摘要:
A resist composition including a base component (A) which exhibits changed solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the acid-generator component (B) including an acid generator (B1) represented by general formula (b1-1) shown below (in the formula, RX represents a divalent aliphatic group of 3 to 20 carbon atoms; RY represents a monovalent aliphatic group of 3 to 20 carbon atoms having —C(═O)—O— or —S(═O)2—; each of R1 and R2 independently represents a divalent linking group; and Z+ represents a monovalent organic cation).
摘要翻译:一种抗蚀剂组合物,其包含在酸的作用下在碱性显影液中溶解度变化的碱成分(A)和曝光时产生酸的酸发生剂成分(B),所述酸发生剂成分(B)含有酸发生剂 (b1)表示的通式(b1-1)(式中,RX表示碳原子数3〜20的2价脂肪族基团; RY表示碳原子数3〜20的1价脂肪族基团,具有-C(= 0) )-O-或-S(= O)2 - ; R 1和R 2各自独立地表示二价连接基团; Z +表示一价有机阳离子)。
摘要:
A resist composition which can form a very fine resist pattern with excellent lithography properties, a new polymeric compound useful for the resist composition, and a compound useful as a monomer for the polymeric compound. The resist composition contains a polymeric compound containing a structural unit (a0) represented by general formula (a0) shown below. In the formula (a0), A is an anion represented by the general formula (1) or (2).
摘要:
A resist composition including a base component (A) which exhibits changed solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the acid-generator component (B) including an acid generator (B1) represented by general formula (b1-1) shown below (in the formula, RX represents a divalent aliphatic group of 3 to 20 carbon atoms; RY represents a monovalent aliphatic group of 3 to 20 carbon atoms having —C(═O)—O— or —S(═O)2—; each of R1 and R2 independently represents a divalent linking group; and Z+ represents a monovalent organic cation).
摘要翻译:一种抗蚀剂组合物,其包含在酸的作用下在碱性显影液中溶解度变化的碱成分(A)和曝光时产生酸的酸发生剂成分(B),所述酸发生剂成分(B)含有酸发生剂 (b1)表示的通式(b1-1)(式中,RX表示碳原子数3〜20的2价脂肪族基团; RY表示碳原子数3〜20的1价脂肪族基团,具有-C(= 0) )-O-或-S(= O)2 - ; R 1和R 2各自独立地表示二价连接基团; Z +表示一价有机阳离子)。
摘要:
A resist composition which can form a very fine resist pattern with excellent lithography properties, a new polymeric compound useful for the resist composition, and a compound useful as a monomer for the polymeric compound. The resist composition contains a polymeric compound containing a structural unit (a0) represented by general formula (a0) shown below. In the formula (a0), A is an anion represented by the general formula (1) or (2).
摘要:
A resist composition including: a base component which exhibits changed solubility in an alkali developing solution under the action of acid; and an acid-generator component containing an acid generator (B1) consisting of a compound represented by general formula (b1); dissolved in an organic solvent containing an alcohol-based organic solvent having a boiling point of at least 150° C., wherein R7″ to R9″ represents an aryl group or an alkyl group, provided that at least one of R7″ to R9″ represents a substituted aryl group which has been substituted with a group represented by the formula: —O—R70 (R70 represents an organic group), and two of R7″ to R9″ may be mutually bonded to form a ring with the sulfur atom; X represents a hydrocarbon group of 3 to 30 carbon atoms; Q1 represents a divalent linking group containing an oxygen atom; and Y1 represents an alkylene group of 1 to 4 carbon atoms or a fluorinated alkylene group of 1 to 4 carbon atoms.