BARRIER MATERIALS FOR DISPLAY DEVICES
    3.
    发明申请
    BARRIER MATERIALS FOR DISPLAY DEVICES 审中-公开
    用于显示设备的障碍物

    公开(公告)号:US20150021599A1

    公开(公告)日:2015-01-22

    申请号:US14383723

    申请日:2013-03-08

    Abstract: Described herein are apparatus comprising one or more silicon-containing layers and a metal oxide layer. Also described herein are methods for forming one or more silicon-containing layers to be used, for example, as passivation layers in a display device. In one particular aspect, the apparatus comprises a transparent metal oxide layer, a silicon oxide layer and a silicon nitride layer. In this or other aspects, the apparatus is deposited at a temperature of 350° C. or below. The silicon-containing layers described herein comprise one or more of the following properties: a density of about 1.9 g/cm3 or greater; a hydrogen content of about 4×1022 cm−3 or less, and a transparency of about 90% or greater at 400-700 nm as measured by a UV-visible light spectrometer.

    Abstract translation: 本文描述的是包括一个或多个含硅层和金属氧化物层的装置。 本文还描述了用于形成一个或多个待使用的含硅层的方法,例如作为显示装置中的钝化层。 在一个具体方面,该装置包括透明金属氧化物层,氧化硅层和氮化硅层。 在这个或其它方面,该装置在350℃或更低的温度下沉积。 本文所述的含硅层包含以下特性中的一种或多种:约1.9g / cm 3或更大的密度; 约4×1022cm-3或更低的氢含量,以及通过紫外 - 可见光光谱仪测量的400-700nm的透明度为约90%以上。

    Methods for Depositing Silicon Nitride Films
    9.
    发明申请
    Methods for Depositing Silicon Nitride Films 有权
    沉积氮化硅薄膜的方法

    公开(公告)号:US20150099375A1

    公开(公告)日:2015-04-09

    申请号:US14498044

    申请日:2014-09-26

    Abstract: Described herein are methods for forming silicon nitride films. In one aspect, there is provided a method of forming a silicon nitride film comprising the steps of: providing a substrate in a reactor; introducing into the reactor an at least one organoaminosilane having a least one SiH3 group described herein wherein the at least one organoaminosilane reacts on at least a portion of the surface of the substrate to provide a chemisorbed layer; purging the reactor with a purge gas; introducing a plasma comprising nitrogen and an inert gas into the reactor to react with at least a portion of the chemisorbed layer and provide at least one reactive site wherein the plasma is generated at a power density ranging from about 0.01 to about 1.5 W/cm2.

    Abstract translation: 这里描述了形成氮化硅膜的方法。 在一个方面,提供一种形成氮化硅膜的方法,包括以下步骤:在反应器中提供衬底; 向反应器中引入至少一种本文所述的至少一种具有至少一个SiH 3基团的有机氨基硅烷,其中所述至少一种有机氨基硅烷在所述基材的至少一部分表面上反应以提供化学吸附层; 用吹扫气净化反应器; 将包含氮气和惰性气体的等离子体引入反应器中以与化学吸附层的至少一部分反应并提供至少一个反应性位点,其中以约0.01至约1.5W / cm 2的功率密度产生等离子体。

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