AUTOMATIC NEEDLE INSERTION APPARATUS
    2.
    发明申请
    AUTOMATIC NEEDLE INSERTION APPARATUS 审中-公开
    自动针插入装置

    公开(公告)号:US20170028142A1

    公开(公告)日:2017-02-02

    申请号:US15167501

    申请日:2016-05-27

    摘要: The present disclosure provides an automatic needle insertion apparatus, including a frame, a bearing device on the frame and configured to bear thereon a body part into which a needle is to be inserted, an acquisition device on the frame and configured to acquire vascular information of the body part, a needle insertion device on the frame and configured to execute a needle insertion operation and a needle withdrawal operation on the body part, and a first control device connected to the needle insertion device and the acquisition device and configured to control an operating state of the needle insertion device in accordance with the vascular information acquired by the acquisition device.

    摘要翻译: 本发明提供了一种自动针插入装置,包括框架,框架上的轴承装置,并且构造成承载其上要插入针的主体部分,框架上的采集装置,并且构造成获取血管信息 身体部分,框架上的针插入装置,其构造成在身体部位上执行针插入操作和针拔出操作;以及第一控制装置,连接到针插入装置和采集装置,并且被配置为控制操作 根据由采集装置获取的血管信息的针插入装置的状态。

    DISPLAY PANEL AND METHOD FOR MANUFACTURING THE SAME, AND DISPLAY DEVICE

    公开(公告)号:US20170154933A1

    公开(公告)日:2017-06-01

    申请号:US15122197

    申请日:2016-01-06

    IPC分类号: H01L27/32

    CPC分类号: H01L27/3227 H01L27/3248

    摘要: The present invention relates to a display panel and a method for manufacturing the same, and a display device. The display panel includes a display region and a non-display region, wherein a photovoltaic cell component is provided in the non-display region and is used to generate electricity when being irradiated by light. The photovoltaic cell component generates electricity when being irradiated by light, and the electricity can be provided to the display panel for the use of display or other functions, thereby supplementing electricity of the power supply, improving the utilization of energy, and prolonging the endurance time of the display panel in a case where the power supply used for providing electricity to the display panel has limited capacity.

    ARRAY SUBSTRATE AND MANUFACTURING METHOD THEREOF, DISPLAY DEVICE
    6.
    发明申请
    ARRAY SUBSTRATE AND MANUFACTURING METHOD THEREOF, DISPLAY DEVICE 有权
    阵列基板及其制造方法,显示装置

    公开(公告)号:US20160254288A1

    公开(公告)日:2016-09-01

    申请号:US14769761

    申请日:2015-03-19

    IPC分类号: H01L27/12

    摘要: Embodiments of the present invention disclose an array substrate and a manufacturing method thereof, a display device, which relates to the display field, and can increase transmittance of the product, and also has improvement effect to defects such as crosstalk, flicker, etc. An embodiment of the present invention provides an array substrate, comprising: a substrate, a data line, a gate line, a thin film transistor and a pixel electrode formed on the substrate, the thin film transistor comprises a gate insulating layer, a part of the gate insulating layer corresponding to a light-transmissive area of a pixel is removed.

    摘要翻译: 本发明的实施例公开了与显示领域相关的阵列基板及其制造方法,显示装置,并且可以提高产品的透射率,并且还具有对串扰,闪烁等缺陷的改善效果。 本发明的实施例提供了一种阵列基板,包括:基板,数据线,栅极线,薄膜晶体管和形成在基板上的像素电极,薄膜晶体管包括栅极绝缘层,部分 除去与像素的透光性区域对应的栅极绝缘层。

    METHODS AND DEVICES FOR PROCESSING AND RETRIEVING DEFECT INFORMATION OF PRODUCT

    公开(公告)号:US20240094141A1

    公开(公告)日:2024-03-21

    申请号:US17765595

    申请日:2021-04-30

    IPC分类号: G01N21/95

    CPC分类号: G01N21/95 G01N2021/9511

    摘要: The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer. According to this, for the defect information on the current film layer, only the defect information caused by factors of the current film layer may be retained, and the defect information caused by the historical film layers will not be retained, and thus, on the one hand, the stored data volume may be reduced, and on the other hand, the complexity of subsequent analysis of defect information may be simplified.