Analog-to-digital converter, phase sampler, time-to-digital converter, and flip-flop

    公开(公告)号:US11476841B2

    公开(公告)日:2022-10-18

    申请号:US17198515

    申请日:2021-03-11

    Abstract: A D-type flip-flop (DFF) includes an input circuit having a plurality of transistors configured to receive a clock signal and a data signal, a first inverter (INV1) having a pair of transistors, the first inverter configured to receive an input voltage (x) from the input circuit at a first inverter input, the first inverter configured to provide an output voltage (y) to a first inverter output, a second inverter (INV2) coupled to the first inverter (INV1), the second inverter having a second inverter input and a second inverter output, the second inverter input coupled to the first inverter output, a third inverter (INV3) coupled to the second inverter (INV2), the third inverter having a third inverter input and a third inverter output, and a current device coupled to the first inverter output, the current device configured to provide a current at the first inverter output.

    Analog-to-digital converter, phase sampler, time-to-digital converter, and flip-flop

    公开(公告)号:US11569801B2

    公开(公告)日:2023-01-31

    申请号:US17198515

    申请日:2021-03-11

    Abstract: A D-type flip-flop (DFF) includes an input circuit having a plurality of transistors configured to receive a clock signal and a data signal, a first inverter (INV1) having a pair of transistors, the first inverter configured to receive an input voltage (x) from the input circuit at a first inverter input, the first inverter configured to provide an output voltage (y) to a first inverter output, a second inverter (INV2) coupled to the first inverter (INV1), the second inverter having a second inverter input and a second inverter output, the second inverter input coupled to the first inverter output, a third inverter (INV3) coupled to the second inverter (INV2), the third inverter having a third inverter input and a third inverter output, and a current device coupled to the first inverter output, the current device configured to provide a current at the first inverter output.

    Noise shaping in multi-stage analog-to-digital converters

    公开(公告)号:US11962317B2

    公开(公告)日:2024-04-16

    申请号:US17804779

    申请日:2022-05-31

    CPC classification number: H03M1/0854

    Abstract: Methods and apparatus for noise shaping in multi-stage analog-to-digital converters (ADCs). An example ADC generally includes a first conversion stage having a residue output; an amplifier having an input selectively coupled to the residue output of the first conversion stage; a second conversion stage having an input selectively coupled to an output of the amplifier; and a switched-capacitor network having a first port coupled to the input of the amplifier and having a second port coupled to the input of the second conversion stage, the switched-capacitor network being configured to provide a second-order or higher noise transfer function for noise shaping of quantization noise of the second conversion stage.

    Segmented resistor architecture for digital-to-analog converters

    公开(公告)号:US10454487B1

    公开(公告)日:2019-10-22

    申请号:US16118019

    申请日:2018-08-30

    Abstract: The present disclosure describes aspects of segmented resistor architecture for digital-to-analog converters (DACs). In some aspects, a DAC circuit is implemented with a first resistor network coupled to a set of binary code-controlled current sources and a second resistor network that includes a resistor coupled between the first resistor network and an output of the DAC circuit. A set of thermometer code-controlled current sources are coupled to a node of the second resistor network and provide varying amounts of current. This current is scaled based on a resistance of the second resistor network's resistor, which is higher than a resistance of the first resistor network and effective to increase a combined output impedance of the first and second resistor networks. The increase of output impedance reduces noise of the resistor networks that transfers to the output of the DAC circuit, thereby improving signal-to-noise performance of the DAC circuit.

    Dynamic range adjustment for analog-to-digital converter (ADC)

    公开(公告)号:US11901909B2

    公开(公告)日:2024-02-13

    申请号:US17664358

    申请日:2022-05-20

    CPC classification number: H03M1/188 H03M1/185

    Abstract: Certain aspects are directed to an apparatus configured for wireless communication. The apparatus may include a memory comprising instructions, and one or more processors configured to execute the instructions. In some examples, the one or more processors are configured to cause the apparatus to obtain a sample of an analog signal. In some examples, the one or more processors are configured to cause the apparatus to output the sample to an analog-to-digital converter (ADC) via one of at least a first path or a second path based at least in part on whether the sample satisfies a first threshold condition or a second threshold condition.

    ANALOG-TO-DIGITAL CONVERTER, PHASE SAMPLER, TIME-TO-DIGITAL CONVERTER, AND FLIP-FLOP

    公开(公告)号:US20220294433A1

    公开(公告)日:2022-09-15

    申请号:US17198515

    申请日:2021-03-11

    Abstract: A D-type flip-flop (DFF) includes an input circuit having a plurality of transistors configured to receive a clock signal and a data signal, a first inverter (INV1) having a pair of transistors, the first inverter configured to receive an input voltage (x) from the input circuit at a first inverter input, the first inverter configured to provide an output voltage (y) to a first inverter output, a second inverter (INV2) coupled to the first inverter (INV1), the second inverter having a second inverter input and a second inverter output, the second inverter input coupled to the first inverter output, a third inverter (INV3) coupled to the second inverter (INV2), the third inverter having a third inverter input and a third inverter output, and a current device coupled to the first inverter output, the current device configured to provide a current at the first inverter output.

    Low voltage input calibrating digital to analog converter

    公开(公告)号:US10305361B2

    公开(公告)日:2019-05-28

    申请号:US15710704

    申请日:2017-09-20

    Abstract: A calibrating digital to analog converter (calDAC) architecture uses a low voltage memory to store the digital inputs of calDACs. The calDAC architecture includes a low voltage domain and a high voltage domain coupled to the low voltage domain. The low voltage domain includes a calDAC memory and a finite state machine (FSM). The high voltage domain includes a calDAC core, an interface circuit, and a bias control circuit coupled to the interface circuit. The interface circuit may be provided between the calDAC core and the low voltage domain. The bias control circuit is coupled to the interface circuit to generate a bias voltage for the interface circuit to drive switch transistors of the calDAC core.

Patent Agency Ranking