LASER PROCESSING DEVICE AND LASER PROCESSING METHOD

    公开(公告)号:US20240307997A1

    公开(公告)日:2024-09-19

    申请号:US18576191

    申请日:2022-03-17

    Abstract: A laser processing apparatus according to an embodiment includes a laser beam source, a stage, an fθ lens, a galvano scanner that scans a processed surface of a processing target with a laser beam by operating a dielectric mirror to adjust an incident angle of the laser beam with respect to the fθ lens, a polarization beam splitter disposed between the laser beam source and the galvano scanner on an optical path of the laser beam, a quarter-wave plate disposed between the polarization beam splitter and the galvano scanner on the optical path, and a light detection unit that detects a return beam of the laser beam from the processed surface irradiated with the laser beam, the return beam passing through the fθ lens, the galvano scanner, the quarter-wave plate, and the polarization beam splitter in this order.

    LASER WELDING QUALITY INSPECTION METHOD AND LASER WELDING QUALITY INSPECTION APPARATUS

    公开(公告)号:US20240261907A1

    公开(公告)日:2024-08-08

    申请号:US18625968

    申请日:2024-04-03

    Inventor: Koji FUNAMI

    CPC classification number: B23K31/125 B23K26/21 B23K26/705

    Abstract: A laser welding quality inspection method of a welded portion between a joining object and a joined object, when the joining object and the joined object are welded by being irradiated with a laser beam, the method includes: acquiring first data indicating a signal intensity of thermal radiation light radiated from the welded portion during the welding; acquiring second data indicating a signal intensity of plasma light radiated from the welded portion during the welding; and determining whether or not the welded portion includes an abnormality based on a comparison between the signal intensity of the thermal radiation light and the signal intensity of the plasma light which are acquired.

    Method for determining a parameter of a processing process and processing machine

    公开(公告)号:US12053840B2

    公开(公告)日:2024-08-06

    申请号:US17226094

    申请日:2021-04-09

    CPC classification number: B23K26/705 B23K26/38

    Abstract: A method determines at least one parameter for a process quality during a processing process. The method includes: processing a workpiece while moving a processing tool and the workpiece relative to one another; monitoring a region on the workpiece; determining the at least one parameter for the process quality based on the monitored region; and determining at least one position-dependent parameter for the process quality based on a plurality of measured values of the at least one parameter at a same processing position, or determining at least one direction-dependent parameter for the process quality based on the plurality of measured values of the at least one parameter in a same processing direction.

    METHOD FOR MONITORING A LASER WELDING PROCESS, MONITORING DEVICE, AND LASER WELDING DEVICE

    公开(公告)号:US20240227066A9

    公开(公告)日:2024-07-11

    申请号:US18402782

    申请日:2024-01-03

    CPC classification number: B23K26/032 B23K26/21 B23K26/705

    Abstract: A method for monitoring a laser welding process for welding workpieces by a welding laser beam is provided. The method includes, during the laser welding process, directing a measuring beam of an optical coherence tomograph onto an interaction area in which the welding laser beam interacts with the workpieces. The measuring beam penetrates the workpieces in the interaction area in a through weld of the workpieces. The measuring beam penetrating the workpieces is incident on a reference element. The method further includes acquiring measured values using the measuring beam, defining a first measured value range corresponding to detection of a material of the workpieces, defining a second measured value range corresponding to detection of the reference element, and determine a ratio of a number of measured values lying in the first measured value range and a number of measured values lying in the second measured value range.

    Method and device for conducting and monitoring a machining process of a workpiece

    公开(公告)号:US11999017B2

    公开(公告)日:2024-06-04

    申请号:US17162782

    申请日:2021-01-29

    CPC classification number: B23K26/705 B23K26/0643 B23K26/0648 B23K26/28

    Abstract: The invention relates to a method for conducting and monitoring a machining process of a workpiece (10), in particular a welding process for joining the workpiece (10) to a further workpiece (10), by means of a high-energy machining beam (14), wherein the method comprises the following steps: generating a high-energy machining beam (14); projecting and/or focusing the machining beam (14) onto the workpiece (10), wherein, in accordance with a machining control signal, different machining regions of the workpiece (10) are machined; generating a measurement beam (16) by means of an optical coherence tomograph (18), wherein the measurement beam (16) is able to be coupled into the machining beam (14); determining measurement points (20) during the machining process by means of the optical coherence tomograph (18) using the measurement beam (16), in accordance with a measurement control signal; obtaining at least one external signal which is based on a measured variable and which is independent of a processing of the machining control signal and of the measurement control signal; generating an evaluation on the basis of the measurement points (20) and of the at least one external signal, which evaluation comprises a comparison of the measurement points (20) with at least one threshold value; monitoring the machining process on the basis of the evaluation.
    The invention relates further to a correspondingly configured device for conducting and monitoring a machining process of a workpiece (10).

    Machining condition adjustment device and machine learning device

    公开(公告)号:US11958135B2

    公开(公告)日:2024-04-16

    申请号:US16541154

    申请日:2019-08-15

    Inventor: Takashi Izumi

    Abstract: A machining condition adjustment device adjusts laser beam machining conditions for a laser beam machining device to carry out laser beam machining of a workpiece, produces each of state variables including machining condition data, workpiece data, and plasma generation amount data and determination data including plasma generation amount determination data, and learns adjustment action for the laser beam machining conditions with respect to an amount of plasma generated in the laser beam machining of the workpiece under prescribed laser beam machining conditions, with use of the produced state variables and the produced determination data.

Patent Agency Ranking