Abstract:
A semiconductor memory device of the invention comprises a memory cell array which includes a first region that has a plurality of memory cells each capable of storing n-bit data (n is a natural number) and a second region that has a plurality of memory cells each capable of storing k-bit data (k>n: k is a natural number), a data storage circuit which includes a plurality of data caches, and a control circuit which controls the memory cell array and the data storage circuit in such a manner that the k-bit data read from the k/n number of memory cells in the first region are stored into the data storage circuit and the k-bit data are stored into the memory cells in the second region.
Abstract:
A non-volatile semiconductor device has a memory cell array having electrically erasable programmable non-volatile memory cells, reprogramming and retrieval circuits that temporarily store data to be programmed in the memory cell array and sense data retrieved from the memory cell array. Each reprogramming and retrieval circuit has first and second latches that are selectively connected to the memory cell array and transfer data. A controller controls the reprogramming and retrieval circuits on a data-reprogramming operation to and a data-retrieval operation from the memory cell array. Each reprogramming and retrieval circuit has a multilevel logical operation mode and a caching operation mode. In the multilevel logical operation mode, re-programming and retrieval of upper and lower bits of two-bit four-level data is performed using the first and the second latches to store the two-bit four-level data in one of the memory cells in a predetermined threshold level range. In the caching operation mode, data transfer between one of the memory cells selected in accordance with a first address and the first latch is performed while data transfer is performed between the second latch and input/output terminals in accordance with a second address with respect to one-bit two-level data to be stored in one of the memory cells.
Abstract:
A semiconductor memory device of the invention comprises a memory cell array which includes a first region that has a plurality of memory cells each capable of storing n-bit data (n is a natural number) and a second region that has a plurality of memory cells each capable of storing k-bit data (k>n: k is a natural number), a data storage circuit which includes a plurality of data caches, and a control circuit which controls the memory cell array and the data storage circuit in such a manner that the k-bit data read from the k/n number of memory cells in the first region are stored into the data storage circuit and the k-bit data are stored into the memory cells in the second region.
Abstract:
Data having three values or more is stored in a memory cell in a nonvolatile manner. A data circuit has a plurality of storage circuits. One of the plurality of storage circuits is a latch circuit. Another one of the plurality of storage circuits is a capacitor. The latch circuit and the capacitor function to temporarily store program/read data having two bits or more. Data held by the capacitor is refreshed using the latch circuit if data variation due to leakage causes a program. As a result, the data circuit does not become large in size even if multi-level data is used.
Abstract:
A plurality of memory cells are arranged in a memory cell array. The plurality of memory cells are connected to a plurality of word lines and a plurality of bit lines. A plurality of source lines are disposed along the plurality of bit lines. The plurality of source lines are connected respectively to sources of the plurality of memory cells at a time of data read.
Abstract:
A portion of a nonvolatile memory is partitioned from a main multi-level memory array to operate as a cache. The cache memory is configured to store at less capacity per memory cell and finer granularity of write units compared to the main memory. In a block-oriented memory architecture, the cache has multiple functions, not merely to improve access speed, but is an integral part of a sequential update block system. Decisions to write data to the cache memory or directly to the main memory depend on the attributes and characteristics of the data to be written, the state of the blocks in the main memory portion and the state of the blocks in the cache portion.
Abstract:
Data having three values or more is stored in a memory cell in a nonvolatile manner. A data circuit has a plurality of storage circuits. One of the plurality of storage circuits is a latch circuit. Another one of the plurality of storage circuits is a capacitor. The latch circuit and the capacitor function to temporarily store program/read data having two bits or more. Data held by the capacitor is refreshed using the latch circuit if data variation due to leakage causes a program. As a result, the data circuit does not become large in size even if multi-level data is used.
Abstract:
A nonvolatile memory system includes a host system, a memory controller, and a flash memory chip including multi-level flash memory cells. The memory controller includes a backup memory adapted to store a backup copy of previously programmed data from the multi-level flash memory cells when further programming of the multi-level flash memory cells fails. The backup copy of the previously programmed data is used to detect and correct any errors in the previously programmed data before reprogramming the previously programmed data to different multi-level memory cells in the nonvolatile memory system.
Abstract:
A cache programming operation which requires 2 SRAMs (one for the user and one for the array) may be combined with a multi-level cell (MLC) programming operation which also requires 2 SRAMs (one for caching the data and one for verifying the data), using only a total of two SRAMs (or buffers). One of the buffers (User SRAM) receives and stores user data. The other of the two buffers (Cache SRAM) may perform a caching function as well as a verify function. In this manner, if a program operation fails, the user can have its original data back so that he can try to reprogram it to a different place (address).
Abstract:
A non-volatile memory and methods includes cached page copying using a minimum number of data latches for each memory cell. Multi-bit data is read in parallel from each memory cell of a group associated with a first word line. The read data is organized into multiple data-groups for shuttling out of the memory group-by-group according to a predetermined order for data-processing. Modified data are returned for updating the respective data group. The predetermined order is such that as more of the data groups are processed and available for programming, more of the higher programmed states are decodable. An adaptive full-sequence programming is performed concurrently with the processing. The programming copies the read data to another group of memory cells associated with a second word line, typically in a different erase block and preferably compensated for perturbative effects due to a word line adjacent the first word line.