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    TESTING FIXTURE, TESTING SYSTEM FOR CELL TEMPERATURE PROBE AND METHOD FOR TESTING CELL TEMPERATURE PROBE
    1.
    发明申请
    TESTING FIXTURE, TESTING SYSTEM FOR CELL TEMPERATURE PROBE AND METHOD FOR TESTING CELL TEMPERATURE PROBE 审中-公开

    公开(公告)号：US20190162795A1

    公开(公告)日：2019-05-30

    申请号：US16180158

    申请日：2018-11-05

    Applicant: CHROMA ATE INC.

    Inventor： Chuan-Tse LIN ,  Ming-Tsung LIU ,  Kuan-Chen CHEN ,  Chien-Po LIN

    IPC: G01R31/36 ,  H01M10/48

    Abstract: A testing fixture for a cell temperature probe includes a microcomputer, a temperature probe, a measurement case, a temperature instrument and heaters. The microcomputer configured to receive a control command for executing a testing process. The measurement case has an outer surface and an inner surface. The outer surface includes a probe-contacting area used for being contacted by the cell temperature probe within a formation device in the testing process. The temperature instrument is electrically connected to the microcomputer and has a sensing terminal disposed on the inner surface of the measurement case. The location of the sensing terminal is aligned with the probe-contacting area in a direction of a thickness of the measurement case. The heaters are electrically connected to the microcomputer and thermally to the measurement case.

    ELECTRICAL PROBE
    3.
    发明申请
    ELECTRICAL PROBE 审中-公开

    公开(公告)号：US20190195911A1

    公开(公告)日：2019-06-27

    申请号：US16222391

    申请日：2018-12-17

    Applicant: CHROMA ATE INC.

    Inventor： Hsu-Chang HSU ,  Kuo-Yen HSU ,  Chuan-Tse LIN

    IPC: G01R1/067

    Abstract: An electrical probe includes a probe assembly and a second electrical connection member. The probe assembly includes a needle cylinder, a first electrical connection member, a probe head and a sub-probe. The first electrical connection member and the probe head locate to two opposite sides of the needle cylinder. The first electrical connection member and the probe head electrically connect the needle cylinder. The sub-probe penetrates the probe head, and plugs the needle cylinder to electrically connect a cable but being electrically isolated from the needle cylinder. The sub-probe is located on a side away from the first electrical connection member. When the probe head depresses the object, the needle cylinder drives the first cylinder to a contact position to allow the first electrical connection member to electrically contact the second electrical connection member, and thus the probe head connects the second electrical connection member via the needle cylinder.

    BATTERY FORMATION SYSTEM AND PROBE SUPPORTING STRUCTURE THEREOF
    4.
    发明申请
    BATTERY FORMATION SYSTEM AND PROBE SUPPORTING STRUCTURE THEREOF 审中-公开

    公开(公告)号：US20190123335A1

    公开(公告)日：2019-04-25

    申请号：US16156111

    申请日：2018-10-10

    Applicant: CHROMA ATE INC.

    Inventor： Hsu-Chang HSU ,  Kuo-Yen HSU ,  Kuan-Chen CHEN ,  Chuan-Tse LIN

    IPC: H01M4/04 ,  H01M10/44 ,  H01M10/613 ,  H01M10/6563

    Abstract: The disclosure is related to a battery formation system and probe supporting structure thereof. The battery formation system includes a base, a holder, a probe supporting structure and at least one probe. The base is adaptive to bear at least one battery, and the holder is located on one side of the base. The probe supporting structure is disposed on the holder. The probe supporting structure has an air flow passage and at least one air discharge channel connected to each other, and an extension direction of the air flow passage intersects an extension direction of the at least one air discharge channel. The at least one probe is disposed on the probe supporting structure, and a probing end of the at least one probe and an air outlet of the at least one air discharge channel are located at a same side of the probe supporting structure.

    AUTOMATIC TEST SYSTEM AND METHOD
    6.
    发明申请
    AUTOMATIC TEST SYSTEM AND METHOD 有权
    自动测试系统和方法

    公开(公告)号：US20160291080A1

    公开(公告)日：2016-10-06

    申请号：US14961535

    申请日：2015-12-07

    Applicant: CHROMA ATE INC.

    Inventor： Chih-Cherng LU ,  Chia-Ching TING ,  Chuan-Tse LIN

    IPC: G01R31/28 ,  G05B11/01

    CPC classification number: G05B11/01 ,  G01R31/2834 ,  G01R31/3191 ,  G01R31/3641 ,  G01R35/00 ,  G01R35/005

    Abstract: An automatic test system and method are provided. The automatic test system includes at least one formation apparatus and a test fixture. The formation apparatus receives a first control command from a network and executes a test procedure according to the first control command. The test procedure includes a charging mode and a discharging mode. The test fixture is selectively coupled to the formation apparatus. During the test procedure, when the test fixture is coupled to the formation apparatus, the test fixture generates a first measurement result. The test fixture transmits the first measurement result to the formation apparatus via a wireless communication interface of the test fixture.

    Abstract translation: 提供了一种自动测试系统和方法。 自动测试系统包括至少一个形成装置和测试夹具。 形成装置从网络接收第一控制命令，并根据第一控制命令执行测试程序。 测试程序包括充电模式和放电模式。 测试夹具选择性地联接到地层装置。 在测试过程中，当测试夹具耦合到成形设备时，测试夹具产生第一测量结果。 测试夹具通过测试夹具的无线通信接口将第一测量结果发送到成形设备。

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