公开(公告)号：US20140295535A1

公开(公告)日：2014-10-02

申请号：US14226494

申请日：2014-03-26

Applicant: OLYMPUS CORPORATION

Inventor： Akihiro KITAHARA ,  Madoka ITO ,  Hironori UTSUGI ,  Kenichi KUSAKA ,  Mina KOBAYASHI

IPC: G01N21/64

CPC classification number: G01N21/6458 ,  G02B21/0096 ,  G02B21/26

Abstract: A measurement apparatus includes: a holding unit that holds at least a specimen to be observed; an illumination unit that emits illumination light to be irradiated to the specimen; a detection unit that is arrangeably provided in the holding unit and detects an intensity of the illumination light on a light irradiation surface of the specimen; a field stop that is formed with an aperture and stops down a field on the light irradiation surface by an image of the aperture that is provided on an optical path of the illumination unit, the aperture through which the illumination light passes and through which an image of the illumination light is projected on the light illumination surface; and a computation unit that computes, based on an area of the aperture and the detected intensity, an intensity of the illumination light per unit area of the light irradiation surface.

Abstract translation: 测量装置包括：保持单元，至少保持待观察的样本; 照射单元，其发射照射到所述样本的照明光; 检测单元，其被布置地设置在所述保持单元中，并且检测所述样本的光照射表面上的照明光的强度; 形成有孔径的场停止器，通过设置在照明单元的光路上的孔的图像，照射光通过的孔径，通过照射光通过的孔径，使光照射面上的场停止下来 的照明光投射在光照明面上; 以及计算单元，其基于所述孔径的面积和所检测的强度，计算所述光照射面的每单位面积的照明光的强度。

公开(公告)号：US20220221702A1

公开(公告)日：2022-07-14

申请号：US17568981

申请日：2022-01-05

Applicant: OLYMPUS CORPORATION

Inventor： Kenichi KUSAKA ,  Kenji KAWASAKI

IPC: G02B21/02 ,  G02B21/26 ,  G02B21/06

Abstract: A microscope used in multiple microscopies includes an objective used in common in the multiple microscopies, and a magnification adjustment device arranged on an image side of the objective and configured to adjust an optical magnification of the microscope in response to switching of the multiple microscopies.

公开(公告)号：US20170108683A1

公开(公告)日：2017-04-20

申请号：US15292826

申请日：2016-10-13

Applicant: OLYMPUS CORPORATION

Inventor： Yuya MIYAZONO ,  Tatsuo NAKATA ,  Kenichi KUSAKA

IPC: G02B21/00 ,  G02B21/06 ,  G02B21/02 ,  G02B21/16 ,  G02B21/24 ,  G02B3/14

Abstract: A microscope includes: a light source, an objective, a varifocal optical system that is arranged on an illumination light path between the objective and the light source, a reflection optical system that deflects an illumination light axis of the illumination light toward an optical axis of the objective, and a rotator that rotates the objective and the reflection optical system around a rotation axis that is orthogonal to the optical axis of the objective.

公开(公告)号：US20180136445A1

公开(公告)日：2018-05-17

申请号：US15793660

申请日：2017-10-25

Applicant: OLYMPUS CORPORATION

Inventor： Tatsuo NAKATA ,  Kenichi KUSAKA

IPC: G02B21/02 ,  G02B21/08 ,  G02B21/24

CPC classification number: G02B21/02 ,  G02B21/002 ,  G02B21/0076 ,  G02B21/025 ,  G02B21/08 ,  G02B21/24 ,  G02B21/248 ,  G02B21/361

Abstract: To provide a microscope including: an objective optical system that condenses light from a sample; a relay optical system that relays the light condensed by the objective optical system; a photodetector detects the light coming from the objective optical system and relayed by the relay optical system; and a variable-focus optical system disposed at a position between the photodetector and the objective optical system, the position being optically conjugate to a pupil of the objective optical system, the variable-focus optical system being capable of changing a focal position of the objective optical system in a direction along an objective optical axis.

公开(公告)号：US20140049815A1

公开(公告)日：2014-02-20

申请号：US14063634

申请日：2013-10-25

Applicant: OLYMPUS CORPORATION

Inventor： Kenichi KUSAKA

IPC: G02B21/06

CPC classification number: G02B21/06 ,  G02B21/0056 ,  G02B21/0068 ,  G02B21/0092 ,  G02B21/14

Abstract: A microscope includes a light source; a condenser lens irradiating a sample with a light from the light source; an objective facing the condenser lens across the sample; a first polarization plate placed between the light source and the condenser lens; a condenser turret placed between the first polarization plate and the condenser lens and having a plurality of optical elements placed inside; a polarization plate placed on the image side with respect to the objective; and a compensator placed between the first polarization plate and the polarization plate. In the microscope, according to the observation method, an optical element to be placed in an optical path among the plurality of optical elements placed inside the condenser turret is switched by rotation of the condenser turret.

Abstract translation: 显微镜包括光源; 聚光透镜，用来自光源的光照射样品; 面向聚光透镜的物镜横跨样品; 放置在光源和聚光透镜之间的第一偏光板; 放置在第一偏振片和聚光透镜之间并具有放置在内部的多个光学元件的聚光器转台; 相对于物镜放置在像侧的偏光板; 以及放置在第一偏振板和偏振板之间的补偿器。 在显微镜中，根据观察方法，通过冷凝器转台的旋转来切换放置在聚光镜转台内的多个光学元件之间的光路中的光学元件。

公开(公告)号：US20130242383A1

公开(公告)日：2013-09-19

申请号：US13752991

申请日：2013-01-29

Applicant: OLYMPUS CORPORATION

Inventor： Kenichi KUSAKA ,  Atsushi YONETANI ,  Masayoshi KARASAWA ,  Katsuyuki ABE

IPC: G02B21/04

CPC classification number: G02B21/04 ,  G02B21/0076 ,  G02B21/0088 ,  G02B21/16

Abstract: In a microscope having a plurality of optical units each including a filter block between an objective and a tube lens, the optical unit closest to the objective among the plurality of optical units includes a first filter block provided with an optical filter having a first effective diameter. The optical unit closest to the tube lens among the plurality of optical units includes a second filter block provided with an optical filter having a second effective diameter larger than the first effective diameter.

Abstract translation: 在具有多个光学单元的显微镜中，每个光学单元各自包括在物镜和管透镜之间的滤光块，所述多个光学单元中最接近所述物镜的光学单元包括：第一滤光器块，设置有具有第一有效直径的滤光器 。 在多个光学单元中最靠近管透镜的光学单元包括具有第二有效直径大于第一有效直径的滤光器的第二滤光片。

公开(公告)号：US20140291492A1

公开(公告)日：2014-10-02

申请号：US14189446

申请日：2014-02-25

Applicant: OLYMPUS CORPORATION

Inventor： Kenichi KUSAKA

IPC: G01J1/42 ,  G01N21/64

CPC classification number: G01J1/0411 ,  G01J1/4228 ,  G01N21/6458 ,  G02B21/0088 ,  G02B21/0096 ,  G02B21/16

Abstract: An irradiance measuring instrument for a microscope is intended to measure irradiance of light emitted from an objective of the microscope. The irradiance measuring instrument for a microscope includes, in an order where the light emitted from the objective proceeds, an optical system including a single lens that has a nearly flat surface oriented toward the side of the objective and also has positive power, and a photodetector configured to detect the light in order to measure the irradiance of the light on the nearly flat surface.

Abstract translation: 用于显微镜的辐照测量仪器旨在测量从显微镜的物镜发射的光的辐照度。 用于显微镜的辐照度测量仪器以从物体发射的光进行的顺序包括：包括单个透镜的光学系统，该单一透镜具有朝向物镜的侧面定向且具有正的光焦度的近似平坦的表面;以及光电检测器 被配置为检测光以便测量近似平坦表面上的光的辐照度。