Inspection method and apparatus, lithographic apparatus, lithographic processing cell, and device manufacturing method to measure a property of a substrate
    6.
    发明授权
    Inspection method and apparatus, lithographic apparatus, lithographic processing cell, and device manufacturing method to measure a property of a substrate 失效
    检测方法和装置,光刻设备,光刻处理单元和测量基板性质的器件制造方法

    公开(公告)号:US08115926B2

    公开(公告)日:2012-02-14

    申请号:US12256780

    申请日:2008-10-23

    IPC分类号: G01J4/00

    摘要: A system is configured to measure two separately polarized beams upon diffraction from a substrate in order to determine properties of the substrate. Circularly or elliptically polarized light sources are passed via a fixed phase retarder in order to change the phase of one of two orthogonally polarized radiation beams with respect to the two beams. The relative phases of the two radiation beams and other features of the beams are measured in a detector to provide information on the properties of the substrate surface.

    摘要翻译: 系统被配置为在从基板衍射时测量两个分离的偏振光束,以便确定衬底的性质。 圆形或椭圆偏振光源通过固定相位延迟器传递,以改变相对于两个光束的两个正交偏振辐射束之一的相位。 在检测器中测量两个辐射束的相对相位和光束的其它特征以提供关于衬底表面的性质的信息。

    Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
    9.
    发明授权
    Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method 有权
    检测方法和装置,光刻设备,光刻处理单元和器件制造方法

    公开(公告)号:US07701577B2

    公开(公告)日:2010-04-20

    申请号:US11708678

    申请日:2007-02-21

    IPC分类号: G01J4/00

    摘要: The present invention refers to the simultaneous measurement of four separately polarized beams upon diffraction from a substrate in order to determine properties of the substrate. Circularly or elliptically polarized light sources are passed via up to three polarizing elements. This polarizes the light sources by 0, 45, 90 and 135°. The plurality of polarizing beamsplitters replaces the use of a phase modulator, but enables the measurement of the intensity of all four beams and thus the measurement of the phase modulation and amplitude of the combined beams to give the features of the substrate.

    摘要翻译: 本发明涉及从衬底衍射时同时测量四个分离的偏振光束,以便确定衬底的性质。 圆形或椭圆偏振光源最多通过三个偏振元件。 这使光源偏振0°,45°,90°和135°。 多个偏振分束器取代了相位调制器的使用,但是能够测量所有四个光束的强度,从而测量组合光束的相位调制和幅度,以给出基板的特征。

    Stationary and dynamic radial transverse electric polarizer for high numerical aperture systems
    10.
    发明授权
    Stationary and dynamic radial transverse electric polarizer for high numerical aperture systems 有权
    用于高数值孔径系统的静态和动态径向横向电偏振器

    公开(公告)号:US07221501B2

    公开(公告)日:2007-05-22

    申请号:US11106480

    申请日:2005-04-15

    IPC分类号: G02B5/30 G02B27/28 G02B27/72

    CPC分类号: G03F7/70566 G02B5/3058

    摘要: A radial transverse electric polarizer device is provided. The device includes a first layer of material having a first refractive index, a second layer of material having a second refractive index, and a plurality of elongated elements azimuthally and periodically spaced apart, and disposed between the first layer and the second layer. The plurality of elongated elements interact with electromagnetic waves of radiation to transmit transverse electric polarization of electromagnetic waves of radiation. One aspect of the invention is, for example, to use such polarizer device in a lithographic projection apparatus to increase imaging resolution. Another aspect is to provide a device manufacturing method including polarizing a beam of radiation in a transverse electric polarization.

    摘要翻译: 提供径向横向电偏振器装置。 该器件包括具有第一折射率的第一材料层,具有第二折射率的第二材料层和位于方位角和周期上间隔开的多个细长元件,并且设置在第一层和第二层之间。 多个细长元件与辐射的电磁波相互作用以透射辐射的电磁波的横向电极化。 本发明的一个方面是例如在光刻投影设备中使用这种偏振器装置来增加成像分辨率。 另一方面是提供一种包括在横向电极化中偏振辐射束的装置制造方法。