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公开(公告)号：US20170299650A1
公开(公告)日：2017-10-19
申请号：US15490584
申请日：2017-04-18
Applicant: Analog Devices Global
Inventor： Edward John Coyne , Alan J. O'Donnell , Shaun Bradley , David Aherne , David Boland , Thomas G. O'Dwyer , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Michael A. Looby
CPC classification number: G01R31/2879 , G01R31/2874
Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
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公开(公告)号：US10551215B2
公开(公告)日：2020-02-04
申请号：US14737403
申请日：2015-06-11
Applicant: ANALOG DEVICES GLOBAL UNLIMITED COMPANY
Inventor： Eoin E. English , Javier Calpe Maravilla , Robert Guyol , Alan J. O'Donnell , Maria Jose Martinez , Jan Kubik , Krystian Balicki
IPC: G01D5/20
Abstract: An embodiment of a position sensing system includes a signal generation circuit to generate an excitation signal according to a selected characteristic signal, a drive circuit to drive an excitation source with the excitation signal, an input circuit to receive a sensor output while driving the excitation source, a signal detection circuit to identify a component of the sensor output corresponding to the characteristic signal, and a control circuit to determine the position of the movable object as a function of the identified component of the sensor output. The positioning system may be included an electronic camera, where the movable object may be a lens. The excitation source may be a conductive coil, the excitation a magnetic field, and the sensor a magneto resistive sensor. Alternatively, the excitation source may be an optical excitation source, the excitation an optical excitation, and the sensor an optical sensor.
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公开(公告)号：US20190361071A1
公开(公告)日：2019-11-28
申请号：US16513562
申请日：2019-07-16
Applicant: Analog Devices Global
Inventor： Edward John Coyne , Alan J. O'Donnell , Shaun Bradley , David Aherne , David Boland , Thomas G. O'Dwyer , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Michael A. Looby
Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
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公开(公告)号：US11061086B2
公开(公告)日：2021-07-13
申请号：US16565201
申请日：2019-09-09
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , Robert Guyol , Maria Jose Martinez , Jan Kubik , Padraig L. Fitzgerald , Javier Calpe Maravilla , Michael P. Lynch , Eoin E. English
Abstract: A magnetic device may include a magnetic structure, a device structure, and an associated circuit. The magnetic structure may include a patterned layer of material having a predetermined magnetic property. The patterned layer may be configured to, e.g., provide a magnetic field, sense a magnetic field, channel or concentrate magnetic flux, shield a component from a magnetic field, or provide magnetically actuated motion, etc. The device structure may be another structure of the device that is physically connected to or arranged relative to the magnetic structure to, e.g., structurally support, enable operation of, or otherwise incorporate the magnetic structure into the magnetic device, etc. The associated circuit may be electrically connected to the magnetic structure to receive, provide, condition or process of signals of the magnetic device.
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公开(公告)号：US20200158771A1
公开(公告)日：2020-05-21
申请号：US16743878
申请日：2020-01-15
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
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Patent Agency Ranking
公开(公告)号：US20200003851A1
公开(公告)日：2020-01-02
申请号：US16565201
申请日：2019-09-09
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , Robert Guyol , Maria Jose Martinez , Jan Kubik , Padraig L. Fitzgerald , Javier Calpe Maravilla , Michael P. Lynch , Eoin E. English
Abstract: A magnetic device may include a magnetic structure, a device structure, and an associated circuit. The magnetic structure may include a patterned layer of material having a predetermined magnetic property. The patterned layer may be configured to, e.g., provide a magnetic field, sense a magnetic field, channel or concentrate magnetic flux, shield a component from a magnetic field, or provide magnetically actuated motion, etc. The device structure may be another structure of the device that is physically connected to or arranged relative to the magnetic structure to, e.g., structurally support, enable operation of, or otherwise incorporate the magnetic structure into the magnetic device, etc. The associated circuit may be electrically connected to the magnetic structure to receive, provide, condition or process of signals of the magnetic device.
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公开(公告)号：US20210405130A1
公开(公告)日：2021-12-30
申请号：US17344687
申请日：2021-06-10
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , Robert Guyol , Maria Jose Martinez , Jan Kubik , Padraig L. Fitzgerald , Javier Calpe Maravilla , Michael P. Lynch , Eoin E. English
Abstract: A magnetic device may include a magnetic structure, a device structure, and an associated circuit. The magnetic structure may include a patterned layer of material having a predetermined magnetic property. The patterned layer may be configured to, e.g., provide a magnetic field, sense a magnetic field, channel or concentrate magnetic flux, shield a component from a magnetic field, or provide magnetically actuated motion, etc. The device structure may be another structure of the device that is physically connected to or arranged relative to the magnetic structure to, e.g., structurally support, enable operation of, or otherwise incorporate the magnetic structure into the magnetic device, etc. The associated circuit may be electrically connected to the magnetic structure to receive, provide, condition or process of signals of the magnetic device.
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18.发明申请公开(公告)号：US20190293692A1
公开(公告)日：2019-09-26
申请号：US16360356
申请日：2019-03-21
Applicant: Analog Devices Global Unlimited Company
Inventor： David J. Clarke , Stephen Denis Heffernan , Nijun Wei , Alan J. O'Donnell , Patrick Martin McGuinness , Shaun Bradley , Edward John Coyne , David Aherne , David M. Boland
IPC: G01R19/165 , G01R31/00 , G01R31/28 , H01L23/525 , H01L27/02 , H01L23/60 , H01L23/62 , H02H9/04
Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes;
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公开(公告)号：US10338132B2
公开(公告)日：2019-07-02
申请号：US15291742
申请日：2016-10-12
Applicant: Analog Devices Global
Inventor： Edward John Coyne , Alan J. O'Donnell , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Thomas G. O'Dwyer , David Aherne , Michael A. Looby
IPC: G01R31/28
Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring. An integrated circuit device includes a core circuit and a wear-out monitor device. The wear-out monitor device configured to adjust an indication of wear out of the core circuit regardless of whether the core circuit is activated The integrated circuit further includes a sensing circuit coupled to the wear-out monitor device and configured to detect an electrical property of the wear-out monitor device that is indicative of a wear-out level of the core-circuit.
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公开(公告)号：US20190128939A1
公开(公告)日：2019-05-02
申请号：US15801132
申请日：2017-11-01
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
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