ESL TFT substrate structure and manufacturing method thereof

    公开(公告)号:US09960276B2

    公开(公告)日:2018-05-01

    申请号:US14764169

    申请日:2015-06-23

    发明人: Wenhui Li

    摘要: The present invention provides an ESL TFT substrate structure and a manufacturing method thereof. In the ESL TFT substrate structure, an etch stop layer (5) includes a first via (51) and a second via (52) formed therein to correspond to two side portions of an oxide semiconductor layer (4). A drain terminal (6) is set in engagement with the oxide semiconductor layer (4) through the first via (51). A passivation protection layer (7) includes a through hole (72) formed therein to extend to and communicate with the second via (52). An electrode layer (8) is formed on the passivation protection layer (7) and has a side portion that is adjacent to the drain terminal (6) and is set in engagement with the oxide semiconductor layer (4) through the through hole (72) and the second via (52) to form a source terminal (81) and an opposite side portion that is extended in a direction away from the drain terminal (6) to form a pixel electrode (82). The ESL TFT substrate structure has a reduced channel length so as to provide the TFT with excellent electrical conduction performance and also to reduce the size of the TFT thereby increasing an aperture ratio of pixels and reducing difficult of pixel design.

    Method for manufacturing TFT backplane and structure of TFT backplane

    公开(公告)号:US09960195B2

    公开(公告)日:2018-05-01

    申请号:US14390025

    申请日:2014-08-15

    IPC分类号: H01L27/12

    CPC分类号: H01L27/127 H01L27/1225

    摘要: The present invention provides method for manufacturing a TFT backplane and a structure of a TFT backplane. The method includes (1) forming a gate terminal (2) and a first metal electrode M1 on a substrate (1); (2) sequentially forming a gate insulation layer (3), a semiconductor layer, and an etch stop layer on the gate terminal (2), the first metal electrode M1, and the substrate (1) in a successive manner and applying a photolithographic operation to form an island-like semiconductor layer (4) and an island-like etch stop layer (5); (3) applying a photolithographic operation to patternize the island-like etch stop layer (5) and the gate insulation layer (3) to form a plurality of etch stop layer vias (51) and a gate insulation layer via (31); (4) forming source/drain terminals (6) and a second metal electrode M2; (5) forming a passivation protection layer (7); (6) forming a planarization layer (8); (7) forming a pixel electrode layer (9); (8) forming a pixel definition layer (10); and (9) forming a spacer pillar (11).

    Manufacturing method and structure of oxide semiconductor TFT substrate

    公开(公告)号:US09793411B2

    公开(公告)日:2017-10-17

    申请号:US14426989

    申请日:2014-09-19

    发明人: Wenhui Li

    IPC分类号: H01L29/786 H01L29/66

    摘要: The present invention provides a manufacturing method and a structure of an oxide semiconductor TFT substrate, in which an oxide conductor layer is used to define a channel and a source terminal of an oxide semiconductor TFT substrate. Since the oxide conductor layer is relatively thin and compared to the known techniques, the width of the channel can be made smaller and the width of the channel can be controlled precisely, the difficult of the manufacturing process of the oxide semiconductor TFT substrate can be reduced and the performance of the oxide semiconductor TFT substrate can be enhanced and the yield rate of manufacture can be increased. In a structure of an oxide semiconductor TFT substrate manufactured with the present invention, since the oxide conductor layer and the oxide semiconductor layer are similar in structural composition, excellent ohmic contact can be formed; the oxide semiconductor layer has better capability of inclining upward and the oxide conductor does not cause metal ion contamination in the oxide semiconductor layer; and the oxide conductor is transparent so as to help increase aperture ratio.

    ESL TFT SUBSTRATE STRUCTURE AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20170141238A1

    公开(公告)日:2017-05-18

    申请号:US14764169

    申请日:2015-06-23

    发明人: Wenhui Li

    摘要: The present invention provides an ESL TFT substrate structure and a manufacturing method thereof. In the ESL TFT substrate structure, an etch stop layer (5) includes a first via (51) and a second via (52) formed therein to correspond to two side portions of an oxide semiconductor layer (4). A drain terminal (6) is set in engagement with the oxide semiconductor layer (4) through the first via (51). A passivation protection layer (7) includes a through hole (72) formed therein to extend to and communicate with the second via (52). An electrode layer (8) is formed on the passivation protection layer (7) and has a side portion that is adjacent to the drain terminal (6) and is set in engagement with the oxide semiconductor layer (4) through the through hole (72) and the second via (52) to form a source terminal (81) and an opposite side portion that is extended in a direction away from the drain terminal (6) to form a pixel electrode (82). The ESL TFT substrate structure has a reduced channel length so as to provide the TFT with excellent electrical conduction performance and also to reduce the size of the TFT thereby increasing an aperture ratio of pixels and reducing difficult of pixel design.