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公开(公告)号:US20230187182A1
公开(公告)日:2023-06-15
申请号:US17548219
申请日:2021-12-10
Applicant: Applied Materials, Inc.
Inventor: Joseph Frederick Sommers , Joseph Frederick Behnke , Xue Yang Chang , Anwar Husain , Alexander Alhajj Sulyman , Timothy Joseph Franklin , David J. Coumou
CPC classification number: H01J37/32495 , B05D7/58 , B05D1/12 , B05D3/12 , H01J37/32715 , H01J37/32467 , H01J2237/334
Abstract: A method includes depositing a first layer of a first material onto a surface of a chamber component of a processing chamber. The first material comprises a polymer, the polymer having a dielectric strength of at least 40 MV/m. The method further includes depositing a second layer of a second material onto the first layer. The second material comprises a first ceramic material impregnated into the first polymer or a second polymer. The method further includes depositing a third layer. The third layer is of a third material. The third material includes the first ceramic material or a second ceramic material. The third material does not adhere to the first polymer or the second polymer. The third material does adhere to the first ceramic material or the second ceramic material of the second layer.
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公开(公告)号:US11551916B2
公开(公告)日:2023-01-10
申请号:US16853600
申请日:2020-04-20
Applicant: APPLIED MATERIALS, INC.
Inventor: Jaeyong Cho , Rajinder Dhindsa , James Rogers , Anwar Husain
IPC: H01J37/32 , H01L21/683 , H01L21/67
Abstract: Embodiments of substrate supports are provided herein. In some embodiments, a substrate support for use in a substrate processing chamber includes a ceramic plate having a first side configured to support a substrate and a second side opposite the first side, wherein the ceramic plate includes an electrode embedded in the ceramic plate; a ceramic ring disposed about the ceramic plate and having a first side and a second side opposite the first side, wherein the ceramic ring includes a chucking electrode and a heating element embedded in the ceramic ring; and a cooling plate coupled to the second side of the ceramic plate and the second side of the ceramic ring, wherein the cooling plate includes a radially inner portion, a radially outer portion, and a thermal break disposed therebetween.
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公开(公告)号:US20200066566A1
公开(公告)日:2020-02-27
申请号:US16674974
申请日:2019-11-05
Applicant: Applied Materials, Inc.
Inventor: Kartik Ramaswamy , Anwar Husain , Haitao Wang , Evans Yip Lee , Jaeyong Cho , Hamid Noorbakhsh , Kenny L. Doan , Sergio Fukuda Shoji , Chunlei Zhang
IPC: H01L21/683 , H01L21/687
Abstract: Embodiments include an electrostatic chuck assembly having an electrostatic chuck mounted on an insulator. The electrostatic chuck and insulator may be within a chamber volume of a process chamber. In an embodiment, a ground shield surrounds the electrostatic chuck and the insulator, and a gap between the ground shield and the electrostatic chuck provides an environment at risk for electric field emission. A dielectric filler can be placed within the gap to reduce a likelihood of electric field emission. The dielectric filler can have a flexible outer surface that covers or attaches to the electrostatic chuck, or an interface between the electrostatic chuck and the insulator Other embodiments are also described and claimed.
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公开(公告)号:US12198903B2
公开(公告)日:2025-01-14
申请号:US17548219
申请日:2021-12-10
Applicant: Applied Materials, Inc.
Inventor: Joseph Frederick Sommers , Joseph Frederick Behnke , Xue Yang Chang , Anwar Husain , Alexander Alhajj Sulyman , Timothy Joseph Franklin , David J. Coumou
Abstract: A method includes depositing a first layer of a first material onto a surface of a chamber component of a processing chamber. The first material comprises a polymer, the polymer having a dielectric strength of at least 40 MV/m. The method further includes depositing a second layer of a second material onto the first layer. The second material comprises a first ceramic material impregnated into the first polymer or a second polymer. The method further includes depositing a third layer. The third layer is of a third material. The third material includes the first ceramic material or a second ceramic material. The third material does not adhere to the first polymer or the second polymer. The third material does adhere to the first ceramic material or the second ceramic material of the second layer.
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公开(公告)号:US11424096B2
公开(公告)日:2022-08-23
申请号:US16674982
申请日:2019-11-05
Applicant: APPLIED MATERIALS, INC.
Inventor: Hamid Noorbakhsh , Kartik Ramaswamy , Anwar Husain
IPC: H01L21/683 , H01J37/04 , H01J37/32
Abstract: Embodiments of process kits for use in substrate processing chambers are provided herein. In some embodiments, a process kit for use in a substrate processing chamber includes an annular electrode configured to surround an electrostatic chuck, wherein the annular electrode includes an upper portion bonded to a lower portion and an annular channel disposed at an interface between the upper portion and the lower portion; wherein the annular electrode includes a first channel extending from a lower surface of the lower portion to the annular channel and a second channel extending from the lower surface of the lower portion to the annular channel; wherein the annular electrode is configured to flow a coolant from the first channel to the second channel via the annular channel to cool the annular electrode; and wherein the annular electrode includes at least one of a dielectric coating or a ceramic cap to reduce or prevent arcing between the annular electrode and the electrostatic chuck.
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公开(公告)号:US12211734B2
公开(公告)日:2025-01-28
申请号:US17688712
申请日:2022-03-07
Applicant: Applied Materials, Inc.
Inventor: Alexander Sulyman , Carlaton Wong , Rajinder Dhindsa , Timothy Joseph Franklin , Steven Babayan , Anwar Husain , James Hugh Rogers , Xue Yang Chang
IPC: H01L21/67 , H01L21/683 , H01L21/687
Abstract: Methods and apparatus for a lift pin mechanism for substrate processing chambers are provided herein. In some embodiments, the lift pin mechanism includes a lift pin comprising a shaft with a top end, a bottom end, and a coupling end at the bottom end; a bellows assembly disposed about the shaft. The bellows assembly includes an upper bellows flange having an opening for axial movement of the shaft; a bellows having a first end coupled to a lower surface of the upper bellows flange such that the shaft extends into a central volume surrounded by the bellows; and a bellows guide assembly coupled to a second end of the bellows to seal the central volume. The shaft is coupled to the bellows guide assembly at the coupling end. The bellows guide assembly is axially movable to move the lift pin with respect to the upper bellows flange.
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公开(公告)号:US12020977B2
公开(公告)日:2024-06-25
申请号:US17688705
申请日:2022-03-07
Applicant: Applied Materials, Inc.
Inventor: Alexander Sulyman , Anwar Husain , Timothy Joseph Franklin , Carlaton Wong , Xue Yang Chang
IPC: H01L21/687 , H01L21/683
CPC classification number: H01L21/68742 , H01L21/6833 , H01L21/68785
Abstract: Methods and apparatus for lift pin assemblies for substrate processing chambers are provided. In some embodiments, a lift pin assembly includes a lift pin comprising a shaft, a head, and a coupling end, the head configured to rest against an electrostatic chuck; an upper guide comprising a top end, a bottom end, and a first opening extending from the top end to the bottom end, wherein the shaft is disposed and axially movable through the first opening; a lower guide comprising a top end, a bottom end, and a second opening and a third opening extending from the top end to the bottom end, wherein the third opening is larger than the second opening, and wherein the shaft is disposed and axially movable through the second opening and the third opening; and a biasing mechanism coupled to the shaft and configured to bias the lift pin against the electrostatic chuck.
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公开(公告)号:US11551960B2
公开(公告)日:2023-01-10
申请号:US16777877
申请日:2020-01-30
Applicant: APPLIED MATERIALS, INC.
Inventor: Reyn T. Wakabayashi , Hamid Noorbakhsh , Anwar Husain
IPC: H01L21/683 , H01J37/32
Abstract: Embodiments of a plug for use in an electrostatic chuck are provided herein. In some embodiments, a plug for use in an electrostatic chuck includes a polymer sleeve having a central opening; and a core disposed in the central opening of the polymer sleeve, the core having a central protrusion and a peripheral ledge, wherein an outer surface of the core includes a helical channel extending from a lower surface of the core towards the peripheral ledge to at least partially define a gas flow path through the plug, and wherein the peripheral ledge is disposed between an upper surface of the polymer sleeve and the lower surface of the core.
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公开(公告)号:US10930540B2
公开(公告)日:2021-02-23
申请号:US16674974
申请日:2019-11-05
Applicant: Applied Materials, Inc.
Inventor: Kartik Ramaswamy , Anwar Husain , Haitao Wang , Evans Yip Lee , Jaeyong Cho , Hamid Noorbakhsh , Kenny L. Doan , Sergio Fukuda Shoji , Chunlei Zhang
IPC: C23C14/35 , H01L21/683 , H01L21/687
Abstract: Embodiments include an electrostatic chuck assembly having an electrostatic chuck mounted on an insulator. The electrostatic chuck and insulator may be within a chamber volume of a process chamber. In an embodiment, a ground shield surrounds the electrostatic chuck and the insulator, and a gap between the ground shield and the electrostatic chuck provides an environment at risk for electric field emission. A dielectric filler can be placed within the gap to reduce a likelihood of electric field emission. The dielectric filler can have a flexible outer surface that covers or attaches to the electrostatic chuck, or an interface between the electrostatic chuck and the insulator Other embodiments are also described and claimed.
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公开(公告)号:US20180308736A1
公开(公告)日:2018-10-25
申请号:US15495909
申请日:2017-04-24
Applicant: Applied Materials, Inc.
Inventor: Kartik Ramaswamy , Anwar Husain , Haitao Wang , Evans Yip Lee , Jaeyong Cho , Hamid Noorbakhsh , Kenny L. Doan , Sergio Fukuda Shoji , Chunlei Zhang
IPC: H01L21/683
CPC classification number: H01L21/6833 , H01L21/67069
Abstract: Embodiments include an electrostatic chuck assembly having an electrostatic chuck mounted on an insulator. The electrostatic chuck and insulator may be within a chamber volume of a process chamber. In an embodiment, a ground shield surrounds the electrostatic chuck and the insulator, and a gap between the ground shield and the electrostatic chuck provides an environment at risk for electric field emission. A dielectric filler can be placed within the gap to reduce a likelihood of electric field emission. The dielectric filler can have a flexible outer surface that covers or attaches to the electrostatic chuck, or an interface between the electrostatic chuck and the insulator Other embodiments are also described and claimed.
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