    申请日:2022-05-10

    CPC classification number: H03M1/802 H01L23/5223 H01L28/86 H01G4/38

    Abstract: A capacitor device comprises a semiconductor substrate with multiple metal layers above the substrate. a first metal layer has a first plurality of bottom terminals elongated in a first direction, and a first plurality of top terminals, electrically coupled to each other, elongated in the first direction and interleaved with the first plurality of bottom terminals. A second metal layer between the semiconductor substrate and the first metal layer has a second plurality of bottom terminals elongated in the first direction, and a second plurality of top terminals, electrically coupled to each other and the first plurality of top terminals, elongated in the first direction and interleaved with the second plurality of bottom terminals.

    DYNAMIC RANGE ADJUSTMENT FOR ANALOG-TO-DIGITAL CONVERTER (ADC)

    公开(公告)号:US20230378970A1

    公开(公告)日:2023-11-23

    申请号:US17664358

    申请日:2022-05-20

    CPC classification number: H03M1/188 H03M1/185

    Abstract: Certain aspects are directed to an apparatus configured for wireless communication. The apparatus may include a memory comprising instructions, and one or more processors configured to execute the instructions. In some examples, the one or more processors are configured to cause the apparatus to obtain a sample of an analog signal. In some examples, the one or more processors are configured to cause the apparatus to output the sample to an analog-to-digital converter (ADC) via one of at least a first path or a second path based at least in part on whether the sample satisfies a first threshold condition or a second threshold condition.

    ADAPTIVE SWITCH BIASING SCHEME FOR DIGITAL-TO-ANALOG CONVERTER (DAC) PERFORMANCE ENHANCEMENT

    公开(公告)号:US20210391871A1

    公开(公告)日:2021-12-16

    申请号:US17337619

    申请日:2021-06-03

    Abstract: Methods and apparatus for adaptively generating a reference voltage (VREF) for biasing a switch driver and corresponding switch in a digital-to-analog converter (DAC). The adaptive biasing scheme may be capable of tracking process, voltage, and temperature (PVT) of the DAC. An example DAC generally includes a plurality of DAC cells, each DAC cell comprising a current source, a switch coupled in series with the current source, and a switch driver coupled to a control input of the switch, the switch driver being configured to receive power from a first power supply rail referenced to a reference potential node; a regulation circuit comprising a first transistor coupled between the reference potential node for the DAC and the switch driver in at least one of the plurality of DAC cells; and a VREF generation circuit coupled to the regulation circuit and configured to adaptively generate a VREF for the regulation circuit.

    VOLTAGE-TO-TIME-TO-VOLTAGE AMPLIFIER (VTVA) USING TIME DELAY

    公开(公告)号:US20250096750A1

    公开(公告)日:2025-03-20

    申请号:US18467313

    申请日:2023-09-14

    Abstract: Certain aspects of the present disclosure generally relate to a voltage-to-time-to-voltage amplifier (VTVA). The VTVA may include: a first input capacitive element selectively coupled to a first input node of the VTVA; a first amplifier having an input coupled to the first input capacitive element; a first current source configured to sink a first discharge current from the first input capacitive element during a first phase through a first switch; and a first output capacitive element coupled to a first output node of the VTVA. In some aspects, the first current source is further configured to sink a second discharge current from the first output capacitive element during a second phase through a second switch, the second switch comprising a control input coupled to an output of the first amplifier; and the first phase is non-overlapping with the second phase.

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