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公开(公告)号：US20240405517A1
公开(公告)日：2024-12-05
申请号：US18679348
申请日：2024-05-30
Inventor： David J. Clarke , Alan J. O'Donnell , Shaun Bradley , Stephen Denis Heffernan , Patrick Martin McGuinness , Padraig L. Fitzgerald , Edward John Coyne , Michael P. Lynch , John Anthony Cleary , John Ross Wallrabenstein , Paul Joseph Maher , Andrew Christopher Linehan , Gavin Patrick Cosgrave , Michael James Twohig , Jan Kubik , Jochen Schmitt , David Aherne , Mary McSherry , Anne M. McMahon , Stanislav Jolondcovschi , Cillian Burke
Abstract: Apparatuses including spark gap structures for electrical overstress (EOS) monitoring or protection, and associated methods, are disclosed. In an aspect, a spark gap array includes a sheet resistor and an array of arcing electrode pairs formed over a substrate. The array of arcing electrode pairs includes first arcing electrodes formed on the sheet resistor and a second arcing electrode arranged as a sheet formed over the first arcing electrodes and separated from the first arcing electrodes by an arcing gap. The first arcing electrodes and second arcing electrode are electrically connected to first and second voltage nodes, respectively, and the arcing electrode pairs are configured to generate arc discharges in response to an EOS voltage signal received between the first and second voltage nodes.
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公开(公告)号：US20230366924A1
公开(公告)日：2023-11-16
申请号：US18318506
申请日：2023-05-16
Inventor： Edward John Coyne , Alan J. O'Donnell , Shaun Bradley , David Aherne , David Boland , Thomas G. O'Dwyer , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Michael A. Looby
CPC classification number: G01R31/2879 , G01R31/2874 , G01N27/041
Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
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公开(公告)号：US20210396788A1
公开(公告)日：2021-12-23
申请号：US17446945
申请日：2021-09-03
Inventor： David J. Clarke , Stephen Denis Heffernan , Nijun Wei , Alan J. O'Donnell , Patrick Martin McGuinness , Shaun Bradley , Edward John Coyne , David Aherne , David M. Boland
IPC: G01R19/165 , G01R31/00 , G01R31/28 , H02H9/04 , H01L27/02 , H01L23/60 , H01L23/62 , H01L23/525 , H02H9/00
Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes;
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公开(公告)号：US10917102B2
公开(公告)日：2021-02-09
申请号：US16356985
申请日：2019-03-18
Inventor： Shaun Bradley , David Aherne
Abstract: There is provided an analog signal gauge that monitors an analog signal at a node and a non-volatile memory element to store an event that occurs at the node when a certain criteria, such as exceeding a maximum safe threshold, is satisfied. This way, the analog signal gauge can help to provide an accurate picture of the operating characteristics in the analog circuit which it is monitoring, including indications of faults that occur in the analog system.
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公开(公告)号：US20240405519A1
公开(公告)日：2024-12-05
申请号：US18679364
申请日：2024-05-30
Inventor： David J. Clarke , Alan J. O'Donnell , Shaun Bradley , Stephen Denis Heffernan , Patrick Martin McGuinness , Padraig L. Fitzgerald , Edward John Coyne , Michael P. Lynch , John Anthony Cleary , John Ross Wallrabenstein , Paul Joseph Maher , Andrew Christopher Linehan , Gavin Patrick Cosgrave , Michael James Twohig , Jan Kubik , Jochen Schmitt , David Aherne , Mary McSherry , Anne M. McMahon , Stanislav Jolondcovschi , Cillian Burke
Abstract: Apparatuses including spark gap structures for electrical overstress (EOS) monitoring or protection, and associated methods, are disclosed. In an aspect, a vertical spark gap device includes a substrate having a horizontal main surface, a first conductive layer and a second conductive layer each extending over the substrate and substantially parallel to the horizontal main surface while being separated in a vertical direction crossing the horizontal main surface. One of the first and second conductive layers is electrically connected to a first voltage node and the other of the first and second conductive layers is electrically connected to a second voltage node. The first and second conductive layers serve as one or more arcing electrode pairs and have overlapping portions configured to generate one or more arc discharges extending generally in the vertical direction in response to an EOS voltage signal received between the first and second voltage nodes.
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Patent Agency Ranking
公开(公告)号：US20230383855A1
公开(公告)日：2023-11-30
申请号：US18323798
申请日：2023-05-25
Inventor： Alan J. O'Donnell , Jan Kubík , Alfonso Berduque , Jochen Schmitt , Javier Calpe Maravilla , Shaun Bradley , Padraig L. Fitzgerald , Stanislav Jolondcovschi , Gavin Patrick Cosgrave , Michael P. Lynch , Eoin Edward English
CPC classification number: F16K13/10 , F16K31/06 , B08B9/08 , B08B2209/08
Abstract: Aspects of this disclosure relate to adjusting fluid flow using magnetically sensitive particles. Fluid can flow through an opening in a container. Magnetically sensitive particles can be confined within the container. A magnetic field can be applied to move the magnetically sensitive particles in the container to adjust flow of the fluid through the opening.
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7.发明公开公开(公告)号：US20230375600A1
公开(公告)日：2023-11-23
申请号：US18317806
申请日：2023-05-15
Inventor： David J. Clarke , Stephen Denis Heffernan , Nijun Wei , Alan J. O'Donnell , Patrick Martin McGuinness , Shaun Bradley , Edward John Coyne , David Aherne , David M. Boland
IPC: G01R19/165 , G01R31/00 , G01R31/28 , H02H9/04 , H01L27/02 , H01L23/60 , H01L23/62 , H01L23/525 , H02H9/00
CPC classification number: G01R19/16504 , G01R31/002 , G01R31/2832 , G01R31/2856 , H02H9/042 , H01L27/0288 , H01L23/60 , H01L23/62 , H01L23/5256 , H02H9/00
Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes;
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公开(公告)号：US11686763B2
公开(公告)日：2023-06-27
申请号：US17652857
申请日：2022-02-28
Inventor： Edward John Coyne , Alan J. O'Donnell , Shaun Bradley , David Aherne , David Boland , Thomas G. O'Dwyer , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Michael A. Looby
CPC classification number: G01R31/2879 , G01N27/041 , G01R31/2874
Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
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公开(公告)号：US20240377453A1
公开(公告)日：2024-11-14
申请号：US18666452
申请日：2024-05-16
Inventor： Edward John Coyne , Alan J. O'Donnell , Shaun Bradley , David Aherne , David Boland , Thomas G. O'Dwyer , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Michael A. Looby
Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
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公开(公告)号：US20240210495A1
公开(公告)日：2024-06-27
申请号：US18599037
申请日：2024-03-07
Inventor： Alan J. O'Donnell , Javier Calpe Maravilla , Alfonso Berduque , Shaun Bradley , Jochen Schmitt , Jan Kubík , Stanislav Jolondcovschi , Padraig L. Fitzgerald , Eoin Edward English , Gavin Patrick Cosgrave , Michael P. Lynch
CPC classification number: G01R33/0213 , G01R33/1207
Abstract: Aspects of this disclosure relate to one or more particles that move within a container in response to a magnetic field. A measurement circuit is configured to output an indication of the magnetic field based on position of the one or more particles.
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