IMAGE SENSOR AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20190305049A1

    公开(公告)日:2019-10-03

    申请号:US16105259

    申请日:2018-08-20

    Abstract: Provided are an image sensor and a method of manufacturing the same. The image sensor may include a plurality of light detection elements arranged to correspond to a plurality of pixel regions, a color filter layer on the plurality of light detection elements and including a plurality of color filters arranged to correspond to the plurality of light detection elements, and a photodiode device portion on the color filter layer. The photodiode device portion may have curved structures. The photodiode device portion may include an organic material-based photodiode layer, a first electrode between the photodiode layer and the color filter layer, and a second electrode on the photodiode layer. The photodiode device portion may have curved convex structures respectively corresponding to the plurality of color filters.

    META-SURFACE OPTICAL ELEMENT AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20190086579A1

    公开(公告)日:2019-03-21

    申请号:US16020434

    申请日:2018-06-27

    Abstract: Provided are meta-surface optical device and methods of manufacturing the same. The meta-surface optical device may include a meta-surface arranged on a region of a substrate and a light control member arranged around the meta-surface. The light control member may be arranged on or below the substrate. A material layer formed of the same material used to form the meta-surface may be disposed between the light control member and the substrate. Also, the meta-surface may be a first meta-surface arranged on an upper surface of the substrate, and a second meta-surface may be arranged on a bottom surface of the substrate. Also, the meta-surface may include a first meta-surface and at least one second meta-surface may formed on the first meta-surface, and the light control member may be arranged around the at least one second meta-surface.

    APPARATUS FOR ANALYZING ACTIVE MATERIAL OF SECONDARY BATTERY AND METHOD OF ANALYZING ACTIVE MATERIAL USING THE SAME
    26.
    发明申请
    APPARATUS FOR ANALYZING ACTIVE MATERIAL OF SECONDARY BATTERY AND METHOD OF ANALYZING ACTIVE MATERIAL USING THE SAME 有权
    用于分析二次电池活性材料的装置及使用其分析活性材料的方法

    公开(公告)号:US20160054267A1

    公开(公告)日:2016-02-25

    申请号:US14734229

    申请日:2015-06-09

    CPC classification number: G01N29/12 G01N29/2437 G01N2291/0256 G01N2291/2697

    Abstract: An apparatus for analyzing an active material of a secondary battery may include: a first electrode; a piezoelectric layer on the first electrode; a second electrode on the piezoelectric layer, configured to provide a voltage having a polarity opposite to a polarity of the first electrode; and/or an insulating layer on the second electrode and including a through hole exposing a portion of the second electrode. A method of analyzing an active material of a secondary battery may include: disposing an active material in a through hole of a bulk acoustic resonator, in which a first electrode, a piezoelectric layer, a second electrode, and an insulating layer are stacked; measuring a resonance frequency of the resonator by applying an electric signal to the first and second electrodes of the resonator; and/or measuring a weight of the active material in the through hole, based on the measured resonance frequency.

    Abstract translation: 用于分析二次电池的活性材料的装置可以包括:第一电极; 第一电极上的压电层; 压电层上的第二电极,被配置为提供具有与第一电极的极性相反的极性的电压; 和/或第二电极上的绝缘层,并且包括暴露第二电极的一部分的通孔。 分析二次电池的活性物质的方法可以包括:将活性物质设置在堆叠有第一电极,压电层,第二电极和绝缘层的体声波谐振器的通孔中; 通过向谐振器的第一和第二电极施加电信号来测量谐振器的谐振频率; 和/或基于测量的共振频率来测量通孔中的活性材料的重量。

    SEMICONDUCTOR APPARATUS
    27.
    发明申请

    公开(公告)号:US20250113746A1

    公开(公告)日:2025-04-03

    申请号:US18980759

    申请日:2024-12-13

    Abstract: A semiconductor apparatus may include a plurality of semiconductor unit devices. Each of the semiconductor unit devices may be arranged between a first insulating layer and a second insulating layer that are apart from each other in a direction normal to a substrate. Each of the semiconductor unit devices may include a selection device layer and a phase change material layer that extend side by side in a direction parallel to the substrate. The phase change material layer may have a superlattice-like structure. The phase change material layer may be arranged along a recess portion that is formed by the first insulating layer, the second insulating layer, and the selection device layer.

    META-SURFACE OPTICAL ELEMENT AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20240012178A1

    公开(公告)日:2024-01-11

    申请号:US18472662

    申请日:2023-09-22

    CPC classification number: G02B1/002 G02B5/1814

    Abstract: Provided are meta-surface optical device and methods of manufacturing the same. The meta-surface optical device may include a meta-surface arranged on a region of a substrate and a light control member arranged around the meta-surface. The light control member may be arranged on or below the substrate. A material layer formed of the same material used to form the meta-surface may be disposed between the light control member and the substrate. Also, the meta-surface may be a first meta-surface arranged on an upper surface of the substrate, and a second meta-surface may be arranged on a bottom surface of the substrate. Also, the meta-surface may include a first meta-surface and at least one second meta-surface may formed on the first meta-surface, and the light control member may be arranged around the at least one second meta-surface.

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