公开(公告)号：US20180011146A1

公开(公告)日：2018-01-11

申请号：US15604602

申请日：2017-05-24

Applicant: CHROMA ATE INC.

Inventor： Peng-Fei CHEN ,  Mao-Sheng LIU

IPC: G01R31/36 ,  G01R1/067

CPC classification number: G01R31/3644 ,  G01R1/02 ,  G01R1/067 ,  G01R1/06788

Abstract: A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.

公开(公告)号：US20170370965A1

公开(公告)日：2017-12-28

申请号：US15608663

申请日：2017-05-30

Applicant: CHROMA ATE INC.

Inventor： Hsu-Chang HSU ,  Chiang-Cheng FAN ,  Li-Hsun CHEN ,  Chuan-Tse LIN ,  Ming-Hui WANG ,  Chung-Lin LIU ,  Ming-Ju CHUANG

IPC: G01R1/067 ,  G01N27/04

CPC classification number: G01R1/06777 ,  G01R1/06705

Abstract: An electrical probe includes a base body and a probe head. The base body has a main body portion and at least one positioning portion, and the positioning portion protrudes from the main body portion. The probe head is detachably disposed on the main body portion of the base body. The probe head has an outer edge away from a side of a central axis of the main body portion, and the positioning portion protrudes from the outer edge.

公开(公告)号：US20170108326A1

公开(公告)日：2017-04-20

申请号：US14884822

申请日：2015-10-16

Applicant: CHROMA ATE INC.

Inventor： James E. HOPKINS

IPC: G01B5/30 ,  H01M10/48 ,  H01M10/42

CPC classification number: H01M10/48 ,  G01B21/32 ,  H01M2/1061 ,  H01M10/4285 ,  H01M2220/30

Abstract: A measurement fixture for a battery cell is provided when the battery cell is connected to an apparatus. The measurement fixture comprises a chamber, a pressure sensor and an expansion sensor. The chamber defines a sealed space for receiving the battery cell. The pressure sensor is mounted to the chamber to sense a change of pressure in the sealed space due to a volume change of the battery cell to calculate pressure in the battery cell and the volume change of the battery cell non-contactly. The expansion sensor is mounted to the chamber to sense a deformation of the battery cell to calculate a correlation between the pressure in the battery cell and the volume change of the battery cell non-contactly.

公开(公告)号：US09519024B2

公开(公告)日：2016-12-13

申请号：US14617892

申请日：2015-02-09

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming Chen

IPC: G01R31/28 ,  G01R1/04

CPC classification number: G01R31/2893 ,  G01R1/0433 ,  G01R31/2867 ,  G01R31/2887 ,  G01R31/2896 ,  H01L2224/48227 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/00012

Abstract: An apparatus for testing a package-on-package semiconductor device comprises a pick and place device for loading a first chip into or unloading the first chip from a test socket and a lifting and rotating arm for moving a chip placement module which receives a second chip to a position between the pick and place device and the test socket. The pick and place device and the chip placement module are lowered, and then a test process is performed. After the test process is completed, the pick and place device and the chip placement module are lifted, and the lifting and rotating arm moves the chip placement module to one side of the pick and place device. Accordingly, a method for testing the semiconductor device could be performed automatically so as to greatly enhance test efficiency and accuracy and to significantly reduce costs.

Abstract translation: 一种用于测试封装封装半导体器件的装置，包括用于将第一芯片从测试插座加载到第一芯片或从其卸载的拾取和放置装置，以及用于移动芯片放置模块的提升和旋转臂，芯片放置模块接收第二芯片 到拾取和放置设备与测试插座之间的位置。 拾取和放置装置和芯片放置模块降低，然后进行测试处理。 测试过程完成后，拾取和放置设备和芯片放置模块被提起，提升和旋转臂将芯片放置模块移动到拾取和放置设备的一侧。 因此，可以自动进行半导体装置的测试方法，大大提高测试效率和精度，并显着降低成本。

公开(公告)号：US09470749B2

公开(公告)日：2016-10-18

申请号：US14108176

申请日：2013-12-16

Applicant: CHROMA ATE INC.

Inventor： Xin-Yi Wu ,  Hsuan-Jen Shen ,  Chien-Ming Chen ,  Chin-Yi Ou Yang

IPC: G01R31/28 ,  G01N1/42

CPC classification number: G01R31/2877 ,  G01N1/42 ,  G01R31/2865

Abstract: A test apparatus includes a test site, a buffer carrying device, a transport carrying device, a handling mechanism and a dry air flow guide mechanism. The test site performs a test procedure on the objects. The buffer carrying device is disposed close to a side of the test site, holds the objects and performs a temperature conditioning process. The transport carrying device is disposed close to another side of the test site, moves back and forth along a transporting direction, transports the objects into and out of the test site, and heats up the objects. The handling mechanism carries the objects among the buffer carrying device, the test site and the transport carrying device. The dry air flow guide mechanism guides a dry air to surround the test site, the buffer carrying device, the transport carrying device and the handling mechanism and generates a dry environment to prevent dew condensation.

Abstract translation: 试验装置包括试验部位，缓冲载体装置，输送装置，搬运机构以及干燥空气引导机构。 测试站点对对象执行测试程序。 缓冲载体装置靠近试验部位的一侧设置，保持物体并进行温度调节处理。 运送装置靠近试验场的另一侧，沿运送方向前后移动，运送物体进出试验场地，并加热物体。 处理机构携带缓冲运送装置，试验部位和运送装置中的物体。 干燥空气流动引导机构引导干燥空气围绕测试场所，缓冲装置，输送装置和处理机构，并产生干燥环境以防止结露。

公开(公告)号：US20160291080A1

公开(公告)日：2016-10-06

申请号：US14961535

申请日：2015-12-07

Applicant: CHROMA ATE INC.

Inventor： Chih-Cherng LU ,  Chia-Ching TING ,  Chuan-Tse LIN

IPC: G01R31/28 ,  G05B11/01

CPC classification number: G05B11/01 ,  G01R31/2834 ,  G01R31/3191 ,  G01R31/3641 ,  G01R35/00 ,  G01R35/005

Abstract: An automatic test system and method are provided. The automatic test system includes at least one formation apparatus and a test fixture. The formation apparatus receives a first control command from a network and executes a test procedure according to the first control command. The test procedure includes a charging mode and a discharging mode. The test fixture is selectively coupled to the formation apparatus. During the test procedure, when the test fixture is coupled to the formation apparatus, the test fixture generates a first measurement result. The test fixture transmits the first measurement result to the formation apparatus via a wireless communication interface of the test fixture.

Abstract translation: 提供了一种自动测试系统和方法。 自动测试系统包括至少一个形成装置和测试夹具。 形成装置从网络接收第一控制命令，并根据第一控制命令执行测试程序。 测试程序包括充电模式和放电模式。 测试夹具选择性地联接到地层装置。 在测试过程中，当测试夹具耦合到成形设备时，测试夹具产生第一测量结果。 测试夹具通过测试夹具的无线通信接口将第一测量结果发送到成形设备。

公开(公告)号：US09353995B2

公开(公告)日：2016-05-31

申请号：US14291573

申请日：2014-05-30

Applicant: CHROMA ATE INC.

Inventor： Xin-Yi Wu ,  Jui-Chih Chou ,  Hsuan-Jen Shen

IPC: G06F1/16 ,  H05K5/00 ,  H05K7/00 ,  F28D15/00 ,  H01L23/473

CPC classification number: F28D15/00 ,  H01L23/473 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A temperature control module for a socket is provided with of an upper docking plate and a lower docking plate. The upper docking plate has a recess for accommodating a socket and two temperature-controlling fluid passages. One end of the passages communicates with the recess, and the other end thereof is connected to a temperature-controlling fluid source. The lower docking plate is disposed under the upper docking plate and covers the recess. A fluid chamber is formed of the recess of the docking plate, the lower docking plate and the socket. The temperature-controlling fluid source outputs a temperature-controlling fluid to the fluid chamber via the temperature-controlling fluid passages for maintaining the socket at a specific temperature.

Abstract translation: 用于插座的温度控制模块设置有上对接板和下对接板。 上对接板具有用于容纳插座的凹部和两个温度控制流体通道。 通路的一端与凹部连通，另一端与温度调节型流体源连接。 下对接板设置在上对接板下方并覆盖凹部。 流体室由对接板，下部对接板和插座的凹部形成。 温度控制流体源通过温度控制流体通道将温度控制流体输出到流体室，用于将插座保持在特定温度。

公开(公告)号：US20160124066A1

公开(公告)日：2016-05-05

申请号：US14928062

申请日：2015-10-30

Applicant: CHROMA ATE INC.

Inventor： Hou-Chun CHEN ,  Shin-Wen LIN ,  Ching-Hua CHU ,  Po-Kai CHENG

IPC: G01R35/00 ,  G01R31/28

CPC classification number: G01R35/005 ,  G01R31/2834 ,  G01R31/2882

Abstract: A calibration board and a timing calibration method thereof are provided. The calibration board for calibrating signal delays of test channels in an automatic test equipment is pluggably disposed in the automatic test equipment and includes calibration groups, a first common node, and a switching module. Each calibration group includes a second common node and conductive pads electrically connecting to the second common node. Each conductive pad selectively and electrically connects to one test channel. The switching module electrically connects to the first common node and each second common node. When a first delay calibration procedure is performed, the connection between the first common node and each second common node is disabled. When a second delay calibration procedure is performed, the connection between the first common node and each second common node is built.

Abstract translation: 提供校准板及其定时校准方法。 用于校准自动测试设备中测试通道的信号延迟的校准板可插拔地设置在自动测试设备中，并且包括校准组，第一公共节点和开关模块。 每个校准组包括第二公共节点和电连接到第二公共节点的导电焊盘。 每个导电焊盘选择性地和电连接到一个测试通道。 开关模块电连接到第一公共节点和每个第二公共节点。 当执行第一延迟校准过程时，第一公共节点和每个第二公共节点之间的连接被禁用。 当执行第二延迟校准过程时，构建第一公共节点和每个第二公共节点之间的连接。

公开(公告)号：US09234933B2

公开(公告)日：2016-01-12

申请号：US13716100

申请日：2012-12-15

Applicant: Chroma ATE Inc.

Inventor： Lan-Sheng Yang ,  I-Shih Tseng ,  Ching-Lin Lee ,  Ming-Chieh Lin ,  Yi-Lung Weng

IPC: G01R31/26 ,  H02S50/10 ,  F21S8/00 ,  F21Y101/02

CPC classification number: G01R31/2607 ,  F21S8/006 ,  F21Y2115/10 ,  H02S50/10

Abstract: A solar cell testing system includes a multifunctional testing light source, a measuring unit, and an arithmetic unit. The multifunctional testing light source is configured to be switched to output a simulated solar light to a solar cell or asynchronously output a plurality of narrowband lights to the solar cell. The measuring unit is coupled to the solar cell and measures the solar cell's response to the simulated solar light and response to the asynchronously outputted narrowband lights. The arithmetic unit is coupled to the multifunctional testing light source and the measuring unit; it determines the solar cell's conversion efficiency and spectral response based on the solar cell's response to the simulated solar light and response to the asynchronously outputted narrowband lights.

Abstract translation: 太阳能电池测试系统包括多功能测试光源，测量单元和运算单元。 多功能测试光源被配置为切换以将模拟的太阳光输出到太阳能电池，或者将多个窄带光异步输出到太阳能电池。 测量单元耦合到太阳能电池并且测量太阳能电池对模拟的太阳光的响应以及对异步输出的窄带光的响应。 算术单元耦合到多功能测试光源和测量单元; 它基于太阳能电池对模拟的太阳光的响应和对异步输出的窄带光的响应来确定太阳能电池的转换效率和光谱响应。

公开(公告)号：US09232600B2

公开(公告)日：2016-01-05

申请号：US14546323

申请日：2014-11-18

Applicant: CHROMA ATE INC.

Inventor： Che-Cheng Hu ,  Chih-Chiao Chang

IPC: H05B37/00 ,  H05B33/08

CPC classification number: H05B33/086

Abstract: A light-emitting module and a driving method thereof are disclosed. In this method, P light-emitting units are selected as a target group, wherein each of the P light-emitting units has N different power parameters corresponding to N sub-bands. P evaluated current values corresponding to the P light-emitting units are computed according to a target spectrum and the N×P power parameters corresponding to the P light-emitting unit in the target group. An emission-spectrum error is computed according to the target spectrum, the N×P power parameters, and the P evaluated current values. It is determined whether the emission-spectrum error conforms with the determining criteria. When the emission-spectrum error conforms with determining criteria, the P evaluated current values are set to be P driving current values corresponding to the P light-emitting units.

Abstract translation: 公开了一种发光模块及其驱动方法。 在该方法中，选择P个发光单元作为目标组，其中每个P个发光单元具有对应于N个子带的N个不同的功率参数。 根据目标光谱和对应于目标组中的P发光单元的N×P功率参数来计算对应于P个发光单元的P评估电流值。 根据目标光谱，N×P功率参数和P评估电流值计算发射光谱误差。 确定发射光谱误差是否符合确定标准。 当发射光谱误差符合确定标准时，P评估电流值被设置为对应于P个发光单元的P个驱动电流值。