Abstract:
A memory cell includes a conductor clad with ferromagnetic material; first and second spacer layers on opposite sides of the clad conductor; a first data layer on the first spacer layer; and a second data layer on the second spacer layer.
Abstract:
A memory device includes memory cells having a re-writeable element and a write-once element in series with the re-writeable element. The re-writeable element is programmable between a high resistance state and a low resistance state. The write-once element can be an anti-fuse element that is programmable from a high resistance state to a low resistance state, or a fuse element that is programmable from a low resistance state to a high resistance state. The two possible states for the re-writeable element and the two possible states for the write-once element allow the memory cells to store four different bits.
Abstract:
A magneto-resistive device includes first and second ferromagnetic layers having different coercivities, and a spacer layer between the first and second layers. Each ferromagnetic layer has a magnetization that can be oriented in either of two directions.
Abstract:
A magnetic memory cell having read conductor that is wholly clad with a high magnetic permeability soft magnetic material for a pinned-on-the-fly soft ferromagnetic reference layer is disclosed. The magnetic memory cell includes a ferromagnetic data layer, an intermediate layer formed on the ferromagnetic data layer, and a soft ferromagnetic reference layer formed on the intermediate layer. The soft ferromagnetic reference layer includes a read conductor and a ferromagnetic cladding that completely surrounds the read conductor to form a cladded read conductor. The soft ferromagnetic reference layer has a non-pinned orientation of magnetization. When an externally supplied read current flows through the read conductor, the read conductor generates a magnetic field that does not saturate the ferromagnetic cladding and is substantially contained within the ferromagnetic cladding and is operative to dynamically pin the orientation of magnetization in a desired direction. Optionally, the soft ferromagnetic reference layer can include a ferromagnetic cap layer positioned between the ferromagnetic cladding and the intermediate layer and magnetically coupled with the ferromagnetic cladding. A bit of data stored in the ferromagnetic data layer is read by measuring a resistance between the ferromagnetic data layer and the soft ferromagnetic reference layer. The ferromagnetic cladding substantially reduces fringe magnetic fields, reduces the number and complexity of the of layers needed to form a prior pinned reference layer, and reduces a magnitude of the read current sufficient to read the bit of data.
Abstract:
A memory device includes dual tunnel junction memory cells having a magnetic tunnel junction in series with a tunnel junction. The magnetic tunnel junction can be changed from a first resistance state to a second resistance state during a write operation. The magnetic tunnel junction can have a differing resistance-voltage characteristic than the tunnel junction, and the differing resistance-voltage characteristics allow the magnetic tunnel junction to be blown without blowing the tunnel junction during a write operation. The change in resistance state of the magnetic tunnel junction changes the resistance of the selected memory cell, which is detectable during a read operation.
Abstract:
A data storage device is disclosed that has a plurality of word lines, a plurality of bit lines, and a resistive crosspoint array of memory cells. Each memory cell is connected to a bit line and connected to an isolation diode that further connects to a respective word line. The isolation diode provides a unidirectional conductive path from the bit line to the word line. Each word line provides a common metal-semiconductor contact with each diode sharing the word line such that each diode has a separate metal contact located between the semiconductor portion of the common metal-semiconductor contact and its respective memory cell.
Abstract:
A memory cell of a data storage device includes serially-connected first and second magnetoresistive devices. The first magnetoresistive device has first and second resistance states. The second magnetoresistive device has third and fourth resistance states. The four resistance states are detectably different.
Abstract:
A memory cell includes a conductor clad with ferromagnetic material; first and second spacer layers on opposite sides of the clad conductor; a first data layer on the first spacer layer; and a second data layer on the second spacer layer.
Abstract:
A magneto-resistive device includes data and reference layers having different coercivities. Each layer has a magnetization that can be oriented in either of two directions. The memory device may be read by temporarily setting the magnetization of the reference layer to a known orientation, and determining a resistance state of the device.
Abstract:
A method and circuit write a memory cell. The method applies a pulse to a write line connected to the memory cell. The duration of the pulse is not predetermined. The method compares a value on the input side of the cell to a reference value. The method discontinues the pulse on the write line, in response to the comparing step, preferably if the value on the write line exceeds the reference value. The circuit comprises a pulse generator and a comparator. The pulse generator has an output and an enable input. The output is connected to a write line connected to the memory cell. The output, when enabled, carries a pulse. The comparator has two inputs and an output. One of the inputs is connected to the write line. The other of the inputs is connected to a reference. The output is connected to the write line, whereby the pulse is disabled or enabled on the write line depending upon comparator output. A complete memory system comprises an array of memory cells, a write line, and a pulse generator and comparator as described above.