OPTICAL ASSEMBLY INCLUDING PASSIVE OPTICAL ELEMENTS HAVING ALIGNMENT FEATURES
    4.
    发明申请
    OPTICAL ASSEMBLY INCLUDING PASSIVE OPTICAL ELEMENTS HAVING ALIGNMENT FEATURES 审中-公开
    光学组件,包括具有对准特征的被动光学元件

    公开(公告)号:US20160170166A1

    公开(公告)日:2016-06-16

    申请号:US14970795

    申请日:2015-12-16

    CPC classification number: G02B7/003 G02B7/021 G02B7/022

    Abstract: Optical assemblies include a stack of optical elements each of which has one or more alignment features. Each alignment feature traces a respective curve along a surface of one of the optical elements. The alignment feature(s) of one optical element fit within the alignment feature(s) of the other. In some cases, the alignment features can help establish more precise lateral alignment of the optical elements.

    Abstract translation: 光学组件包括一组光学元件,每个光学元件具有一个或多个对准特征。 每个对准特征沿着一个光学元件的表面跟踪相应的曲线。 一个光学元件的对准特征适合于另一个的对准特征。 在一些情况下,对准特征可以帮助建立光学元件的更精确的侧向对准。

    STRUCTURED-STEREO IMAGING ASSEMBLY INCLUDING SEPARATE IMAGERS FOR DIFFERENT WAVELENGTHS
    6.
    发明申请
    STRUCTURED-STEREO IMAGING ASSEMBLY INCLUDING SEPARATE IMAGERS FOR DIFFERENT WAVELENGTHS 审中-公开
    结构化立体成像组件,包括用于不同波长的分离图像

    公开(公告)号:US20170034499A1

    公开(公告)日:2017-02-02

    申请号:US15300997

    申请日:2015-03-31

    Abstract: The present disclosure describes structured-stereo imaging assemblies including separate imagers for different wavelengths. The imaging assembly can include, for example, multiple imager sub-arrays, each of which includes a first imager to sense light of a first wavelength or range of wavelengths and a second imager to sense light of a different second wavelength or range of wavelengths. Images acquired from the imagers can be processed to obtain depth information and/or improved accuracy. Various techniques are described that can facilitate determining whether any of the imagers or sub-arrays are misaligned.

    Abstract translation: 本公开描述了包括用于不同波长的单独成像器的结构化立体成像组件。 成像组件可以包括例如多个成像器子阵列,每个成像器子阵列包括用于感测第一波长或波长范围的光的第一成像器和用于感测不同第二波长或波长范围的光的第二成像器。 可以处理从成像器获得的图像以获得深度信息和/或改进的准确度。 描述了可以便于确定是否任何一个成像器或子阵列不对准的各种技术。

Patent Agency Ranking