Abstract:
Reducing signal dependence for a reference voltage of a CDAC includes: splitting a decoupling capacitor into a plurality of capacitors smaller in size than a size of the decoupling capacitor; isolating at least one of the plurality of capacitors from a sampling buffer coupled to the reference voltage during a conversion phase; and supplying an appropriate amount of charge needed to replenish charge drawn by capacitors in the CDAC at each conversion step using a charge pump to pump in a dummy charge to the CDAC so that resulting configurations of the CDAC draw substantially similar amount of charge for each code change of the each conversion step.
Abstract:
An analog-to-digital converter includes: a first input terminal to receive a first input signal; a second input terminal to receive a second input signal; a noise shaping module configured to compare the first input signal to the second input signal received, and to output a digital output signal and a residue signal in a first phase of a noise shaping operation; and a storage module configured to store the residue signal during the first phase of the noise shaping operation, the storage module configured to receive an analog input signal and remove the residue signal from the analog input signal in a second phase of the noise shaping operation to output a new first input signal to the noise shaping module.
Abstract:
Certain aspects of the present disclosure provide a voltage level shifting circuit employing a low latency, AC-coupled voltage boost circuit, as well as other circuits and apparatus incorporating such a level shifting circuit. Such level shifting circuits provide significantly lower latency compared to conventional level shifters (e.g., latency reduced by at least a factor of two). Offering consistent latency over the simulation corners, level shifting circuits described herein also provide significantly lower power consumption and reduced duty cycle distortion compared to conventional level shifters.
Abstract:
In one embodiment, a circuit includes a quantizer configured to convert an analog input signal to a digital signal. The quantizer includes a first feedback path including a first digital to analog converter (DAC) coupled from an output of the quantizer to a summing junction that is coupled to an input of the quantizer. The first feedback path converts the digital signal to a first corresponding analog value for combining with the analog input signal at the summing junction. Also, the quantizer includes a plurality of excess loop delay (ELD) compensation paths coupled to the summing junction configured to compensate for excess loop delay from a second feedback path coupled from the output of the quantizer to input of the quantizer via a loop filter. Second DACs in the second feedback path convert the digital signal to a second corresponding analog value for combining with the analog input signal.
Abstract:
In embodiments, a circuit includes a single-ended input coupled to a first input of a differential filter. The differential filter is coupled to an analog to digital converter (ADC), and the single-ended input includes an input DC bias voltage level and an input signal. A reference generator circuit is coupled to a second input of the differential filter. The reference generator circuit generates a reference bias voltage. The differential filter includes a first filter coupled to the singled ended input and to the ADC and a second filter coupled to the reference generator circuit and to the ADC. The first filter is configured to receive the input DC bias voltage level and input signal. The second filter is configured to receive the reference bias voltage.
Abstract:
An apparatus is disclosed for pipelined analog-to-digital conversion. In an example aspect, the apparatus includes a pipelined analog-to-digital converter (ADC). The pipelined ADC includes a first stage and a second stage. The first stage includes a sampler and a quantizer coupled to the sampler. The first stage also includes a current distribution circuit coupled to the sampler. The second stage includes a sampler coupled to the current distribution circuit and a quantizer coupled to the sampler of the second stage.
Abstract:
Methods and apparatuses for chopping a successive approximation register (SAR) analog-to-digital converter (ADC). The ADC generally includes a comparator comprising a first input and a second input; a switch connected between the first and second inputs of the comparator; a first capacitive array having a first terminal selectively coupled to the first input of the comparator; a second capacitive array having a first terminal selectively coupled to the second input of the comparator; and a reference buffer selectively coupled to second terminals of the first and second capacitive arrays and configured to apply inverse digital codes to the first and second capacitive arrays, wherein the switch is configured to short the first and second inputs of the comparator while the inverse digital codes are being applied to the first and second capacitive arrays such that charges of the first and second capacitive arrays are redistributed via the reference buffer.
Abstract:
A continuous-time analog-to-digital converter (ADC) includes a plurality of integrators selectively coupled in series. The ADC may further include a quantizer with excess loop delay (ELD) compensation. The quantizer may be coupled in series to a least one integrator. The ELD compensation may be programmable based on a transfer function of the ADC. The ADC may further include parallel digital-to-analog converters (DACs). Each DAC may have an input coupled to an output of the quantizer, and an output coupled to an input of a corresponding integrator. The ADC may further include a bypass path coupled to an input or output of one of the integrators. The bypass path may be configured to selectively bypass one or more of the integrators to change the transfer function of the ADC.
Abstract:
A method and an apparatus for splitting a switched capacitor integrator of a delta-sigma modulator are provided. The apparatus configures a first integrator and a second integrator to be coupled in parallel to each other, switches between a first mode and a second mode, enables the first integrator to operate on an input signal to generate an output signal in the first mode, and enables the first integrator and the second integrator to cooperatively operate on the input signal in the second mode, wherein in the second mode, the apparatus generates a first output via the first integrator, generates a second output via the second integrator, and converges the first output with the second output to generate the output signal.
Abstract:
Certain aspects of the present disclosure provide various sampling networks for switched-capacitor integrators, which may be used in switched-capacitor analog-to-digital converters (ADCs). Rather than having both an input sampling capacitor and a reference sampling capacitor, certain aspects of the present disclosure use a shared sampling capacitor for the reference voltage and the input voltage, thereby reducing ADC input-referred noise, decreasing op amp area and power, and avoiding anti-aliasing filter insertion loss. Furthermore, by sampling the reference voltage during the sampling phase and sampling the input voltage during the integration phase using the shared sampling capacitor, a high-bandwidth reference buffer need not be used for the reference voltage.