Lithographic apparatus and device manufacturing method
    4.
    发明申请
    Lithographic apparatus and device manufacturing method 有权
    平版印刷设备和器件制造方法

    公开(公告)号:US20060158626A1

    公开(公告)日:2006-07-20

    申请号:US11298942

    申请日:2005-12-12

    CPC classification number: G03F9/7023 G03F7/70341 G03F7/70883

    Abstract: A method for correcting an exposure parameter of an immersion lithographic apparatus is provided. In the method, an exposure parameter is measured using a measuring beam projected through a liquid between the projection system and a substrate table of the immersion lithographic apparatus and offset is determined based on a change of a physical property impacting a measurement made using the measuring beam to at least partly correct the measured exposure parameter. Also, there is provided an apparatus and method to measure a height of an optical element connected to liquid between the projection system and the substrate table in the immersion lithographic apparatus.

    Abstract translation: 提供了一种用于校正浸没式光刻设备的曝光参数的方法。 在该方法中,使用通过投影系统和浸没式光刻设备的衬底台之间的液体投影的测量光束来测量曝光参数,并且基于影响使用测量光束进行的测量的物理性质的变化来确定偏移 至少部分地校正测量的曝光参数。 此外,提供了一种用于在浸没式光刻设备中测量连接到投影系统和基板台之间的液体的光学元件的高度的装置和方法。

    Prewetting of substrate before immersion exposure
    5.
    发明申请
    Prewetting of substrate before immersion exposure 有权
    浸渍前预浸底物

    公开(公告)号:US20060121209A1

    公开(公告)日:2006-06-08

    申请号:US11005219

    申请日:2004-12-07

    CPC classification number: G03F7/70341

    Abstract: A lithographic projection apparatus includes a support structure configured to hold a patterning device. The patterning device is configured to pattern a beam of radiation according to a desired pattern. The lithographic apparatus further includes a substrate table configured to hold a substrate. The substrate has a surface coated at least partially with a layer of radiation sensitive material. The lithographic apparatus also includes a projection system configured to project the patterned beam onto a target portion of the substrate, and a liquid supply system. The liquid supply system is configured to supply a prewetting liquid on top of the layer of radiation sensitive material to prewet the substrate, and is configured to supply an immersion liquid in a space between the prewet substrate and at least a portion of the projection system.

    Abstract translation: 光刻投影装置包括构造成保持图案形成装置的支撑结构。 图案形成装置被配置成根据期望的图案对辐射束进行图案化。 光刻设备还包括被配置为保持衬底的衬底台。 衬底具有至少部分地涂覆有辐射敏感材料层的表面。 光刻设备还包括配置成将图案化的光束投影到基板的目标部分上的投影系统和液体供应系统。 液体供应系统被配置为在辐射敏感材料层的顶部上提供预润湿液体以预润湿基底,并且被配置为在预润湿基底和至少一部分投影系统之间的空间中提供浸没液体。

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