Stable Low-Power Analog-to-Digital Converter (ADC) Reference Voltage

    公开(公告)号:US20240340019A1

    公开(公告)日:2024-10-10

    申请号:US18745800

    申请日:2024-06-17

    IPC分类号: H03M1/38 H03M1/12 H03M1/14

    摘要: A conversion circuit that performs analog-to-digital conversion is described. During operation, the conversion circuit receives an input signal. Then, the conversion circuit performs analog-to-digital conversion and provides a quantized output corresponding to the input signal based at least in part on a first power-supply voltage and a second power-supply voltage of the conversion circuit. For example, the quantized output may be based at least in part on a comparison of the input signal to the first power-supply voltage and the second power-supply voltage. Moreover, the first power-supply voltage and the second power-supply voltage may specify a full-scale range of the conversion circuit. When the full-scale range exceeds a second full-scale range associated with reference voltages that are other than the first power-supply voltage and the second power-supply voltage, the quantized output may correspond to a larger number of bits than when the full-scale range equals the second full-scale range.

    SUCCESSIVE APPROXIMATION TYPE A/D CONVERTER
    3.
    发明公开

    公开(公告)号:US20240333297A1

    公开(公告)日:2024-10-03

    申请号:US18612301

    申请日:2024-03-21

    申请人: ROHM CO., LTD.

    发明人: Naohiro NOMURA

    IPC分类号: H03M1/38

    CPC分类号: H03M1/38

    摘要: A successive approximation type A/D converter includes: a capacitive D/A converter, and a buffer circuit configured to supply a reference voltage to the capacitive D/A converter, wherein the buffer circuit includes: a reference voltage source configured to generate a constant voltage, a first stage amplifier configured to amplify the constant voltage, an output buffer with a gain of 1 configured to receive a voltage according to an output voltage of the first stage amplifier, and a filter that is interposed between the first stage amplifier and the output buffer and acts on a signal directed from the output buffer to the first stage amplifier, and wherein a tail current of a differential amplifier of the output buffer is larger than a tail current of a differential amplifier of the first stage amplifier.

    Ad converter
    4.
    发明授权

    公开(公告)号:US12047087B2

    公开(公告)日:2024-07-23

    申请号:US17771268

    申请日:2019-10-31

    摘要: An AD converter includes: an accumulation conversion unit that performs a comparison of magnitudes of an input voltage V2 and an accumulated voltage V1 obtained by accumulating a unit voltage and outputs a comparison signal representing a result of the comparison; an accumulation comparison determination unit that repeatedly compares an accumulated voltage V1, obtained by repeating the comparison until the comparison signal changes and corresponding to an accumulated voltage V1 at which the comparison signal changes, and the input voltage V2 a predetermined number of times to determine an equivalent-state accumulation number in which a state probability that the comparison signal changes is equal to a threshold; and a control unit that determines conversion data of the input voltage using the equivalent-state accumulation number.

    ANALOG FRONT-END CIRCUIT AND CAMERA MODULE CONTROL DRIVER INCLUDING THE SAME

    公开(公告)号:US20240192575A1

    公开(公告)日:2024-06-13

    申请号:US18532400

    申请日:2023-12-07

    IPC分类号: G03B5/00 H03K5/003 H03M1/38

    摘要: An analog front-end circuit includes a hall bias correction loop circuit configured to correct a sensing voltage of a hall sensor by adjusting a hall bias current flowing in the hall sensor while tracking a change in the sensing voltage of the hall sensor based on a temperature change, an offset correction loop circuit configured to correct an offset correction voltage while tracking an offset change of the hall sensor and an offset change of an amplifier circuit based on the temperature change, the amplifier circuit configured to amplify and output the sensing voltage of the hall sensor, corrected through at least one of the hall bias correction loop circuit and the offset correction loop circuit, and an analog-digital converter configured to convert an output voltage of the amplifier circuit into sensing data and output the sensing data.

    TESTING ADCs
    6.
    发明公开
    TESTING ADCs 审中-公开

    公开(公告)号:US20240187014A1

    公开(公告)日:2024-06-06

    申请号:US18285217

    申请日:2022-03-31

    发明人: Henrik FON

    IPC分类号: H03M1/10 H03M1/18 H03M1/38

    CPC分类号: H03M1/109 H03M1/182 H03M1/38

    摘要: A circuit portion is provided which is arranged to be operable in a test mode. The circuit portion includes a Successive Approximation Register Analog to Digital Converter, SAR ADC, and an input for a reference signal. The SAR ADC is arranged to generate a feedback signal having a duty cycle representing a time taken for the SAR ADC to complete an analogue to digital conversion. The SAR ADC can carry out a comparison of a duty cycle of the reference signal with the duty cycle of the feedback signal, and can generate an output signal comprising a digital representation of the comparison of the reference duty cycle and the feedback duty cycle.

    TIME DOMAIN ANALOG-TO-DIGITAL CONVERTER AND ANALOG-TO-DIGITAL CONVERTING METHOD

    公开(公告)号:US20240178857A1

    公开(公告)日:2024-05-30

    申请号:US18335572

    申请日:2023-06-15

    IPC分类号: H03M1/38 H03M1/12

    CPC分类号: H03M1/38 H03M1/1245

    摘要: In analog-to-digital conversion, a plurality of stages configured in a sequence to sequentially decide a plurality of bits in successive-approximation, each of the plurality of stages configured to operate in response to a corresponding clock among a plurality of clocks, and decide a corresponding bit among the plurality of bits from a corresponding positive pulse among a plurality of positive pulses and a corresponding negative pulse among a plurality of negative pulses; and a plurality of clock generating circuits respectively corresponding to a plurality of first stages among the plurality of stages, each of the plurality of clock generating circuit configured to generate the corresponding clock of a corresponding stage among the plurality of first stages based on an operation of a previous stage among the plurality of stages, the previous stage being before the corresponding stage in the sequence.

    CALIBRATION SYSTEM AND METHOD FOR SAR ADCs
    9.
    发明公开

    公开(公告)号:US20240137033A1

    公开(公告)日:2024-04-25

    申请号:US18047896

    申请日:2022-10-18

    IPC分类号: H03M1/10 H03M1/38

    CPC分类号: H03M1/1009 H03M1/38

    摘要: In accordance with an embodiment, a method for operating a successive approximation ADC comprising a first capacitor array includes measuring a first weight of an MSB-ath bit of the ADC by applying a first reference voltage to first terminals of capacitors of the first capacitor array corresponding to the MSB-ath bit, applying a second reference voltage to first terminals of capacitors of the first capacitor array corresponding to significant bits lower than the MSB-ath bit, applying the first reference voltage to first terminals of a first set of capacitors of the first capacitor array corresponding to significant bits higher than the MSB-ath bit, and applying the second reference voltage to first terminals of a second set of capacitors of the first capacitor array corresponding to the significant bits higher than the MSB-ath bit; subsequently, a weight of a capacitance of the capacitors corresponding to the MSB-ath bit is successively approximated.

    CIRCUITS, CHIPS, SYSTEMS AND METHODS FOR ELIMINATING RANDOM PERTURBATION

    公开(公告)号:US20240120932A1

    公开(公告)日:2024-04-11

    申请号:US18527355

    申请日:2023-12-03

    IPC分类号: H03M1/16 H03M1/10 H03M1/38

    CPC分类号: H03M1/164 H03M1/1038 H03M1/38

    摘要: Embodiments of the disclosure provide a circuit, chip, system, and method for eliminating random perturbation. The circuit includes a weight calculating module for receiving digital signals and random perturbation digital quantity, using least mean square error algorithm to calculate weight deviation iteration coefficient based on digital signal and digital quantity, and updating perturbation weight in real-time according to weight deviation iteration coefficient; and a perturbation eliminating module for eliminating perturbation signal in output digital signal of quantizer according to perturbation weight updated in real-time and updating perturbation weight in real-time according to weight deviation iteration coefficient, and then calculating current perturbation weight in real time to realize self-calibration of perturbation weight. Even if the manufacturing process or working environment of the current chip changes, perturbation weight can be dynamically adjusted, to ideally eliminate perturbation signal in digital signal.