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公开(公告)号:US20190171113A1
公开(公告)日:2019-06-06
申请号:US16270958
申请日:2019-02-08
Applicant: ASML NETHERLANDS B.V.
Inventor: Thibault Simon Mathieu LAURENT , Gerardus Adrianus Antonius Maria KUSTERS , Bastiaan Andreas Wilhelmus Hubertus KNARREN , Raymond Wilhelmus Louis LAFARRE , Koen STEFFENS , Takeshi KANEKO , Robbert Jan VOOGD , Gregory Martin Mason CORCORAN , Ruud Hendrikus Martinus Johannes BLOKS , Johan Gertrudis Cornelis KUNNEN , Ramin BADIE
IPC: G03F7/20
CPC classification number: G03F7/70483 , G03F7/70341 , G03F7/707 , G03F7/70716 , G03F7/70775 , G03F7/70875
Abstract: A substrate table to support a substrate on a substrate supporting area, the substrate table having a heat transfer fluid channel at least under the substrate supporting area, and a plurality of heaters and/or coolers to thermally control the heat transfer fluid in the channel at a location under the substrate supporting area.
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公开(公告)号:US20180224751A1
公开(公告)日:2018-08-09
申请号:US15750020
申请日:2016-07-25
Applicant: ASML Netherlands B.V
Inventor: Robbert Jan VOOGD , Wilhelmus Jacobus Maria ROOIJAKKERS
IPC: G03F7/20
CPC classification number: G03F7/70191 , G03F7/70075 , G03F7/70116 , G03F7/70508 , G03F7/70525 , G03F7/70566 , G03F7/70591 , G03F7/70716 , G03F7/7085
Abstract: An illumination system (IL) for a lithographic apparatus comprising a polarization adjustment apparatus (15) arranged to receive linearly polarized radiation, the polarization adjustment apparatus comprising regions which are configured to rotate the polarization orientation by different amounts, a directing apparatus (6) operable to direct the radiation through one or more regions of the polarization adjustment apparatus, a controller (CN) configured to control the directing apparatus so as to control which of the one or more regions of the polarization adjustment apparatus radiation is directed through, wherein the controller is configured to limit which of the regions radiation is directed through to one or more regions which rotate the orientation of the linear polarization by substantially the same amount, and a diffuser configured to receive radiation output from the polarization adjustment apparatus and increase a range of angles at which the radiation propagates whilst substantially conserving the polarization state of the radiation.
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公开(公告)号:US20190324365A1
公开(公告)日:2019-10-24
申请号:US16502674
申请日:2019-07-03
Applicant: ASML Netherlands B.V.
Inventor: Pieter Cristiaan DE GROOT , Gerard Frans Jozef SCHASFOORT , Maksym Yuriiovych SLADKOV , Manfred Petrus Johannes M DIKKERS , Jozef Maria FINDERS , Pieter-Jan VAN ZWOL , Johannes Jacobus Matheus BASELMANS , Stefan Michael Bruno BAUMER , Laurentius Cornelius DE WINTER , Wouter Joep ENGELEN , Marcus Adrianus VAN DE KERKHOF , Robbert Jan VOOGD
Abstract: A patterning device comprising a reflective marker, wherein the marker comprises: a plurality of reflective regions configured to preferentially reflect radiation having a given wavelength; and a plurality of absorbing regions configured to preferentially absorb radiation having the given wavelength; wherein the absorbing and reflective regions are arranged to form a patterned radiation beam reflected from the marker when illuminated with radiation, and wherein the reflective regions comprise a roughened reflective surface, the roughened reflective surface being configured to diffuse radiation reflected from the reflective regions, and wherein the roughened reflective surface has a root mean squared roughness of about an eighth of the given wavelength or more.
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公开(公告)号:US20180299792A1
公开(公告)日:2018-10-18
申请号:US15569384
申请日:2016-05-04
Applicant: ASML Netherlands B.V.
Inventor: Jelte Rients BEARDA , Joost André KLUGKIST , Robbert Jan VOOGD , Guido HERGENHAN , Meik PANITZ , Jochen TAUBERT
Abstract: A method of forming a radiation filter for a lithographic system, the method including forming at least one structure in or on a filter body, wherein the at least one structure provides a filtering effect and least one of a), b), c) or d): a) the at least one structure includes a plurality of transmissive, reflective, absorbing or fluorescent structures, and the method includes providing a desired distribution of the structures to provide a desired filtering effect; b) forming the at least one structure includes forming at least one transmissive, absorbing, reflective or fluorescent layer that has a variable thickness; c) forming the at least one structure includes altering at least one optical property to provide a variation of the optical property with position; d) the at least one structure includes a fluorescent layer that provides variation of at least one fluorescence property with position and/or angle of incidence.
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公开(公告)号:US20160202618A1
公开(公告)日:2016-07-14
申请号:US15078814
申请日:2016-03-23
Applicant: ASML NETHERLANDS B.V.
Inventor: Thibault Simon Mathieu LAURENT , Gerardus Adrianus Antonius Maria KUSTERS , Bastiaan Andreas Wilhelmus Hubertus KNARREN , Raymond Wilhelmus Louis LAFARRE , Koen STEFFENS , Takeshi KANEKO , Robbert Jan VOOGD , Gregory Martin Mason CORCORAN , Ruud Hendrikus Martinus Johannes BLOKS , Johan Gertrudis Cornelis KUNNEN , Ramin BADIE
IPC: G03F7/20
CPC classification number: G03F7/70483 , G03F7/70341 , G03F7/707 , G03F7/70716 , G03F7/70775 , G03F7/70875
Abstract: A substrate table to support a substrate on a substrate supporting area, the substrate table having a heat transfer fluid channel at least under the substrate supporting area, and a plurality of heaters and/or coolers to thermally control the heat transfer fluid in the channel at a location under the substrate supporting area.
Abstract translation: 一种用于支撑衬底支撑区域上的衬底的衬底台,所述衬底台具有至少在衬底支撑区域下方的传热流体通道,以及多个加热器和/或冷却器,以热控制通道中的传热流体 位于基板支撑区域下方的位置。
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公开(公告)号:US20250138440A1
公开(公告)日:2025-05-01
申请号:US19009394
申请日:2025-01-03
Applicant: ASML NETHERLANDS B.V
Inventor: Nicolaas TEN KATE , Joost Jeroen OTTENS , Bastiaan Andreas Wilhelmus Hubertus KNARREN , Robbert Jan VOOGD , Giovanni Francisco NINO , Marinus Jan REMIE , Johannes Henricus Wilhelmus JACOBS , Thibault Simon Mathieu LAURENT , Johan Gertrudis Cornelis KUNNEN
IPC: G03F7/00
Abstract: A lithographic apparatus is disclosed that includes a substrate table configured to support a substrate on a substrate supporting area and a heater and/or temperature sensor on a surface adjacent the substrate supporting area.
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公开(公告)号:US20220206400A1
公开(公告)日:2022-06-30
申请号:US17698100
申请日:2022-03-18
Applicant: ASML NETHERLANDS B.V.
Inventor: Nicolaas TEN KATE , Joost Jeroen OTTENS , Bastiaan Andreas Wilhelmus Hubertus KNARREN , Robbert Jan VOOGD , Giovanni Francisco NINO , Marinus Jan REMIE , Johannes Henricus Wilhelmus JACOBS , Thibault Simon Mathieu LAURENT , Johan Gertrudis Cornelis KUNNEN
IPC: G03F7/20
Abstract: A lithographic apparatus is disclosed that includes a substrate table configured to support a substrate on a substrate supporting area and a heater and/or temperature sensor on a surface adjacent the substrate supporting area.
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公开(公告)号:US20190137861A1
公开(公告)日:2019-05-09
申请号:US16300370
申请日:2017-05-30
Applicant: ASML Netherlands B.V.
Inventor: Pieter Cristiaan DE GROOT , Gerard Frans Jozef SCHASFOORT , Maksym Yuriiovych SLADKOV , Manfred Petrus Johannes Maria DIKKERS , Jozef Maria FINDERS , Pieter-Jan VAN ZWOL , Johannes Jacobus Matheus BASELMANS , Stefan Michael Bruno BAUMER , Laurentius Cornelius DE WINTER , Wouter Joep ENGELEN , Marcus Adrianus VAN DE KERKHOF , Robbert Jan VOOGD
CPC classification number: G03F1/24 , G02B5/0278 , G02B5/0284 , G02B5/22 , G02B2005/1804 , G03F1/42 , G03F1/44 , G03F7/706 , G03F7/70683 , G03F9/7076
Abstract: A patterning device comprising a reflective marker, wherein the marker comprises: a plurality of reflective regions configured to preferentially reflect radiation having a given wavelength; and a plurality of absorbing regions configured to preferentially absorb radiation having the given wavelength; wherein the absorbing and reflective regions are arranged to form a patterned radiation beam reflected from the marker when illuminated with radiation, and wherein the reflective regions comprise a roughened reflective surface, the roughened reflective surface being configured to diffuse radiation reflected from the reflective regions, and wherein the roughened reflective surface has a root mean squared roughness of about an eighth of the given wavelength or more.
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公开(公告)号:US20170219937A1
公开(公告)日:2017-08-03
申请号:US15486077
申请日:2017-04-12
Applicant: ASML Netherlands B.V.
Inventor: Haico Victor KOK , Robbert Jan VOOGD
CPC classification number: G03F7/70775 , G01B11/0675 , G01B11/14 , G03F7/70483 , G03F7/70525 , G03F9/7046 , G03F9/7049 , G03F9/7092
Abstract: A sensor system to measure a physical quantity, the system including a parallel detection arrangement with multiple detectors to allow measurements in parallel at different spatial locations, wherein the multiple detectors share a noise source, wherein the sensor system is configured such that the multiple detectors each output a signal as a function of the physical quantity, and wherein the sensor system is configured such that at least one detector responds differently to noise originating from the shared noise source than the one or more other detectors.
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