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88 条记录 (耗时 0.015 秒)

    Chiral Plasmonic Structures For Mediating Chemical Transformation And Detection Of Molecules With Spatial Chirality
    11.
    发明申请
    Chiral Plasmonic Structures For Mediating Chemical Transformation And Detection Of Molecules With Spatial Chirality 有权
    用于介导化学转化和用空间手性检测分子的手性等离子体结构

    公开(公告)号：US20110235032A1

    公开(公告)日：2011-09-29

    申请号：US13052940

    申请日：2011-03-21

    申请人： Michael A. MILLER ,  Diana L. STRICKLAND

    发明人： Michael A. MILLER ,  Diana L. STRICKLAND

    IPC分类号： G01N21/55 ,  G01J3/44 ,  B32B15/04 ,  D02G3/22 ,  B01J19/08

    CPC分类号： G01N21/554 ,  G01N2021/216 ,  Y10T428/2924 ,  Y10T428/31678

    摘要： Three-dimensional metal dielectric structures are disclosed with chiral symmetry that elicit surface plasmons. The plasmons may have propagational circular polarization wherein the frequency of such propagating plasmons may be tuned by design to couple with the electronic transitions or fundamental vibrations, including phonons, of a molecular species. The plasmon-molecule coupling, combined with the propagational polarization afforded by the chiral structure may be further exploited to mediate the chemical transformations involving molecules with spatial chirality and/or to detect molecules with spatial chirality.

    摘要翻译： 公开了引发表面等离子体激元的手性对称性的三维金属电介质结构。 等离子体激元可以具有传播圆偏振，其中这种传播等离子体激元的频率可以通过设计调谐以与分子种类的电子跃迁或基本振动（包括声子）耦合。 结合由手性结构提供的传播极化的等离子体 - 分子偶联可进一步被利用以介导涉及具有空间手性的分子的化学转化和/或检测具有空间手性的分子。

    Interferometric technique for measurement of nonreciprocal optical effects in a sample
    14.
    发明授权
    Interferometric technique for measurement of nonreciprocal optical effects in a sample 失效
    用于测量样品中非互易光学效应的干涉测量技术

    公开(公告)号：US5235404A

    公开(公告)日：1993-08-10

    申请号：US722338

    申请日：1991-06-27

    申请人： Martin M. Fejer ,  Aharon Kapitulnik ,  Kenneth A. Fesler

    发明人： Martin M. Fejer ,  Aharon Kapitulnik ,  Kenneth A. Fesler

    IPC分类号： G01B9/02 ,  G01J9/02 ,  G01N21/21 ,  G02B21/00

    CPC分类号： G01N21/21 ,  G02B21/002 ,  G01J2009/0261 ,  G01J2009/0273 ,  G01N2021/216 ,  G01N2021/218

    摘要： A method and apparatus for measuring nonreciprocal optical effects contemplates directing two circularly polarized optical beams having a known phase relation to each other at a sample, and detecting the difference in phase between the two beams after they have encountered the sample. In a transmission measurement the two circularly polarized beams have the same handedness, but pass through the sample in opposite directions. In a reflection measurement, the two circularly polarized beams have opposite handedness, but encounter the sample in the same direction. In a particular embodiment of the invention a linearly polarized beam is introduced into a Sagnac interferometer and split into two linearly polarized beams which are ultimately recombined.

    摘要翻译： 用于测量不可逆光学效应的方法和装置预期在样本处引导具有彼此已知相位关系的两个圆偏振光束，并且在两个光束遇到样本之后检测两相之间的相位差。 在透射测量中，两个圆偏振光束具有相同的螺旋性，但是在相反方向穿过样品。 在反射测量中，两个圆偏振光束具有相反的手性，但是在相同方向上遇到样品。 在本发明的一个具体实施例中，线性偏振光束被引入到Sagnac干涉仪中，并被分成两个最终重组的线性偏振光束。

    CRYSTALLINE PARTICLE DETECTION
    17.
    发明申请
    CRYSTALLINE PARTICLE DETECTION 审中-公开

    公开(公告)号：US20180231453A1

    公开(公告)日：2018-08-16

    申请号：US15580546

    申请日：2016-06-08

    申请人： Trolex Limited

    发明人： Paul Henry Kaye ,  William Eugene Martin

    IPC分类号： G01N15/14

    CPC分类号： G01N15/1434 ,  G01N15/1459 ,  G01N2015/0046 ,  G01N2021/216

    摘要： A method for determining the presence of crystalline silica particles in a sample comprising a plurality of particles. The method comprises: receiving first data generated based upon light scattered by at least one particle of said plurality of particles; receiving second data generated based upon intensity and polarisation change of the light transmitted through at least one particle of said plurality of particles; and determining the presence of crystalline silica particles in the sample based upon the first data and second data.

    Detection of defect in die
    20.
    发明授权
    Detection of defect in die 有权
    检测模具中的缺陷

    公开(公告)号：US09291576B2

    公开(公告)日：2016-03-22

    申请号：US14329686

    申请日：2014-07-11

    申请人： Intel Corporation

    发明人： Mario Pacheco ,  Deepak Goyal

    IPC分类号： G01J4/00 ,  G01N21/95 ,  H01L21/67 ,  G01N21/88 ,  G01N21/21

    CPC分类号： G01N21/9505 ,  G01N21/21 ,  G01N21/8806 ,  G01N2021/216 ,  G01N2201/0612 ,  H01L21/67288

    摘要： Generally discussed herein are systems, apparatuses, and methods that can detect a defect in a die. According to an example, a method can include transmitting a first beam of light with a wavelength and optical power configured to produce a reflected beam with at least one milli-Watt of power, linearly polarizing the first beam of light in a specific direction, circularly polarizing the linearly polarized light by a quarter wavelength to create circularly polarized light, directing the circularly polarized light to a device under test, linearly polarizing light reflected off the device under test by a quarter wavelength, or creating an image of the linearly polarized light reflected off the device under test.

    摘要翻译： 这里通常讨论的是可以检测模具中的缺陷的系统，装置和方法。 根据一个示例，一种方法可以包括传输具有波长和光功率的第一光束，其被配置为产生具有至少一毫瓦功率的反射光束，以沿着特定方向将第一光束线性偏振 将线性偏振光偏振四分之一波长以产生圆偏振光，将圆偏振光引导到被测器件，将被测器件反射的光线线偏振四分之一波长，或产生反射的线性偏振光的图像 关闭被测设备。