Abstract:
A sensor system includes an electrical circuit having plural leads coupled with one or more sensing regions. The sensing regions include gaps having sensing materials that detect an analyte of interest. The gaps close responsive to the sensing material corresponding to the gaps detecting the analyte of interest. One or more processors communicatively coupled with the electrical circuit receive electrical signals from the electrical circuit indicative of the gaps closing responsive to the sensing material of the corresponding gaps detecting the analyte of interest. The electrical circuit is in a closed position in the presence of the analyte of interest. The sensor system is configured to consume an increased amount of power when the electrical circuit is in the closed position relative to the electrical circuit in an open position responsive to the one or more of the gaps closing. A responsive action is determined based on the electrical signals.
Abstract:
A voltage detection device for detecting proximity to an active alternating current (AC) voltage source is provided. The device includes a housing, at least one antenna configured to generate a signal in response to exposure to electromagnetic radiation, signal processing circuitry configured to process the signal generated by the at least one antenna, a processing device embedded in the housing and communicatively coupled to the signal processing circuitry, the processing device configured to determine, from the processed signal, whether the voltage detection device is proximate to the active AC voltage source, and an electronic switch embedded in the housing and one of included within the processing device and communicatively coupled to the processing device, the electronic switch configured to reduce an impact of interference on detection of the active AC voltage source.
Abstract:
A detection system includes a first sensor configured to send a first ultrasonic pulse toward an object in a blowout prevention system. The first ultrasonic pulse has a first parameter. The detection system also includes a second sensor spaced from the first sensor and configured to send a second ultrasonic pulse toward the object. The second ultrasonic pulse has a second parameter that is different from the first parameter of the first ultrasonic pulse. The first parameter and the second parameter are one of an amplitude, a frequency, a duration, an emission time, and an excitation code. The second sensor is further configured to receive the first ultrasonic pulse after the first ultrasonic pulse interacts with the object. The detection system is configured to determine that the first ultrasonic pulse received by the second sensor was sent by the first sensor. The detection system further includes a controller coupled to the second sensor and configured to determine a characteristic of the object based on the first ultrasonic pulse.
Abstract:
An analog-to-digital converter (ADC) is provided includes a first sigma-delta modulator (SDM) electrically coupled to a first signal input. The first SDM includes a first summing junction configured to receive a plurality of inputs to the first SDM. The ADC further includes a second sigma-delta modulator (SDM) electrically coupled to a second signal input. The second SDM includes a second summing junction configured to receive a plurality of inputs to the second SDM. The first SDM also includes a cross-coupled feedback loop from an output of the first SDM to a negative input of the first summing junction and to a positive input of the second summing junction. The second SDM also includes a cross-coupled feedback loop from an output of the second SDM to a negative input of the first summing junction and to a negative input of the second summing junction.
Abstract:
A high temperature electronic system includes an electronics unit configured for exposure to an environment having a temperature greater than approximately 150.0° C. The remote electronics unit includes a transient voltage suppressor (TVS) assembly coupled in operative relationship with at least some electronic components of the electronics unit. The TVS assembly includes at least one TVS device comprising at least one of a punch-through wide band-gap semiconductor TVS die and an avalanche breakdown wide band-gap semiconductor TVS die encapsulated in a flip-chip package at least partially surrounding the die, and coupled to first and second electrodes exposed to a single side of the encapsulation.