公开(公告)号：US12101860B2

公开(公告)日：2024-09-24

申请号：US17985670

申请日：2022-11-11

Applicant: Jae-hyun Jung

Inventor： Jae-hyun Jung

IPC: H05B47/105 ,  G01J1/04 ,  G01J1/42

CPC classification number: H05B47/105 ,  G01J1/0407 ,  G01J1/0411 ,  G01J1/42

Abstract: Disclosed are a light emitting device configured to control the light output of a light emitting unit and a curing apparatus employing the same. The disclosed light emitting device may comprise: a main body having a window; a light source installed in the main body, for generating light of a predetermined wavelength and irradiating the generated light to the outside of the main body through the window; a photodetector installed in the main body, for receiving part of the light irradiated from the light source and monitoring the intensity of the light source; a light path converting unit installed between the light source and the photodetector, for transferring the part of the light irradiated from the light source to the photodetector; and an intensity adjusting unit for adjusting the intensity of the light source based on the signal detected from the photodetector.

公开(公告)号：US12087870B2

公开(公告)日：2024-09-10

申请号：US17377052

申请日：2021-07-15

Applicant: Texas Instruments Incorporated

Inventor： Debarshi Basu ,  Henry Litzmann Edwards ,  Ricky A. Jackson ,  Marco A. Gardner

IPC: H01L31/0232 ,  G01J1/02 ,  G01J1/04 ,  G01J1/42 ,  H01L25/16 ,  H01L31/103

CPC classification number: H01L31/02327 ,  G01J1/02 ,  G01J1/0209 ,  G01J1/0411 ,  G01J1/42 ,  H01L25/167 ,  H01L31/103

Abstract: An integrated circuit that includes a substrate, a photodiode, and a Fresnel structure. The photodiode is formed on the substrate, and it has a p-n junction. The Fresnel structure is formed above the photodiode, and it defines a focal zone that is positioned within a proximity of the p-n junction. In one aspect, the Fresnel structure may include a trench pattern that functions as a diffraction means for redirecting and concentrating incident photons to the focal zone. In another aspect, the Fresnel structure may include a wiring pattern that functions as a diffraction means for redirecting and concentrating incident photons to the focal zone. In yet another aspect, the Fresnel structure may include a transparent dielectric pattern that functions as a refractive means for redirecting and concentrating incident photons to the focal zone.

公开(公告)号：US12078532B2

公开(公告)日：2024-09-03

申请号：US17962050

申请日：2022-10-07

Applicant: Dell Products L.P.

Inventor： Hong-Ji Huang ,  Yu-Chen Liu ,  Kuo-Wei Tseng ,  Chun-Wei Huang ,  Chi-Fong Lee

IPC: G01J1/04

CPC classification number: G01J1/0488 ,  G01J1/0411

Abstract: An information handling system includes a display panel having an active area that generates visual images and an inactive area disposed outside the active area. The inactive area having an alignment mark that is invisible to a naked eye.

公开(公告)号：US12078530B2

公开(公告)日：2024-09-03

申请号：US17306281

申请日：2021-05-03

Applicant: Waymo LLC

Inventor： Pierre-Yves Droz ,  David Hutchison

IPC: G01C3/08 ,  G01J1/04 ,  G01S7/481 ,  G01S17/89 ,  G02B6/08 ,  G01J1/44

CPC classification number: G01J1/0407 ,  G01J1/0411 ,  G01J1/0414 ,  G01J1/0425 ,  G01J1/0437 ,  G01S7/4816 ,  G01S7/4818 ,  G01S17/89 ,  G02B6/08 ,  G01J2001/4466

Abstract: The present disclosure relates to limitation of noise on light detectors using an aperture. One example implementation includes a system. The system includes a lens disposed relative to a scene. The lens focuses light from the scene. The system also includes an aperture defined within an opaque material. The system also includes a waveguide having a first side that receives light focused by the lens and transmitted through the aperture. The waveguide guides the received light toward a second side of the waveguide opposite to the first side. The waveguide has a third side extending between the first side and the second side. The system also includes an array of light detectors that intercepts and detects light propagating out of the third side of the waveguide.

公开(公告)号：US20240230402A1

公开(公告)日：2024-07-11

申请号：US18406301

申请日：2024-01-08

Applicant: Nanohmics, Inc.

Inventor： Chris W. Mann ,  Kieran Lerch ,  Alexander P. Greis ,  Austin Ferrie

IPC: G01J1/04 ,  G01J3/28

CPC classification number: G01J1/0437 ,  G01J1/0411 ,  G01J1/0429 ,  G01J3/2823

Abstract: An integral field spectral imager has a plurality of optical homogenizers. Each optical homogenizer is in-register with a corresponding different superpixel in a superpixel array and is configured to spatially homogenize incident EMR and to pass the spatially homogenized EMR to a spectral filter in an array of spectral filters, thence to the in-register, corresponding different superpixel. Baffles are included to maximize confinement of the spatially homogenized EMR passed by a single optical homogenizer to the in-register, corresponding different superpixel so as to minimize crosstalk between superpixels. Optical homogenizers and baffles are designed to produce a pattern of homogenized EMR on a superpixel, regardless of where incident EMR is received on an optical homogenizer. Methods for using embodiments of the spectral imager in a variety of spectral bands in the EMR spectrum enable determining spectral information about incident EMR.

公开(公告)号：US12023153B2

公开(公告)日：2024-07-02

申请号：US17175407

申请日：2021-02-12

Applicant: Apple Inc.

Inventor： Guocheng Shao ,  Mathieu Charbonneau-Lefort ,  Ueyn L. Block

IPC: A61B5/1455 ,  A61B5/024 ,  G01J1/04 ,  G02B3/08 ,  G02B5/22

CPC classification number: A61B5/14552 ,  A61B5/02427 ,  G01J1/0411 ,  G01J1/0488 ,  G02B3/08 ,  G02B5/22 ,  A61B2562/0233 ,  G02B2207/123

Abstract: This relates to an electronic device configured for optical sensing having shared windows and including light restriction designs. The light restriction designs can include one or more of optical layers, optical films, lenses, and window systems configured to reduce or eliminate crosstalk between optical components. A plurality of accepting sections and a plurality of blocking sections can be employed to selectively allow light having an angle of incidence within one or more acceptance viewing angles and block light with angles of incidence outside of the acceptance viewing angles. In some examples, the light restriction designs can include variations in optical and structural properties can allow the light restriction designs to have spatially varying acceptance angles. Variations in structural properties can include, but are not limited to, differences in widths, heights, and/or tilts of the accepting sections and/or blocking sections.

公开(公告)号：US11976968B2

公开(公告)日：2024-05-07

申请号：US18139426

申请日：2023-04-26

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Soh Uenoyama ,  Takuya Hashimoto

IPC: G01J1/44 ,  G01J1/04

CPC classification number: G01J1/44 ,  G01J1/0411 ,  G01J2001/4466

Abstract: The light detector includes a light detection substrate having at least one light receiving region and a light incident surface on which a detection target light is incident, and a meta-lens including a plurality of unit structures arranged in a grid pattern and disposed on the light incident surface to focus the detection target light. When viewed in a thickness direction of the light detection substrate, an opening region in which no unit structure is formed is provided in a region including a center of the meta-lens.

公开(公告)号：US20240142300A1

公开(公告)日：2024-05-02

申请号：US18384787

申请日：2023-10-27

Applicant: National Institute of Meteorological Sciences

Inventor： Kyu Young Reno CHOI ,  Ki Hoon KIM ,  So Ra IN ,  Min Woo KIM

IPC: G01J1/42 ,  G01J1/04

CPC classification number: G01J1/42 ,  G01J1/0411 ,  G01J2001/4266

Abstract: There is provided an apparatus for detecting the contamination on the glass dome of the solar radiation observing sensor. The apparatus includes: the solar radiation observing sensor; the glass dome; a light source, wherein artificial light emitted from the light source is allowed to be incident on the medium of the glass dome at a predetermined angle and thus the artificial light incident on the medium of the glass dome is allowed to undergo total internal reflection; a light-collecting lens configured to collect natural light and a diffusedly-reflected part of the artificial light; and a contamination-detecting sensor configured to detect contamination, wherein the contamination-detecting sensor measures the natural light and the diffusedly-reflected part of the artificial light collected by the light-collecting lens.

公开(公告)号：US11953372B2

公开(公告)日：2024-04-09

申请号：US17577388

申请日：2022-01-18

Applicant: InnoLux Corporation

Inventor： Yu-Tsung Liu ,  Wei-Ju Liao ,  Wei-Lin Wan ,  Cheng-Hsueh Hsieh ,  Po-Hsin Lin ,  Te-Yu Lee

IPC: G01J1/04 ,  G01J1/44 ,  H01L27/146 ,  G06V40/13

CPC classification number: G01J1/44 ,  G01J1/0411 ,  G01J1/0437 ,  H01L27/14623 ,  H01L27/14627 ,  G01J2001/446 ,  G01J2001/4473 ,  G06V40/1318

Abstract: An optical sensing device is disclosed. The optical sensing device includes a sensing pixel, a driving circuit and a first light shielding layer. The sensing pixel includes a sensing circuit and a sensing element electrically connected to the sensing circuit. The driving circuit is electrically connected to the sensing circuit. The first light shielding layer includes at least one first opening corresponding to the sensing element, and the first light shielding layer is overlapped with the driving circuit in a top-view direction of the optical sensing device.

公开(公告)号：US11911852B2

公开(公告)日：2024-02-27

申请号：US16306430

申请日：2017-01-25

Applicant: Primes GmbH Meßtechnik für die Produktion mit Laserstrahlung

Inventor： Reinhard Kramer ,  Otto Märten ,  Stefan Wolf ,  Roman Niedrig

IPC: B23K26/70 ,  B23K26/042 ,  B29C64/135 ,  B29C64/386 ,  B23K26/082 ,  B33Y10/00 ,  B33Y30/00 ,  B29C64/153 ,  G01J1/42 ,  B29C64/268 ,  G01J1/04 ,  B23K26/03 ,  B23K26/342 ,  B23K26/06 ,  B29C67/00 ,  G02B26/10 ,  G01J1/02 ,  B22F10/28 ,  B22F12/44 ,  B22F12/49 ,  B22F12/90 ,  B22F10/31

CPC classification number: B23K26/705 ,  B22F10/28 ,  B22F10/31 ,  B22F12/44 ,  B22F12/49 ,  B22F12/90 ,  B23K26/032 ,  B23K26/042 ,  B23K26/0648 ,  B23K26/082 ,  B23K26/342 ,  B29C64/135 ,  B29C64/153 ,  B29C64/268 ,  B29C64/386 ,  B29C67/00 ,  B33Y10/00 ,  B33Y30/00 ,  G01J1/0266 ,  G01J1/0411 ,  G01J1/0414 ,  G01J1/4228 ,  G01J1/4257 ,  G02B26/101 ,  B22F2999/00 ,  G01J2001/4261 ,  Y02P10/25

Abstract: The invention relates to a method and a device for the analysis of energy beams in systems for the additive manufacture of components (70) by means of layered solidification of a construction material (55) by an energy beam (30). The invention enables a determination of position-related beam data directly with respect to the processing point during the machining process. An additive manufacturing system includes a beam deflecting device (40), a processing plane (45), and a layer applicator (60). The device according to the invention comprises a movable beam barrier (17), a movable beam sampling module (20) and a measuring device (10) with a radiation detector (12).