SEMICONDUCTOR PACKAGE
    22.
    发明申请

    公开(公告)号:US20250167137A1

    公开(公告)日:2025-05-22

    申请号:US19027551

    申请日:2025-01-17

    Abstract: A semiconductor package including a package substrate, a connection substrate on the package substrate and having on a lower corner of the connection substrate a recession that faces a top surface of the package substrate, a semiconductor chip on the connection substrate, a plurality of first connection terminals connecting the connection substrate to the semiconductor chip, and a plurality of second connection terminals connecting the package substrate to the connection substrate. The recession is laterally spaced apart from the second connection terminals.

    INTEGRATED CIRCUIT DEVICE
    23.
    发明申请

    公开(公告)号:US20250167113A1

    公开(公告)日:2025-05-22

    申请号:US18754295

    申请日:2024-06-26

    Abstract: Provided is an integrated circuit device including first and second power lines each overlapping a first cell region, an inter-cell separation region, and a second cell region on a substrate in a vertical direction to the substrate, a first power tap cell penetrating through the substrate and receiving a first voltage from the first power line, a second power tap cell penetrating through the substrate and receiving, from the second power line, a second voltage different from the first voltage, and a dummy gate insulating bridge including first and second dummy gate insulating lines, which are apart from each other with the first and second power tap cells therebetween, and defining a vacuum space, and connected to the first and second dummy gate insulating lines.

    SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

    公开(公告)号:US20250167111A1

    公开(公告)日:2025-05-22

    申请号:US18674263

    申请日:2024-05-24

    Abstract: Provided is a semiconductor device including a lower structure, a dielectric layer on the lower structure, and first and second interconnection lines extending in a first direction in the dielectric layer and alternately disposed and spaced apart from each other in a second direction, perpendicular to the first direction, at least one of the first interconnection lines includes a first subpattern and a second subpattern overlapping in the first direction and spaced apart from each other, at least one of the second interconnection lines includes a third subpattern and a fourth subpattern overlapping in the first direction and spaced apart from each other, two ends of the first subpattern and the second subpattern respectively facing each other in the first direction have a convex protruding shape, and two ends of the third subpattern and the fourth subpattern respectively facing each other in the first direction have a concave protruding shape.

    INTERCONNECT STRUCTURE INCLUDING METAL LINES HAVING DIFFERENT METAL HEIGHTS

    公开(公告)号:US20250167106A1

    公开(公告)日:2025-05-22

    申请号:US18738802

    申请日:2024-06-10

    Abstract: Provided is a semiconductor device which includes: a base layer including at least one transistor structure; and an interconnect structure above the base layer in a 3rd direction, wherein the interconnect structure includes a 1st metal line, a 2nd metal line, and at least one another metal line extended in a 1st direction and arranged at a 2nd direction, wherein at least a 1st portion of the 1st metal line having a 1st metal-to-metal distance to at least a portion of another metal line adjacent thereto in the 2nd direction has a greater height than at least a 1st portion of the 2nd metal line having a 2nd metal-to-metal distance to at least a portion of another metal line adjacent thereto in the 2nd direction, wherein the 1st metal-to-metal distance is greater than the 2nd metal-to-metal distance, and wherein the 1st direction and the 2nd direction horizontally intersect each other, and vertically intersect the 3rd direction.

    SEMICONDUCTOR PACKAGE
    26.
    发明申请

    公开(公告)号:US20250167093A1

    公开(公告)日:2025-05-22

    申请号:US18794303

    申请日:2024-08-05

    Inventor: DOHOON KIM

    Abstract: A semiconductor package includes: a package substrate including an insulating layer and a plurality of conductive patterns within the insulating layer and respectively including a wiring portion and a via portion; a semiconductor chip on the package substrate and connected to the plurality of conductive patterns; and a molding member that covers the package substrate and the semiconductor chip. The semiconductor chip is closer to a second edge than to an opposite first edge of the package substrate, the plurality of conductive patterns includes a first conductive pattern overlapping a first side surface of the semiconductor chip in a vertical direction and a second conductive pattern overlapping a second side surface of the semiconductor chip in a vertical direction, and a thickness in the vertical direction of a wiring portion of the first conductive pattern is different from a thickness of a wiring portion of the second conductive pattern.

    NONVOLATILE MEMORY DEVICE, STORAGE DEVICE HAVING THE SAME, AND TESTING METHOD THEREOF

    公开(公告)号:US20250166721A1

    公开(公告)日:2025-05-22

    申请号:US18761985

    申请日:2024-07-02

    Abstract: A nonvolatile memory device includes at least one first universal interface bus (UIB) circuit coupled to a plurality of input/output (I/O) pads, at least one second UIB circuit coupled to the plurality of I/O pads, a core block including a first input terminal coupled to another block, and a plurality of second input terminals coupled to a first output terminal of the at least one first UIB circuit and a second output terminal of the at least one second UIB circuit, and at least one block configured to activate the at least one second UIB circuit.

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