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公开(公告)号：US5329353A
公开(公告)日：1994-07-12
申请号：US832475
申请日：1992-02-07
Applicant: Tsutomu Ichimura , Toshiyuki Nogoshi , Fumio Inaba
Inventor： Tsutomu Ichimura , Toshiyuki Nogoshi , Fumio Inaba
CPC classification number: G01J3/2803 , G01J3/18 , G01J2003/2813 , G01J3/0208 , G01J3/0256 , G01J3/0291 , G01J3/24
Abstract: A compact, high sensitive, multi-wavelength spectral analyzer capable of simultaneously obtaining a spectral distribution of extremely weak radiation such as bioluminescence, chemiluminescence, extremely weak fluorescence caused by excitation light, Raman scattered light, etc. with an extremely high luminosity and without wavelength scanning. The spectral analyzer comprises a spectroscope and a high sensitive one- or two-dimensional photodetector. The spectroscope includes an entrance slit, a collimator lens of high luminosity disposed such that a focal point of the collimator lens is coincident with the entrance slit to convert light emerging therefrom into parallel rays, a reflection diffraction grating that diffracts the parallel rays from the collimator lens to produce spectra, and an imaging lens that focuses the parallel rays diffracted by the reflection diffraction grating on an image plane thereof to form a spectral image. The photodetector is disposed on the image plane of the imaging lens.
Abstract translation: 一种紧凑，高灵敏度的多波长光谱分析仪，能够同时获得非常弱的辐射的光谱分布，例如生物发光，化学发光，由激发光引起的极弱荧光，拉曼散射光等，具有极高的发光度和无波长 扫描。 光谱分析仪包括分光镜和高灵敏度的一维或二维光电探测器。 分光镜包括入射狭缝，高亮度的准直透镜，其设置成使得准直透镜的焦点与入射狭缝重合，以将从其出射的光转换为平行光线;反射衍射光栅，衍射来自准直仪的平行光线 透镜以产生光谱，以及将由反射衍射光栅衍射的平行光线聚焦在其图像平面上以形成光谱图像的成像透镜。 光检测器设置在成像透镜的图像平面上。
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2.发明授权Heterodyne receptor system and arrangement for visualizing optical transmission images 失效异位受体系统和可视化光传输图像的布置
公开(公告)号：US5249072A
公开(公告)日：1993-09-28
申请号：US689883
申请日：1991-05-24
Applicant: Tsutomu Ichimura , Fumio Inaba , Masahiro Toida
Inventor： Tsutomu Ichimura , Fumio Inaba , Masahiro Toida
CPC classification number: G01N21/59 , G01J9/04 , G01N2021/1787
Abstract: The present invention provides a receptor system in which laser light from a laser source is directed onto a sample, the transmitted light from which is photomixed by a half mirror with laser light different in frequency from laser light from a local oscillator source, and the photomixed light is received by a receptor element dividing a light propagating zone into a plurality of sub-zones, said receptor element having an exit end, at which a spatial zone, which is defined between different points and in which interference occurs, is limited within a spatially resolvable minimum unit, to form a Fraunhofer diffraction image, whereby the 0 order diffraction image of the Fraunhofer diffraction image is partly or wholly detected by a photodetector, or alternatively a diffraction image at most n times as large as the 0 order spectrum is detected by the photodetector. By extracting a beat component from the photomixed light in this manner, a transmission image can be separated from scattered components for detection. With light including too many scattered components such as that transmitted through the human body or the like, it is possible to obtain information relating to an absorber. This invention is thus applicable to optical computer tomography, etc.
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公开(公告)号：US4897846A
公开(公告)日：1990-01-30
申请号：US163770
申请日：1988-03-03
Applicant: Tomoaki Yoshida , Fumio Inaba , Hiromasa Ito , Tetsuro Saito , Shiro Sato , Junichi Azumi
Inventor： Tomoaki Yoshida , Fumio Inaba , Hiromasa Ito , Tetsuro Saito , Shiro Sato , Junichi Azumi
CPC classification number: H01L33/24 , H01L27/156 , H01S5/18 , H01S5/423 , H01S5/18369
Abstract: A surface emission type semiconductor light-emitting device includes a base having a main surface, a current blocking layer formed on the base, and a semiconductor layer formed on the current blocking layer. A circular recess or hole having a side wall which is substantially perpendicular to the main surface is formed in the semiconductor layer as extending therethrough and partly into the base. An impurity is introduced into the semiconductor layer through the side wall and thus there is defined a cylindrical diffusion region around the recess. A p-n junction is defined at an outer boundary of the diffusion region and the p-n junction effectively defines a light-emitting activation region. An additional diffusion region may be formed in the semiconductor layer for narrowing a current path in the semiconductor layer. A second current blocking layer may be formed on top of the semiconductor layer. The semiconductor layer may have a multi-layer structure which may be constructed to provide a current confinement effect.
Abstract translation: 表面发射型半导体发光器件包括具有主表面的基底，形成在基底上的电流阻挡层和形成在电流阻挡层上的半导体层。 在半导体层中形成具有基本上垂直于主表面的侧壁的圆形凹部或孔，其延伸穿过其中并部分地进入基部。 通过侧壁将杂质引入半导体层，因此限定了围绕凹部的圆柱形扩散区域。 p-n结定义在扩散区的外边界处，并且p-n结有效地限定发光激活区。 可以在半导体层中形成附加的扩散区，以使半导体层中的电流通路变窄。 可以在半导体层的顶部上形成第二电流阻挡层。 半导体层可以具有可以构造成提供电流限制效应的多层结构。
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Patent Agency Ranking
公开(公告)号：US5495334A
公开(公告)日：1996-02-27
申请号：US735740
申请日：1991-07-25
Applicant: Toshiyuki Nagoshi , Tsutomu Ichimura , Fumio Inaba
Inventor： Toshiyuki Nagoshi , Tsutomu Ichimura , Fumio Inaba
CPC classification number: G01J3/4532 , G01J2009/0223
Abstract: An apparatus for effecting spatial Fourier transform spectroscopic detection of light from a surface luminescent object with high sensitivity by use of a quadrangular common path interferometer. The apparatus includes an improvement which consists of an additional imaging optical system which converges a light beam from the specimen so as to enter the beam splitter. The additional imaging optical system is disposed so that an image position is substantially coincident with the position of the second of three mirrors in the apparatus.
Abstract translation: 一种通过使用四边形公共路径干涉仪来实现来自具有高灵敏度的表面发光物体的光的空间傅里叶变换光谱检测的装置。 该装置包括一种改进，该附加成像光学系统会聚来自试样的光束以进入分束器。 附加成像光学系统被设置成使得图像位置与装置中的三个反射镜中的第二个反射镜的位置基本一致。
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公开(公告)号：US4797890A
公开(公告)日：1989-01-10
申请号：US946324
申请日：1986-12-24
Applicant: Fumio Inaba , Hiromasa Ito , Noriaki Onodera , Akira Mizuyoshi
Inventor： Fumio Inaba , Hiromasa Ito , Noriaki Onodera , Akira Mizuyoshi
CPC classification number: H01L33/20 , H01L27/156 , H01L33/0008 , H01L33/0079 , H01S5/18 , H01S5/42 , H01L2924/0002 , H01L33/0016 , H01S5/0207 , H01S5/02284 , H01S5/1237 , H01S5/2072 , H01S5/2222 , H01S5/2237 , H01S5/3428
Abstract: A semiconductor light emitting device, such as a light emitting diode or laser, includes a substrate which is provided with a hole and a pn junction extending adjacent to and in parallel with the side wall of the hole. Thus, the side wall of the hole extends in a direction perpendicular to a main surface of the substrate. A pair of electrodes is provided such that current flows across the pn junction so that light emitted in a vertical direction which is perpendicular to the main surface of the substrate. The hole may be either a through hole or a bore hole. With the additional provision of a pair of resonators, there is provided a semiconductor laser.
Abstract translation: 诸如发光二极管或激光器的半导体发光器件包括：衬底，其设置有与孔的侧壁相邻并平行延伸的孔和pn结。 因此，孔的侧壁在垂直于基板的主表面的方向上延伸。 提供一对电极，使得电流流过pn结，使得沿垂直于衬底的主表面的垂直方向发射的光。 孔可以是通孔或钻孔。 通过附加设置一对谐振器，提供半导体激光器。
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6.发明授权Method and apparatus for measuring spectral absorption in an opaque specimen and method and apparatus for measuring the microscopic absorption distribution 失效用于测量不透明样品中的光谱吸收的方法和装置以及用于测量微观吸收分布的方法和装置
公开(公告)号：US5345306A
公开(公告)日：1994-09-06
申请号：US704142
申请日：1991-05-22
Applicant: Tsutomu Ichimura , Fumio Inaba
Inventor： Tsutomu Ichimura , Fumio Inaba
CPC classification number: G01N21/4795 , G01N21/17 , G02B21/002 , G01N2021/1742 , G01N2021/451 , G01N2021/4707 , G01N2021/4709 , G01N21/39
Abstract: In the method of and apparatus for measuring a spectral absorption in an opaque specimen, a scattering specimen is illuminated with highly directional light of variable wavelength from a specific direction, thereby removing scattered rays as much as possible, and thus detecting the intensity of only parallel rays of a component transmitted or reflected in a specific direction (i.e., rectilinear component rays) by use of a highly directional detecting system, for example, a heterodyne light-receiving system, Michelson light-receiving system, highly directional optical system, etc. It is therefore possible to measure spectral absorption characteristics of a scattering specimen with high accuracy without picking up scattered light in other undesired directions nor other noise light. In addition, the measurement of the control is exceedingly simplified in comparison to the conventional method and thus the measurement is extremely facilitated. Thus, the method and apparatus of the present invention are suitable for measuring spectral absorption of a component transmitted or reflected in a specific direction in not only sparse heterogeneous systems having spatial resolving power, for example, suspensions, organic tissues, etc., but also dense translucent objects.
Abstract translation: 在不透明样品中的光谱吸收测定方法和测定装置中，以特定方向的可变波长的高度定向的光照射散射试样，从而尽可能地除去散射的光线，从而检测出只有平行的强度 通过使用高度定向的检测系统，例如外差光接收系统，迈克尔逊光接收系统，高度定向光学系统等，在特定方向（即，直线分量射线）上发射或反射的分量的光线。 因此，可以高精度地测量散射试样的光谱吸收特性，而不会在其它不需要的方向上拾取散射光，也不会检测其他噪声光。 此外，与常规方法相比，控制的测量被非常简化，因此极大的方便了测量。 因此，本发明的方法和装置不仅适用于不仅具有空间分辨能力的稀疏异质系统，例如悬浮液，有机组织等，而是在特定方向上传输或反射的组分的光谱吸收， 密实的半透明物体。
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7.发明授权
公开(公告)号：US5231464A
公开(公告)日：1993-07-27
申请号：US672973
申请日：1991-03-21
Applicant: Tsutomu Ichimura , Fumio Inaba , Masahiro Toida
Inventor： Tsutomu Ichimura , Fumio Inaba , Masahiro Toida
CPC classification number: G01N21/255 , A61B5/0059 , A61B5/0068 , G01N2201/08
Abstract: A light propagation region is divided into a plurality of subregions, each subregion being limited within a minimum spatial resolution unit where an interference occurs between discrete points, and a 0-order diffraction pattern of a Fraunhofer diffraction image is detected If a convex lens and either a pinhole or an optical fiber which is disposed on a focal plane of the convex lens are employed and the diameter of the pinhole or the core diameter of the optical fiber is set to be not greater than the first dark ring of a Fraunhofer diffraction image produced by the convex lens, it is possible to take out the greater part of the energy of a plane wave component that enters the lens from a predetermined direction and remove other components from different directions, i.e., scattering component. If a plurality of optical systems of this type are bundled together, only a plane wave with a one- or two-dimensional intensity distribution can be taken out with high brightness and high resolving power. Since the scattering component attenuates and only an information light component carried by the plane wave can be detected, it is possible to obtain information about an absorber even when the scattering component is greater than the information light component as in the case of light transmitted by a human body. Thus, it is possible to obtain great advantages in application to optical CT or the like.
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公开(公告)号：US4983041A
公开(公告)日：1991-01-08
申请号：US261855
申请日：1988-10-25
Applicant: Fumio Inaba
Inventor： Fumio Inaba
CPC classification number: G01J3/4537 , G01N21/76 , G01N21/763
Abstract: The present invention relates to a photo-counting Fourier spectroscopic apparatus which enables spectroscopic detection of extremely fine emission light seen in a living-body specimen or the like as bioluminescence, chemiluminescence, and fluoroescence from a living-body specimen. A light from a specimen which emits an extremely faint light is guided to an interferometer. A two-dimensional photon counter is used as an interference fringe detector. The two-dimensional photo counting device counts the number of incident photons to form an image. The obtained image is subjected to Fourier analysis to thereby obtain spectral information about the incident light. A double beam interferometer, a triangular common path interferometer, a Michelson interferometer and other interferometers are used.
Abstract translation: 本发明涉及一种能够从活体样本等中观察到的极细发光的生物发光，化学发光和荧光的光计数傅里叶分光装置。 来自发出非常微弱的光的样本的光被引导到干涉仪。 二维光子计数器用作干涉条纹检测器。 二维照片计数装置对入射光子数进行计数以形成图像。 对所获得的图像进行傅立叶分析，从而获得关于入射光的光谱信息。 使用双光束干涉仪，三角共通路径干涉仪，迈克尔逊干涉仪和其他干涉仪。
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