HEAT TRANSPORT DEVICE, ELECTRONIC APPARATUS, AND HEAT TRANSPORT MANUFACTURING METHOD
    1.
    发明申请
    HEAT TRANSPORT DEVICE, ELECTRONIC APPARATUS, AND HEAT TRANSPORT MANUFACTURING METHOD 审中-公开
    热输送装置,电子装置和热运输制造方法

    公开(公告)号:US20100252237A1

    公开(公告)日:2010-10-07

    申请号:US12729713

    申请日:2010-03-23

    IPC分类号: F28D15/00

    摘要: A heat transport device includes a working fluid, an evaporation portion, a condenser portion, a flow path portion, a concave portion, and a protrusion portion. The evaporation portion causes the working fluid to evaporate from a liquid phase to a vapor phase. The condenser portion communicates with the evaporation portion, and causes the working fluid to condense from the vapor phase to the liquid phase. The flow path portion causes the working fluid condensed in the condenser portion to the liquid phase to flow to the evaporation portion. The concave portion is provided on at least one of the evaporation portion and the flow path portion, in which the liquid-phase working fluid flows. The protrusion portion is made of nanomaterial protruding from an inner wall side surface of the concave portion such that the protrusion portion partially covers an opening surface of the concave portion.

    摘要翻译: 热传输装置包括工作流体,蒸发部,冷凝器部,流路部,凹部和突出部。 蒸发部分使工作流体从液相蒸发成气相。 冷凝器部与蒸发部连通,使工作流体从气相冷凝成液相。 流路部使冷凝部冷凝的液相流向蒸发部。 凹部设置在液相工作流体流过的蒸发部和流路部中的至少一个上。 突出部分由从凹部的内壁侧表面突出的纳米材料制成,使得突出部分部分地覆盖凹部的开口表面。

    Electron Beam Holography Observation Apparatus
    2.
    发明申请
    Electron Beam Holography Observation Apparatus 有权
    电子束全息观测仪

    公开(公告)号:US20080067375A1

    公开(公告)日:2008-03-20

    申请号:US11746096

    申请日:2007-05-09

    IPC分类号: G21K7/00

    摘要: In electron holography observation using a transmission electron microscope, searching of conditions of an electron optical condition which are necessary for realizing a requested spatial resolution is sophisticated and for persons unaccustomed to operation of the electron microscope, the observation is time consuming work. In addition to the fundamental electron microscope proper, an input unit for inputting a spatial resolution requested in the holography observation, a calculation unit for calculating positions of electron biprism and specimen necessary for realizing the requested spatial resolution from the inputted value and parameters characteristic of the device and mechanisms for moving the two positions for realizing the obtained calculation results are provided.

    摘要翻译: 在使用透射电子显微镜的电子全息观察中,为了实现所要求的空间分辨率而需要搜索电子光学条件的条件是复杂的,对于不习惯电子显微镜操作的人,观察是耗时的工作。 除了基本电子显微镜本身之外,输入单元用于输入在全息图观察中要求的空间分辨率,计算单元,用于根据输入的值和参数特性来计算实现所请求的空间分辨率所需的电子双棱镜和样本的位置 提供了用于移动两个位置以实现所获得的计算结果的装置和机构。

    MEMS device and methods for manufacturing thereof, light modulation device, GLV device and methods for manufacturing thereof, and laser display
    3.
    发明授权
    MEMS device and methods for manufacturing thereof, light modulation device, GLV device and methods for manufacturing thereof, and laser display 失效
    MEMS器件及其制造方法,光调制器件,GLV器件及其制造方法以及激光显示器

    公开(公告)号:US07102808B2

    公开(公告)日:2006-09-05

    申请号:US10474959

    申请日:2003-02-17

    申请人: Hiroto Kasai

    发明人: Hiroto Kasai

    IPC分类号: G02B26/00

    摘要: The present invention provides a MEMS device and methods for manufacturing thereof, in which planarizing the surface of a beam and improving performance of the MEMS device are aimed. In addition, the present invention provides a light modulation device and a GLV device in which this MEMS device is used, and methods for manufacturing thereof; and further, a laser display using this GLV device. According to the present invention, a MEMS device includes a substrate side electrode and a beam that is disposed so as to oppose the substrate side electrode and is driven by electrostatic attraction force or electrostatic repulsion force that acts between the substrate side electrode and the driving side electrode, with the substrate side electrode being formed of a single-crystalline semiconductor layer.

    摘要翻译: 本发明提供了MEMS器件及其制造方法,其目的在于平坦化束的表面并提高MEMS器件的性能。 另外,本发明提供一种使用该MEMS装置的光调制装置和GLV装置及其制造方法, 此外,使用该GLV装置的激光显示器。 根据本发明,MEMS器件包括基板侧电极和与基板侧电极相对设置并由作用在基板侧电极和驱动侧之间的静电吸引力或静电排斥力驱动的光束 电极,其中基板侧电极由单晶半导体层形成。

    Phase plate and electron microscope
    4.
    发明授权
    Phase plate and electron microscope 有权
    相板和电子显微镜

    公开(公告)号:US09208990B2

    公开(公告)日:2015-12-08

    申请号:US14129261

    申请日:2012-05-22

    摘要: Provided is a phase plate for use in an electron microscope which lessens the problem of image information loss caused by interruption of an electron beam and ameliorates the problem of anisotropic potential distributions. This phase plate comprises openings (23) connected into a single opening, and multiple electrodes (11) arranged in the opening from the outer portion of the opening towards the center of the opening. The cross sections of the electrodes (11) are configured such that a voltage application layer (24) comprising a conductor or a semiconductor is covered by a shield layer comprising a conductor or a semiconductor with an intermediate insulating layer. By this means, this phase plate is capable of lessening electron beam interruption due to the electrodes (11), and of ameliorating the problem of anisotropic potential distributions.

    摘要翻译: 提供一种用于电子显微镜的相位板,其减少了由电子束的中断引起的图像信息损失的问题,并且改善了各向异性势分布的问题。 该相板包括连接到单个开口中的开口(23)和从开口的外部部分朝向开口的中心布置在开口中的多个电极(11)。 电极(11)的横截面被构造成使得包括导体或半导体的电压施加层(24)被包括具有中间绝缘层的导体或半导体的屏蔽层覆盖。 通过这种方式,该相位板能够减少由于电极(11)引起的电子束中断,并且能够改善各向异性势分布的问题。

    PHASE PLATE AND ELECTRON MICROSCOPE
    5.
    发明申请
    PHASE PLATE AND ELECTRON MICROSCOPE 有权
    相片和电子显微镜

    公开(公告)号:US20140224988A1

    公开(公告)日:2014-08-14

    申请号:US14129261

    申请日:2012-05-22

    IPC分类号: H01J37/147 H01J37/26

    摘要: Provided is a phase plate for use in an electron microscope which lessens the problem of image information loss caused by interruption of an electron beam and ameliorates the problem of anisotropic potential distributions. This phase plate comprises openings (23) connected into a single opening, and multiple electrodes (11) arranged in the opening from the outer portion of the opening towards the center of the opening. The cross sections of the electrodes (11) are configured such that a voltage application layer (24) comprising a conductor or a semiconductor is covered by a shield layer comprising a conductor or a semiconductor with an intermediate insulating layer. By this means, this phase plate is capable of lessening electron beam interruption due to the electrodes (11), and of ameliorating the problem of anisotropic potential distributions.

    摘要翻译: 提供一种用于电子显微镜的相位板,其减少了由电子束的中断引起的图像信息损失的问题,并且改善了各向异性势分布的问题。 该相板包括连接到单个开口中的开口(23)和从开口的外部部分朝向开口的中心布置在开口中的多个电极(11)。 电极(11)的横截面被构造成使得包括导体或半导体的电压施加层(24)被包括具有中间绝缘层的导体或半导体的屏蔽层覆盖。 通过这种方式,该相位板能够减少由于电极(11)引起的电子束中断,并且能够改善各向异性势分布的问题。

    HEAT TRANSPORT DEVICE AND METHOD FOR MANUFACTURING THE SAME
    6.
    发明申请
    HEAT TRANSPORT DEVICE AND METHOD FOR MANUFACTURING THE SAME 审中-公开
    热输送装置及其制造方法

    公开(公告)号:US20100307722A1

    公开(公告)日:2010-12-09

    申请号:US12792347

    申请日:2010-06-02

    IPC分类号: F28D15/00 B23K31/02

    CPC分类号: F28D15/046 F28D15/0233

    摘要: A method of manufacturing a heat transport device including the steps of stacking a first plate, a capillary member, and a second plate by interposing the capillary member between the first plate and the second plate, the first plate and the second plate constituting a container of a heat transport device configured to transport heat using phase change in a working fluid; and diffusion-bonding the first plate and the second plate while deforming the second plate to create an internal space in the container for storing the capillary member.

    摘要翻译: 一种制造热输送装置的方法,包括以下步骤:通过将毛细管构件插入第一板和第二板之间来堆叠第一板,毛细管构件和第二板,第一板和第二板构成容器 配置为使用工作流体中的相变来运送热量的热传输装置; 以及在使所述第二板变形的同时扩散接合所述第一板和所述第二板,以在所述容器中形成用于存储所述毛细管构件的内部空间。

    Electron beam interference device and electron beam interferometry
    7.
    发明授权
    Electron beam interference device and electron beam interferometry 有权
    电子束干涉装置和电子束干涉测量

    公开(公告)号:US08946628B2

    公开(公告)日:2015-02-03

    申请号:US13810934

    申请日:2012-02-03

    摘要: There is a limit in range and distance in which an electron beam can interfere and electron interference is implemented within a range of a coherence length. Therefore, interference images are consecutively recorded for each interference region width from an interference image of a reference wave and an observation region adjacent to the reference wave by considering that a phase distribution regenerated and observed by an interference microscopy is a differential between phase distributions of two waves used for interference and a differential image between phase distributions of a predetermined observation region and a predetermined reference wave is acquired by acquiring integrating phase distributions acquired by individually regenerating the interference images. This work enables a wide range of interference image which is more than a coherence length by arranging phase distribution images performed and acquired in the respective phase distributions in a predetermined order.

    摘要翻译: 电子束可能干扰的范围和距离有限制,并且在相干长度的范围内实现电子干扰。 因此,通过考虑到由干涉显微镜再生和观测到的相位分布是两相的相位分布之间的差分,从参考波的干涉图像和与参考波相邻的观察区域的每个干涉区域宽度连续记录干涉图像 通过获取通过单独再生干涉图像获得的积分相位分布来获取用于干扰的波和预定观察区域和预定参考波的相位分布之间的差分图像。 通过以预定的顺序排列在各个相位分布中执行和获取的相位分布图像,能够实现大于相干长度的宽范围的干涉图像。

    HEAT TRANSPORTATION DEVICE PRODUCTION METHOD AND HEAT TRANSPORTATION DEVICE
    8.
    发明申请
    HEAT TRANSPORTATION DEVICE PRODUCTION METHOD AND HEAT TRANSPORTATION DEVICE 审中-公开
    热运输装置生产方法和热运输装置

    公开(公告)号:US20110253345A1

    公开(公告)日:2011-10-20

    申请号:US13141121

    申请日:2009-12-11

    IPC分类号: F28D15/04

    摘要: [Object] To provide a low-cost production method for a heat transportation device with which efficient production with a small number of steps is possible.[Solving Means] A capillary member (5) having a larger thickness than a frame member (2) is mounted on an inner surface (11) of a lower plate member (1). Subsequently, the frame member (2) is mounted on the inner surface (11) of the lower plate member (1), and an upper plate member (3) is mounted on the capillary member (5). Due to a difference between the thickness of the capillary member (5) and the thickness of the frame member (2), a squashing amount (G) is provided between the frame member (2) and the upper plate member (3). Then, the lower plate member (1) and the upper plate member (3) are diffusion-bonded with the frame member (2). At this time, the capillary member (5) is compressed by an amount corresponding to the squashing amount (G). Since the capillary member (5) has elasticity, a pressure (P) is partially absorbed, and a pressure (P′) smaller than the pressure (P) is applied to the lower plate member (1) from the capillary member (5). By the pressure (P′), the inner surface (11) of the lower plate member (1) and the capillary member (5) are diffusion-bonded.

    摘要翻译: 本发明提供一种低成本的用于具有少量步骤的有效生产的热运输装置的生产方法。 [解决方案]具有比框架构件(2)更大的厚度的毛细管构件(5)安装在下板构件(1)的内表面(11)上。 随后,将框架构件(2)安装在下板构件(1)的内表面(11)上,并将上板构件(3)安装在毛细管构件(5)上。 由于毛细构件(5)的厚度和框架构件(2)的厚度之间的差异,在框架构件(2)和上板构件(3)之间设置有挤压量(G)。 然后,下板构件(1)和上板构件(3)与框架构件(2)扩散接合。 此时,毛细管构件(5)被压缩相当于挤压量(G)的量。 由于毛细管构件(5)具有弹性,部分地吸收压力(P),并且从毛细管构件(5)向下板构件(1)施加小于压力(P)的压力(P'), 。 通过压力(P'),下板构件(1)的内表面(11)和毛细管构件(5)是扩散粘合的。

    Electron beam device
    10.
    发明授权
    Electron beam device 有权
    电子束装置

    公开(公告)号:US07923685B2

    公开(公告)日:2011-04-12

    申请号:US12324937

    申请日:2008-11-28

    IPC分类号: H01J37/04

    摘要: A multi-biprism electron interferometer is configured so as to arrange a plurality of biprisms in an imaging optical system of a specimen. An upper electron biprism is arranged upstream of the specimen in the traveling direction of the electron beam, and an image of the electron biprism is formed on the specimen (object plane) using an imaging action of a pre-field of the objective lens. A double-biprism interference optical system is constructed of a lower electron biprism disposed downstream of the objective lens up to the first image plane of the specimen.

    摘要翻译: 多双棱镜电子干涉仪被配置为在样本的成像光学系统中布置多个双棱镜。 在电子束的行进方向上,在样本的上游设置上部电子双棱镜,并且使用物镜的前场的成像动作在被检体(物体面)上形成电子双棱镜的图像。 双二棱镜干涉光学系统由设置在物镜的下游直到样品的第一像面的较低电子双棱镜构成。